| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2007 | — | conf |
Computer-Aided Diagnosis
|
| 2007 | J | jnl |
Image Vis. Comput.
|
| 2006 | — | conf |
Computational Imaging
|
| 2003 | J | jnl |
Microelectron. Reliab.
|
| 2003 | — | conf |
MTDT
|
| 2002 | J | jnl |
Microelectron. Reliab.
|
| 2001 | J | jnl |
Microelectron. Reliab.
|
| 2000 | J | jnl |
Syst. Comput. Jpn.
|
| 1999 | — | conf |
Asian Test Symposium
|
| 1998 | J | jnl |
Syst. Comput. Jpn.
|
| 1997 | — | conf |
Asian Test Symposium
|
| 1997 | J | jnl |
J. Electron. Test.
|
| 1997 | — | conf |
ASP-DAC
|
| 1996 | A | conf |
ITC
|
| 1996 | J | jnl |
IEEE Des. Test Comput.
|