Hei Wong

66 papers B 1C 1Journal 58Unranked 6
YearRankTypeTitle / Venue / Authors
2025 J jnl
Quest for more Moore at the end of Device Downsizing.
J. Circuits Syst. Comput.
Hei Wong, Jieqiong Zhang, Jun Liu
2023 — conf
A Platform for Adaptive Interference Mitigation and Intent Analysis Using OpenLANE.
ICSPCC
Jinfa Hong, Hei Wong, Oliver C. S. Choy, Ray C. C. Cheung
2022 J jnl
Effects of non-fatal electrostatic discharge on the threshold voltage degradation in nano CMOS devices.
Sci. China Inf. Sci.
Hei Wong, Shurong Dong, Zehua Chen
2020 J jnl
CMOS low power split-drain MAGFET based magnetic field strength sensor.
Microelectron. J.
Shuk-Fun Lai, Wing-Shan Tam, Chi-Wah Kok, Hei Wong
2018 J jnl
A double snapback SCR ESD protection scheme for 28 nm CMOS process.
Microelectron. Reliab.
Tao Hu, Shurong Dong, Hao Jin, Hei Wong, Zekun Xu, Xiang Li, Juin J. Liou
2018 J jnl
High-Speed Discrete Gaussian Sampler With Heterodyne Chaotic Laser Inputs.
IEEE Trans. Circuits Syst. II Express Briefs
Yao Liu, Xiao-Zhou Li, Ray C. C. Cheung, Sze-Chun Chan, Hei Wong
2018 B conf
Lightweight Secure Processor Prototype on FPGA.
FPL
Yao Liu, Ray C. C. Cheung, Hei Wong
2018 J jnl
Statistical nature of hard breakdown recovery in high-κ dielectric stacks studied using ramped voltage stress.
Microelectron. Reliab.
Xuan Feng, Nagarajan Raghavan, Sen Mei, Shurong Dong, Kin Leong Pey, Hei Wong
2017 J jnl
A Bias-Bounded Digital True Random Number Generator Architecture.
IEEE Trans. Circuits Syst. I Regul. Pap.
Yao Liu, Ray C. C. Cheung, Hei Wong
2016 J jnl
Comparative study of reliability degradation behaviors of LDMOS and LDMOS-SCR ESD protection devices.
Microelectron. Reliab.
Zhihui Yu, Hao Jin, Shurong Dong, Hei Wong, Jie Zeng, Weihuai Wang
2016 J jnl
Editorial.
Microelectron. Reliab.
Asen Asenov, Ulf Schlichtmann, Cher Ming Tan, Hei Wong, Xing Zhou
2016 J jnl
Effects of thermal annealing on the charge localization characteristics of HfO
Microelectron. Reliab.
Xuan Feng, Shurong Dong, Hei Wong, Danqun Yu, Kin Leong Pey, Kalya Shubhakar, W. S. Lau
2016 J jnl
Simulation and evaluation of the peak temperature in LED light bulb heatsink.
Microelectron. Reliab.
Lixia Sun, Jianxin Zhu, Hei Wong
2016 J jnl
The variation of the leakage current characteristics of W/Ta
Microelectron. Reliab.
Danqun Yu, W. S. Lau, Hei Wong, Xuan Feng, Shurong Dong, Kin Leong Pey
2015 J jnl
A dynamic-biasing 4× charge pump based on exponential topology.
Int. J. Circuit Theory Appl.
Oi-Ying Wong, Hei Wong, Wing-Shan Tam, Chi-Wah Kok
2015 J jnl
A high-efficiency full-wave CMOS rectifying charge pump for RF energy harvesting applications.
Microelectron. J.
Weiyin Wang, Hei Wong, Yan Han
2015 — conf
Low-voltage CMOS DC-DC converters for energy harvesting applications.
ASICON
Zehua Chen, Weiyin Wang, Hei Wong
2015 J jnl
Optimization of loss tangent and capacitor size of micro-vacuum dielectric capacitors.
Microelectron. J.
Wing-Shan Tam, Chi-Wah Kok, Hei Wong
2014 J jnl
On the current conduction mechanisms of CeO
Microelectron. Reliab.
Xuan Feng, Hei Wong, B. L. Yang, Shurong Dong, Hiroshi Iwai, Kuniyuki Kakushima
2014 J jnl
Snapback breakdown ESD device based on zener diodes on silicon-on-insulator technology.
Microelectron. Reliab.
Wing-Shan Tam, Chi-Wah Kok, Sik-Lam Siu, Hei Wong
2014 J jnl
Special section reliability and variability of devices for circuits and systems.
Microelectron. Reliab.
Asen Asenov, Ulf Schlichtmann, Cher Ming Tan, Hei Wong, Xing Zhou
2014 J jnl
Temperature dependences of threshold voltage and drain-induced barrier lowering in 60 nm gate length MOS transistors.
Microelectron. Reliab.
