Ho Fai Ko - RankMe

19 papers A* 1A 5B 2C 2Journal 5Unranked 4

Year	Rank	Type	Title / Venue / Authors
2013	A*	`conf`	Hardware-efficient on-chip generation of time-extensive constrained-random sequences for in-system validation. DAC Adam B. Kinsman, Ho Fai Ko, Nicola Nicolici
2012	A	`conf`	In-system constrained-random stimuli generation for post-silicon validation. ITC Adam B. Kinsman, Ho Fai Ko, Nicola Nicolici
2012	J	`jnl`	Mapping Trigger Conditions onto Trigger Units during Post-silicon Validation and Debugging. IEEE Trans. Computers Ho Fai Ko, Nicola Nicolici
2011	J	`jnl`	Design-for-Debug Architecture for Distributed Embedded Logic Analysis. IEEE Trans. Very Large Scale Integr. Syst. Ho Fai Ko, Adam B. Kinsman, Nicola Nicolici
2010	A	`conf`	Automated trace signals selection using the RTL descriptions. ITC Ho Fai Ko, Nicola Nicolici
2010	B	`conf`	Combining scan and trace buffers for enhancing real-time observability in post-silicon debugging. ETS Ho Fai Ko, Nicola Nicolici
2009	J	`jnl`	Algorithms for State Restoration and Trace-Signal Selection for Data Acquisition in Silicon Debug. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Ho Fai Ko, Nicola Nicolici
2009	—	`conf`	Design-for-debug for post-silicon validation: Can high-level descriptions help? HLDVT Nicola Nicolici, Ho Fai Ko
2009	B	`conf`	Resource-Efficient Programmable Trigger Units for Post-Silicon Validation. ETS Ho Fai Ko, Nicola Nicolici
2008	—	`conf`	A Novel Automated Scan Chain Division Method for Shift and Capture Power Reduction in Broadside At-Speed Test. ISQED Ho Fai Ko, Nicola Nicolici
2008	J	`jnl`	Automated Scan Chain Division for Reducing Shift and Capture Power During Broadside At-Speed Test. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Ho Fai Ko, Nicola Nicolici
2008	A	`conf`	Automated Trace Signals Identification and State Restoration for Improving Observability in Post-Silicon Validation. DATE Ho Fai Ko, Nicola Nicolici
2008	A	`conf`	Distributed Embedded Logic Analysis for Post-Silicon Validation of SOCs. ITC Ho Fai Ko, Adam B. Kinsman, Nicola Nicolici
2008	A	`conf`	On Automated Trigger Event Generation in Post-Silicon Validation. DATE Ho Fai Ko, Nicola Nicolici
2008	J	`jnl`	Scan Division Algorithm for Shift and Capture Power Reduction for At-Speed Test Using Skewed-Load Test Application Strategy. J. Electron. Test. Ho Fai Ko, Nicola Nicolici
2006	C	`conf`	RTL Scan Design for Skewed-Load At-speed Test under Power Constraints. ICCD Ho Fai Ko, Nicola Nicolici
2005	—	`conf`	Register-transfer level functional scan for hierarchical designs. ASP-DAC Ho Fai Ko, Qiang Xu, Nicola Nicolici
2004	C	`conf`	Functional Illinois Scan Design at RTL. ICCD Ho Fai Ko, Nicola Nicolici
2004	—	`conf`	Functional Scan Chain Design at RTL for Skewed-Load Delay Fault Testing. Asian Test Symposium Ho Fai Ko, Nicola Nicolici