Hiroshi Date

17 papers A 2B 1Misc 2Journal 5Unranked 6
YearRankTypeTitle / Venue / Authors
2021 J jnl
Deformation analysis of surface and bronchial structures in intraoperative pneumothorax using deformable mesh registration.
Medical Image Anal.
Megumi Nakao, Kotaro Kobayashi, Junko Tokuno, Toyofumi Chen-Yoshikawa, Hiroshi Date, Tetsuya Matsuda
2020 J jnl
Analysis of Heterogeneity of Pneumothorax-associated Deformation using Model-based Registration.
CoRR
Megumi Nakao, Kotaro Kobayashi, Junko Tokuno, Toyofumi Chen-Yoshikawa, Hiroshi Date, Tetsuya Matsuda
2020 J jnl
Statistical modeling of pneumothorax deformation by mapping CT and cone-beam CT images.
CoRR
Megumi Nakao, Hinako Maekawa, Katsutaka Mineura, Toyofumi Chen-Yoshikawa, Hiroshi Date, Tetsuya Matsuda
2019 J jnl
Surface deformation analysis of collapsed lungs using model-based shape matching.
Int. J. Comput. Assist. Radiol. Surg.
Megumi Nakao, Junko Tokuno, Toyofumi Chen-Yoshikawa, Hiroshi Date, Tetsuya Matsuda
2008 — ch.
Effects of At-Home Nursing Service Scheduling in Multiagent Systems.
New Challenges in Applied Intelligence Technologies
Hiroshi Date, Tokuro Matsuo
2004 J jnl
A DFT Selection Method for Reducing Test Application Time of System-on-Chips.
IEICE Trans. Inf. Syst.
Masahide Miyazaki, Toshinori Hosokawa, Hiroshi Date, Michiaki Muraoka, Hideo Fujiwara
2003 — conf
A DFT Selection Method for Reducing Test Application Time of System-on-Chips.
Asian Test Symposium
Masahide Miyazaki, Toshinori Hosokawa, Hiroshi Date, Michiaki Muraoka, Hideo Fujiwara
2003 — conf
A Method of Test Plan Grouping to Shorten Test Length for RTL Data Paths under a Test Controller Area Constraint.
Asian Test Symposium
Toshinori Hosokawa, Hiroshi Date, Masahide Miyazaki, Michiaki Muraoka, Hideo Fujiwara
2002 — conf
A SoC Test Strategy Based on a Non-Scan DFT Method.
Asian Test Symposium
Hiroshi Date, Toshinori Hosokawa, Michiaki Muraoka
2002 — conf
A State Reduction Method for Non-Scan Based FSM Testing with Don't Care Inputs Identification Technique.
Asian Test Symposium
Toshinori Hosokawa, Hiroshi Date, Michiaki Muraoka
2002 Misc conf
A Test Generation Method Using a Compacted Test Table and a Test Generation Method Using a Compacted Test Plan Table for RTL Data Path Circuits.
VTS
Toshinori Hosokawa, Hiroshi Date, Michiaki Muraoka
2000 A conf
Analysis and Minimization of Test Time in a Combined BIST and External Test Approach.
DATE
Makoto Sugihara, Hiroto Yasuura, Hiroshi Date
2000 Misc conf
Mathematical Modeling of Intellectual Property Protection Using Partially-Mergeable Cores.
PDPTA
Hiroshi Date, Vikram Iyengar, Krishnendu Chakrabarty, Makoto Sugihara
1998 A conf
A novel test methodology for core-based system LSIs and a testing time minimization problem.
ITC
Makoto Sugihara, Hiroshi Date, Hiroto Yasuura
1995 — conf
A parallel sequential test generation system DESCARTES based on real-valued logic simulation.
Asian Test Symposium
Hiroshi Date, Michinobu Nakao, Kazumi Hatayama
1992 — conf
LSI-CAD Programs on Parallel Inference Machine.
FGCS
Hiroshi Date, Yukinori Matsumoto, Kouichi Kimura, Kazuo Taki, Hiroo Kato, Masahiro Hoshi
1990 B conf
LSI module placement methods using neural computation networks.
IJCNN
Hiroshi Date, Mitsuho Seki, Terumine Hayashi