Zehua Chen, Hei Wong, Yan Han, Shurong Dong, B. L. Yang
2014 J jnl
Thermal stability of sectorial split-drain magnetic field-effect transistors.
Microelectron. Reliab.
Wing-Shan Tam, Chi-Wah Kok, Sik-Lam Siu, Wing-Man Tang, Chi-Wah Leung, Hei Wong
2013 J jnl
Editorial.
J. Circuits Syst. Comput.
Ekachai Leelarasmee, Hei Wong
2013 J jnl
Thermal and voltage instabilities of hafnium oxide films prepared by sputtering technique.
Microelectron. Reliab.
Hei Wong, B. L. Yang, Shurong Dong
2012 J jnl
A comparative study of charge pumping circuits for flash memory applications.
Microelectron. Reliab.
Oi-Ying Wong, Hei Wong, Wing-Shan Tam, Ted Chi-Wah Kok
2012 J jnl
Advances in non-volatile memory technology.
Microelectron. Reliab.
Hei Wong
2012 J jnl
Degradation behaviors of GaN light-emitting diodes under high-temperature and high-current stressing.
Microelectron. Reliab.
J. Liu, Hei Wong, Sik-Lam Siu, Chi-Wah Kok, Valeriu Filip
2012 J jnl
ICMAT 2011 - Reliability and variability of semiconductor devices and ICs.
Microelectron. Reliab.
Asen Asenov, Ulf Schlichtmann, Cher Ming Tan, Hei Wong, Xing Zhou
2012 J jnl
Improving the electrical characteristics of MOS transistors with CeO
Microelectron. Reliab.
B. L. Yang, Hei Wong, Kuniyuki Kakushima, Hiroshi Iwai
2012 J jnl
Influence of multi-finger layout on the subthreshold behavior of nanometer MOS transistors.
Microelectron. Reliab.
S.-L. Siu, Wing-Shan Tam, Hei Wong, Chi-Wah Kok, K. Kakusima, Hiroshi Iwai
2012 J jnl
Modeling of terminal ring structures for high-voltage power MOSFETs.
Microelectron. Reliab.
Wing-Shan Tam, Sik-Lam Siu, Oi-Ying Wong, Chi-Wah Kok, Hei Wong, Valeriu Filip
2011 — conf
An overview of charge pumping circuits for flash memory applications.
ASICON
Oi-Ying Wong, Hei Wong, Wing-Shan Tam, Chi-Wah Kok
2011 J jnl
Off-state drain breakdown mechanisms of VDMOS with anti-JFET implantation.
Microelectron. Reliab.
Wing-Shan Tam, Sik-Lam Siu, Bing-Liang Yang, Chi-Wah Kok, Hei Wong
2010 J jnl
An Energy Efficient Half-Static Clock-Gating d-Type flip-Flop.
J. Circuits Syst. Comput.
Wing-Shan Tam, Oi-Ying Wong, Ka-Yan Mok, Chi-Wah Kok, Hei Wong
2010 J jnl
Analysis of ESD discharge current distribution and area optimization of VDMOS gate protection structure.
Microelectron. Reliab.
Wing-Shan Tam, Oi-Ying Wong, Tsz-Ching Ng, Chi-Wah Kok, Hei Wong
2010 J jnl
Generating sub-1V reference voltages from a resistorless CMOS bandgap reference circuit by using a piecewise curvature temperature compensation technique.
Microelectron. Reliab.
Wing-Shan Tam, Oi-Ying Wong, Chi-Wah Kok, Hei Wong
2010 J jnl
Modeling of high-frequency characteristics for epoxy-sealed micro vacuum capacitors.
Microelectron. Reliab.
Oi-Ying Wong, Wing-Shan Tam, Jun Liu, Oi-Kan Shea, Shiu Hung Cheung, Chi-Wah Kok, Hei Wong
2010 J jnl
Modeling the charge transport mechanism in amorphous Al
Microelectron. Reliab.
Yu. N. Novikov, A. V. Vishnyakov, V. A. Gritsenko, K. A. Nasyrov, Hei Wong
2009 C conf
Area Efficient 2
ISCAS
Oi-Ying Wong, Wing-Shan Tam, Chi-Wah Kok, Hei Wong
2009 J jnl
Effects of periphery encapsulation material on the characteristics of micro vacuum dielectric capacitor.
Microelectron. Reliab.
Oi-Ying Wong, Wing-Shan Tam, Oi-Kan Shea, Shiu Hung Cheung, Jun Liu, Chi-Wah Kok, Hei Wong
2009 J jnl
Hot-carrier reliability and breakdown characteristics of multi-finger RF MOS transistors.
Microelectron. Reliab.
Hei Wong, Y. Fu, Juin J. Liou, Y. Yue
2009 J jnl
Subthreshold parameters of radio-frequency multi-finger nanometer MOS transistors.
Microelectron. Reliab.
Sik-Lam Siu, Hei Wong, Wing-Shan Tam, Kuniyuki Kakushima, Hiroshi Iwai
2009 J jnl
Temperature-dependent light-emitting characteristics of InGaN/GaN diodes.
