Hector Villacorta

16 papers B 1C 1Journal 8Unranked 6
YearRankTypeTitle / Venue / Authors
2024 J jnl
Failure Probability due to Radiation-Induced Effects in FinFET SRAM Cells under Process Variations.
J. Electron. Test.
Víctor H. Champac, Hector Villacorta, Roberto Gómez-Fuentes, Fabian Vargas, Jaume Segura
2022 — conf
Failure Probability due to Radiation-induced Effects in FinFET SRAM Cells under Process Variations.
LATS
Víctor H. Champac, Hector Villacorta, Roberto Gómez-Fuentes, Fabian Vargas, Jaume Segura
2021 J jnl
Analysis and Detection of Open-gate Defects in Redundant Structures of a FinFET SRAM Cell.
J. Electron. Test.
Víctor H. Champac, Javier Mesalles, Hector Villacorta, Fabian Vargas
2020 — conf
Analysis and detection of hard-to-detect full open defects in FinFET based SRAM cells.
LATS
Zahira Perez, Javier Mesalles, Hector Villacorta, Fabian Vargas, Víctor H. Champac
2019 J jnl
Modeling and Detectability of Full Open Gate Defects in FinFET Technology.
IEEE Trans. Very Large Scale Integr. Syst.
Freddy Forero, Hector Villacorta, Michel Renovell, Víctor H. Champac
2018 C conf
An accurate novel gate-sizing metric to optimize circuit performance under local intra-die process variations.
VLSI-SoC
Zahira Perez, Hector Villacorta, Víctor H. Champac
2016 B conf
Behavior and test of open-gate defects in FinFET based cells.
ETS
Francisco Mesalles, Hector Villacorta, Michel Renovell, Víctor H. Champac
2016 J jnl
Impact of Fin-Height on SRAM Soft Error Sensitivity and Cell Stability.
J. Electron. Test.
Hector Villacorta, Jaume Segura, Víctor H. Champac
2015 — conf
Impact of increasing the fin height on soft error rate and static noise margin in a FinFET-based SRAM cell.
LATS
Hector Villacorta, Roberto Gómez, Sebastià A. Bota, Jaume Segura, Víctor H. Champac
2015 J jnl
Low V
Microelectron. J.
Hector Villacorta, Jose Luis Garcia-Gervacio, Jaume Segura, Víctor H. Champac
2014 — conf
Analysis of fin height on FinFET SRAM cell hardening.
MWSCAS
Hector Villacorta, Jaume Segura, Sebastià A. Bota, Víctor H. Champac
2014 J jnl
Skew violation verification in digital interconnect signals based on signal addition.
IEICE Electron. Express
Víctor H. Champac, Hector Villacorta, Nestor Hernandez, Joan Figueras
2013 — conf
Bridge defect detection in nanometer CMOS circuits using Low VDD and body bias.
LATW
Hector Villacorta, Jose Luis Garcia-Gervacio, Víctor H. Champac, Sebastià A. Bota, Jaime Martínez-Castillo, Jaume Segura
2013 J jnl
Reliability Analysis of Small-Delay Defects Due to Via Narrowing in Signal Paths.
IEEE Des. Test
Hector Villacorta, Charles F. Hawkins, Víctor H. Champac, Jaume Segura, Roberto Gómez
2012 J jnl
Resistive bridge defect detection enhancement under parameter variations combining Low V
Microelectron. Reliab.
Hector Villacorta, Víctor H. Champac, Sebastià A. Bota, Jaume Segura
2010 — conf
Reliability analysis of small delay defects in vias located in signal paths.
LATW
Hector Villacorta, Víctor H. Champac, Chuck Hawkins, Jaume Segura