Hisashi Kondo

14 papers A 1B 1C 1Journal 5Unranked 6
YearRankTypeTitle / Venue / Authors
2023 J jnl
Experimental Exploration of the Backside ESD Impacts on an IC Chip in Flip Chip Packaging.
IEICE Trans. Electron.
Takuya Wadatsumi, Kohei Kawai, Rikuu Hasegawa, Kikuo Muramatsu, Hiromu Hasegawa, Takuya Sawada, Takahito Fukushima, Hisashi Kondo, Takuji Miki, Makoto Nagata
2022 — conf
Proposal for a Highly Reliable In-Vehicle Optical Network: SiPhON (Si-Photonics-Based In-Vehicle Optical Network).
OECC/PSC
Hiroyuki Tsuda, Ryogo Kubo, Tatsuo Furuya, Masayuki Iwase, Masahito Morimoto, Hisashi Kondo, Yasushi Amamiya, Yoshiaki Nakano, Takuo Tanemura, Masayuki Murata, Shin'ichi Arakawa, Naokatsu Yamamoto, Atsushi Matsumoto, Ryo Takahashi
2022 — conf
Voltage Surges by Backside ESD Impacts on IC Chip in Flip Chip Packaging.
IRPS
Takuya Wadatsumi, Kohei Kawai, Rikuu Hasegawa, Takuji Miki, Makoto Nagata, Kikuo Muramatsu, Hiromu Hasegawa, Takuya Sawada, Takahito Fukushima, Hisashi Kondo
2018 J jnl
Earable TEMPO: A Novel, Hands-Free Input Device that Uses the Movement of the Tongue Measured with a Wearable Ear Sensor.
Sensors
Kazuhiro Taniguchi, Hisashi Kondo, Mami Kurosawa, Atsushi Nishikawa
2004 C conf
Efficient BDD Encodings for Partial Order Constraints with Application to Expert Systems in Software Verification.
IEA/AIE
Masahito Kurihara, Hisashi Kondo
2001 — conf
Dynamic control of curve-constrained hyper-redundant manipulators.
CIRA
Shugen Ma, Mitsuru Watanabe, Hisashi Kondo
2000 B conf
BDD encoding for partial order constraints and its application to expert systems in software verification domains.
SMC
Masahito Kurihara, Hisashi Kondo
1999 J jnl
Completion for Multiple Reduction Orderings.
J. Autom. Reason.
Masahito Kurihara, Hisashi Kondo
1999 — conf
Heuristics and Experiments on BDD Representation of Boolean Functions for Expert Systems in Software Verification Domains.
Australian Joint Conference on Artificial Intelligence
Masahito Kurihara, Hisashi Kondo
1996 — conf
An Efficient Compact Test Generator for IDDQ Testing.
Asian Test Symposium
Hisashi Kondo, Kwang-Ting Cheng
1996 J jnl
Completion of term-rewriting systems with multiple reduction orderings.
Syst. Comput. Jpn.
Hisashi Kondo, Masahito Kurihara, Azuma Ohuchi
1996 A conf
Driving toward higher IDDQ test quality for sequential circuits: a generalized fault model and its ATPG.
ICCAD
Hisashi Kondo, Kwang-Ting Cheng
1995 — conf
Completion for Multiple Reduction Orderings.
RTA
Masahito Kurihara, Hisashi Kondo, Azuma Ohuchi
1992 J jnl
Using ATMS to Efficiently Verify the Termination of Rewrite Rule Programs.
Int. J. Softw. Eng. Knowl. Eng.
Masahito Kurihara, Hisashi Kondo, Azuma Ohuchi