Microelectron. Reliab.
Jun Liu, Wing-Shan Tam, Hei Wong, Valeriu Filip
2008 — conf
A Wideband three-stage rail-to-rail power amplifier driving large capacitive load.
APCCAS
Wing-Shan Tam, Oi-Ying Wong, Chi-Wah Kok, Hei Wong, Albert Z. H. Wang
2008 — conf
Current mode track and hold circuit with 50MS/sec speed and 8-bit resolution.
APCCAS
Oi-Ying Wong, Wing-Shan Tam, Chi-Wah Kok, Hei Wong
2008 — conf
Design strategy for 2-phase switched capacitor charge pump.
APCCAS
Oi-Ying Wong, Wing-Shan Tam, Chi-Wah Kok, Hei Wong
2008 J jnl
Effects of aluminum incorporation on hafnium oxide film using plasma immersion ion implantation.
Microelectron. Reliab.
Banani Sen, Bing-Liang Yang, Hei Wong, Chi-Wah Kok, P. K. Chu, A. Huang
2008 J jnl
Silicon oxynitride integrated waveguide for on-chip optical interconnects applications.
Microelectron. Reliab.
C. K. Wong, Hei Wong, Mansun Chan, Y. T. Chow, H. P. Chan
2007 J jnl
Characterization and modeling of flicker noise in junction field-effect transistor with source and drain trench isolation.
Microelectron. Reliab.
Y. Fu, Hei Wong, Juin J. Liou
2007 J jnl
Silicon integrated photonics begins to revolutionize.
Microelectron. Reliab.
Hei Wong, Valeriu Filip, C. K. Wong, P. S. Chung
2007 J jnl
Single band electronic conduction in hafnium oxide prepared by atomic layer deposition.
Microelectron. Reliab.
Sergey Shaimeev, Vladimir Gritsenko, Kaupo Kukli, Hei Wong, Eun-Hong Lee, Chungwoo Kim
2006 J jnl
Definition of curve fitting parameter to study tunneling and trapping of electrons in Si/ultra-thin SiO
Microelectron. Reliab.
Valeriu Filip, Hei Wong, D. Nicolaescu
2006 J jnl
Minimizing hydrogen content in silicon oxynitride by thermal oxidation of silicon-rich silicon nitride.
Microelectron. Reliab.
C. K. Wong, Hei Wong, Mansun Chan, Chi-Wah Kok, H. P. Chan
2005 J jnl
Dielectric breakdown characteristics and interface trapping of hafnium oxide films.
Microelectron. J.
Nian Zhan, M. C. Poon, Hei Wong, K. L. Ng, Chi-Wah Kok
2004 J jnl
Conduction mechanisms in MOS gate dielectric films.
Microelectron. Reliab.
Bing-Liang Yang, P. T. Lai, Hei Wong
2003 J jnl
Electrical characterization of the hafnium oxide prepared by direct sputtering of Hf in oxygen with rapid thermal annealing.
Microelectron. Reliab.
K. L. Ng, Nian Zhan, Chi-Wah Kok, M. C. Poon, Hei Wong
2003 J jnl
Low-frequency noise study in electron devices: review and update.
Microelectron. Reliab.
Hei Wong
2003 J jnl
Onefold coordinated oxygen atom: an electron trap in the silicon oxide.
Microelectron. Reliab.
V. A. Gritsenko, A. V. Shaposhnikov, Yu. N. Novikov, A. P. Baraban, Hei Wong, G. M. Zhidomirov, M. Roger
2003 J jnl
Oxynitride gate dielectric prepared by thermal oxidation of low-pressure chemical vapor deposition silicon-rich silicon nitride.
Microelectron. Reliab.
Jackie Chan, Hei Wong, M. C. Poon, Chi-Wah Kok
2002 J jnl
A novel approach for fabricating light-emitting porous polysilicon films.
Microelectron. Reliab.
P. G. Han, Hei Wong, Andy H. P. Chan, M. C. Poon
2002 J jnl
Defects in silicon oxynitride gate dielectric films.
Microelectron. Reliab.
Hei Wong, V. A. Gritsenko
2002 J jnl
Recent developments in silicon optoelectronic devices.
Microelectron. Reliab.
Hei Wong
2002 J jnl
Ultra-shallow n
Microelectron. Reliab.
Bing-Liang Yang, N. W. Cheung, S. Denholm, J. Shao, Hei Wong, P. T. Lai, Y. C. Cheng
2001 J jnl
Investigation of the surface silica layer on porous poly-Si thin films.
Microelectron. Reliab.
Hei Wong, P. G. Han, M. C. Poon, Y. Gao
2001 J jnl
SIMS study of silicon oxynitride prepared by oxidation of silicon-rich silicon nitride layer.
Microelectron. Reliab.
M. C. Poon, Y. Gao, Ted Chi-Wah Kok, A. M. Myasnikov, Hei Wong