| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2024 | J | jnl |
J. Electron. Test.
|
| 2022 | — | conf |
LATS
|
| 2021 | J | jnl |
J. Electron. Test.
|
| 2020 | — | conf |
LATS
|
| 2019 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2018 | C | conf |
VLSI-SoC
|
| 2016 | B | conf |
ETS
|
| 2016 | J | jnl |
J. Electron. Test.
|
| 2015 | — | conf |
LATS
|
| 2015 | J | jnl |
Microelectron. J.
|
| 2014 | — | conf |
MWSCAS
|
| 2014 | J | jnl |
IEICE Electron. Express
|
| 2013 | — | conf |
LATW
|
| 2013 | J | jnl |
IEEE Des. Test
|
| 2012 | J | jnl |
Microelectron. Reliab.
|
| 2010 | — | conf |
LATW
|