Hayoung Lee

56 papers A 1B 1C 1Misc 1Journal 36Unranked 16
YearRankTypeTitle / Venue / Authors
2026 J jnl
VASE: Vector Memory Using Bit-Level Address Segmentation for High-Speed Memory Testing.
IEEE Trans. Circuits Syst. I Regul. Pap.
Sooryeong Lee, Juyong Lee, Hayoung Lee, Sungho Kang
2025 J jnl
A Built-In Self-Repair With Maximum Fault Collection and Fast Analysis Method for HBM.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Joonsik Yoon, Hayoung Lee, Youngki Moon, Seung Ho Shin, Sungho Kang
2025 J jnl
A Cost-Effective Per-Pin ALPG for High-Speed Memory Testing.
IEEE Trans. Very Large Scale Integr. Syst.
Juyong Lee, Hayoung Lee, Sooryeong Lee, Sungho Kang
2025 J jnl
A New Pipelined Output Data Reducer of BOST for Improved Parallelism.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Sooryeong Lee, Hayoung Lee, Juyong Lee, Sungho Kang
2025 J jnl
A Novel CNN-Based Redundancy Analysis Using Parallel Solution Decision.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Seung Ho Shin, Minho Cheong, Hayoung Lee, Byungsoo Kim, Sungho Kang
2025 J jnl
A Robust Test Architecture for Low-Power AI Accelerators.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Hayoung Lee, Juyong Lee, Sungho Kang
2025 J jnl
An Efficient Test Architecture Using Hybrid Built-In Self-Test for Processing-in-Memory.
IEEE Trans. Very Large Scale Integr. Syst.
Hayoung Lee, Juyong Lee, Sungho Kang
2025 B conf
Deep Learning-Based Damage Detection for an Intelligent Monitoring System for Cultural Heritage.
AVSS
Dohun Kim, Minho Bae, Hayoung Lee, Seonghee Lee
2025 J jnl
Effective Parallel Redundancy Analysis Using GPU for Memory Repair.
IEEE Trans. Very Large Scale Integr. Syst.
Seung Ho Shin, Hayoung Lee, Sungho Kang
2025 J jnl
HuDEx: Integrating Hallucination Detection and Explainability for Enhancing the Reliability of LLM responses.
CoRR
Sujeong Lee, Hayoung Lee, Seongsoo Heo, Wonik Choi
2025 J jnl
Integrated Framework for LLM Evaluation with Answer Generation.
CoRR
Sujeong Lee, Hayoung Lee, Seongsoo Heo, Wonik Choi
2025 J jnl
Multistage Enhanced Diagnosis With Fault Candidate Reduction.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Hyojoon Yun, Hyeonchan Lim, Hayoung Lee, Sungho Kang
2025 J jnl
RAPID: Redundancy Analysis With Parallelized and Intelligent Distribution.
IEEE Access
Younwoo Yoo, Hayoung Lee, Seung Ho Shin, Sungho Kang
2025 J jnl
Target-guided dialog generation with dynamic knowledge path by commonsense knowledge graph and relation prediction.
Knowl. Based Syst.
Hayoung Lee, Soyeop Yoo, Woong-Kee Loh, Ok-Ran Jeong
2024 J jnl
A New Fail Address Memory Architecture for Cost-Effective ATE.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Hayoung Lee, Sooryeong Lee, Sungho Kang
2024 J jnl
A New ISA for High-Speed and Area-Efficient ALPG.
IEEE Trans. Circuits Syst. II Express Briefs
Juyong Lee, Hayoung Lee, Sooryeong Lee, Sungho Kang
2024 — conf
APAPG: Address Pre-Processed ALPG for High-Speed Linear Test.
ISOCC
Sooryeong Lee, Hayoung Lee, Juyong Lee, Sungho Kang
2024 J jnl
An Area-Efficient Systolic Array Redundancy Architecture for Reliable AI Accelerator.
IEEE Trans. Very Large Scale Integr. Syst.
Hayoung Lee, Jongho Park, Sungho Kang
2024 J jnl
An Efficient Scan Diagnosis for Intermittent Faults Using CNN With Multi-Channel Data.
IEEE Access
Hyojoon Yun, Hyeonchan Lim, Hayoung Lee, Doohyun Yoon, Sungho Kang
2024 J jnl
GRAP: Efficient GPU-Based Redundancy Analysis Using Parallel Evaluation for Cross Faults.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Seung Ho Shin, Hayoung Lee, Sungho Kang
2024 J jnl
Leveraging Medical Knowledge Graphs and Large Language Models for Enhanced Mental Disorder Information Extraction.
