Hongjoong Shin

13 papers A 2B 1Misc 3Journal 3Unranked 4
YearRankTypeTitle / Venue / Authors
2011 J jnl
Pseudorandom Test of Nonlinear Analog and Mixed-Signal Circuits Based on a Volterra Series Model.
J. Electron. Test.
Joonsung Park, Hongjoong Shin, Jacob A. Abraham
2010 J jnl
Spectral Prediction for Specification-Based Loopback Test of Embedded Mixed-Signal Circuits.
J. Electron. Test.
Hongjoong Shin, Joonsung Park, Jacob A. Abraham
2008 Misc conf
Parallel Loopback Test of Mixed-Signal Circuits.
VTS
Joonsung Park, Hongjoong Shin, Jacob A. Abraham
2007 J jnl
Predicting mixed-signal dynamic performance using optimised signature-based alternate test.
IET Comput. Digit. Tech.
Byoungho Kim, Hongjoong Shin, Ji Hwan (Paul) Chun, Jacob A. Abraham
2007 — conf
Pseudorandom Test for Nonlinear Circuits Based on a Simplified Volterra Series Model.
ISQED
Joonsung Park, Hongjoong Shin, Jacob A. Abraham
2006 — conf
A Statistical Digital Equalizer for Loopback-based Linearity Test of Data Converters.
ATS
Hongjoong Shin, Jiseon Park, Jacob A. Abraham
2006 A conf
Built-in Fault Diagnosis for Tunable Analog Systems Using an Ensemble Method.
ITC
Hongjoong Shin, Joonsung Park, Jacob A. Abraham
2006 — conf
Fast substrate noise-aware floorplanning with preference directed graph for mixed-signal SOCs.
ASP-DAC
Minsik Cho, Hongjoong Shin, David Z. Pan
2006 B conf
Optimized Signature-Based Statistical Alternate Test for Mixed-Signal Performance Parameters.
ETS
Byoungho Kim, Hongjoong Shin, Ji Hwan (Paul) Chun, Jacob A. Abraham
2006 Misc conf
Spectral Prediction for Specification-Based Loopback Test of Embedded Mixed-Signal Circuits.
VTS
Hongjoong Shin, Byoungho Kim, Jacob A. Abraham
2004 — conf
LFSR-based BIST for analog circuits using slope detection.
ACM Great Lakes Symposium on VLSI
Hongjoong Shin, Hak-Soo Yu, Jacob A. Abraham
2004 A conf
Performance Characterization of Mixed-Signal Circuits Using a Ternary Signal Representation.
ITC
Hak-Soo Yu, Hongjoong Shin, Ji Hwan (Paul) Chun, Jacob A. Abraham
2004 Misc conf
Prediction of Analog Performance Parameters Using Oscillation Based Test.
VTS
Ashwin Raghunathan, Hongjoong Shin, Jacob A. Abraham, Abhijit Chatterjee