Hiroki Wada

12 papers Misc 1Journal 5Unranked 6
YearRankTypeTitle / Venue / Authors
2022 — conf
Lift-off Process of On-chip Micro-Gel Actuator for Cell Manipulations.
MHS
Kyoka Nakano, Hiroki Wada, Yoshiyuki Yokoyama, Takeshi Hayakawa
2020 J jnl
Evaluation of the Response Characteristics of On-Chip Gel Actuators for Various Single Cell Manipulations.
IEEE Robotics Autom. Lett.
Hiroki Wada, Yuha Koike, Yoshiyuki Yokoyama, Takeshi Hayakawa
2020 J jnl
Quantization of Blackjack: Quantum Basic Strategy and Advantage.
CoRR
Yushi Mura, Hiroki Wada
2010 J jnl
Observer-Based Robust Stabilizing Controllers Based on the Trajectory for Polytopic Uncertain Systems.
IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
Hiroki Wada, Hidetoshi Oya, Kojiro Hagino, Yasumitsu Ebinuma
2007 — conf
A 2.8-V Multibit Complex Bandpass Delta-Sigma-AD Modulator in 0.18µm CMOS.
ASP-DAC
Hao San, Yoshitaka Jingu, Hiroki Wada, Hiroyuki Hagiwara, Akira Hayakawa, Haruo Kobayashi, Masao Hotta
2007 J jnl
A Second-Order Multibit Complex Bandpass DeltaSigmaAD Modulator with I, Q Dynamic Matching and DWA Algorithm.
IEICE Trans. Electron.
Hao San, Yoshitaka Jingu, Hiroki Wada, Hiroyuki Hagiwara, Akira Hayakawa, Haruo Kobayashi, Tatsuji Matsuura, Kouichi Yahagi, Junya Kudoh, Hideo Nakane, Masao Hotta, Toshiro Tsukada, Koichiro Mashiko, Atsushi Wada
2006 J jnl
Complex Bandpass DeltaSigmaAD Modulator Architecture without I, Q-Path Crossing Layout.
IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
Hao San, Akira Hayakawa, Yoshitaka Jingu, Hiroki Wada, Hiroyuki Hagiwara, Kazuyuki Kobayashi, Haruo Kobayashi, Tatsuji Matsuura, Kouichi Yahagi, Junya Kudoh, Hideo Nakane, Masao Hotta, Toshiro Tsukada, Koichiro Mashiko, Atsushi Wada
2001 — conf
A DFT method for RTL circuits to achieve complete fault efficiency based on fixed-control testability.
ASP-DAC
Satoshi Ohtake, Shintaro Nagai, Hiroki Wada, Hideo Fujiwara
2001 — conf
BIST Method Based on Concurrent Single-Control Testability of RTL Data Paths.
Asian Test Symposium
Ken-ichi Yamaguchi, Hiroki Wada, Toshimitsu Masuzawa, Hideo Fujiwara
2000 — conf
A non-scan DFT method at register-transfer level to achieve complete fault efficiency.
ASP-DAC
Satoshi Ohtake, Hiroki Wada, Toshimitsu Masuzawa, Hideo Fujiwara
2000 Misc conf
Design for Strong Testability of RTL Data Paths to Provide Complete Fault Efficiency.
VLSI Design
Hiroki Wada, Toshimitsu Masuzawa, Kewal K. Saluja, Hideo Fujiwara
2000 — conf
Single-control testability of RTL data paths for BIST.
Asian Test Symposium
Toshimitsu Masuzawa, Minoru Izutsu, Hiroki Wada, Hideo Fujiwara