Future Internet
Chaelim Park, Hayoung Lee, Okran Jeong
2024 J jnl
RA-Aware Fail Data Collection Architecture for Cost Reduction.
IEEE Trans. Very Large Scale Integr. Syst.
Hayoung Lee, Sooryeong Lee, Sungho Kang
2024 — conf
Scan Architecture with Data Observation for Multiple Scan Cell Fault Diagnosis.
ISOCC
Juyong Lee, Sooryeong Lee, Hayoung Lee, Sungho Kang
2023 J jnl
A Knowledge-Grounded Task-Oriented Dialogue System with Hierarchical Structure for Enhancing Knowledge Selection.
Sensors
Hayoung Lee, Okran Jeong
2023 — conf
GPU-Based Redundancy Analysis using Partitioning Method for Memory Repair.
ISOCC
Younwoo Yoo, Hayoung Lee, Seung Ho Shin, Sungho Kang
2023 J jnl
HPCClusterScape: Increasing Transparency and Efficiency of Shared High-Performance Computing Clusters for Large-scale AI Models.
CoRR
Heungseok Park, Aeree Cho, Hyojun Jeon, Hayoung Lee, Youngil Yang, Sungjae Lee, Heungsub Lee, Jaegul Choo
2023 — conf
Redundancy Analysis Simplification Scheme for High-Speed Memory Repair.
ISOCC
Hayoung Lee, Younwoo Yoo, Seung Ho Shin, Sungho Kang
2023 J jnl
STRAIT: Self-Test and Self-Recovery for AI Accelerator.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Hayoung Lee, Jihye Kim, Jongho Park, Sungho Kang
2023 J jnl
Sentiment analysis and counselling for COVID-19 pandemic based on social media.
Int. J. Web Grid Serv.
Hayoung Lee, Ok-Ran Jeong
2023 J jnl
TRUST: Through-Silicon via Repair Using Switch Matrix Topology.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Hayoung Lee, Seung Ho Shin, Younwoo Yoo, Sungho Kang
2022 — conf
An Improved Early Termination Methodology Using Convolutional Neural Network.
ISOCC
Seung Ho Shin, Hayoung Lee, Sooryeong Lee, Younwoo Yoo, Sungho Kang
2022 J jnl
ECMO: ECC Architecture Reusing Content-Addressable Memories for Obtaining High Reliability in DRAM.
IEEE Trans. Very Large Scale Integr. Syst.
Hayoung Lee, Younwoo Yoo, Seung Ho Shin, Sungho Kang
2022 — conf
FAME: Fault Address Memory Structure for Repair Time Reduction.
ISOCC
Hayoung Lee, Sooryeong Lee, Younwoo Yoo, Seung Ho Shin, Sungho Kang
2022 J jnl
Multibank Optimized Redundancy Analysis Using Efficient Fault Collection.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Hogyeong Kim, Hayoung Lee, Donghyun Han, Sungho Kang
2022 — conf
PROG: Per-Row Output Generator for BOST.
ISOCC
Sooryeong Lee, Hayoung Lee, Younwoo Yoo, Seung Ho Shin, Sungho Kang
2022 — conf
ZOS: Zero Overhead Scan for Systolic Array-based AI accelerator.
ISOCC
Jihye Kim, Hayoung Lee, Jongho Park, Sungho Kang
2021 — conf
An Effective Spare Allocation Methodology for 3D Memory Repair with BIRA.
ISOCC
Seung Ho Shin, Hayoung Lee, Younwoo Yoo, Sungho Kang
2021 J jnl
ECC-Aware Fast and Reliable Pattern Matching Redundancy Analysis for Highly Reliable Memory.
IEEE Access
Donghyun Han, Hayoung Lee, Seungtaek Lee, Sungho Kang
2021 J jnl
Effective Spare Line Allocation Built-in Redundancy Analysis With Base Common Spare for Yield Improvement of 3D Memory.
IEEE Access
Donghyun Han, Hayoung Lee, Sungho Kang
2021 J jnl
On-Chip Error Detection Reusing Built-In Self-Repair for Silicon Debug.
IEEE Access
Hayoung Lee, Hyunggoy Oh, Sungho Kang
2021 — conf
Post-bond Repair of Line Faults with Double-bit ECC for 3D Memory.
ISOCC
Younwoo Yoo, Hayoung Lee, Seung Ho Shin, Sungho Kang
2020 A conf
Fail Memory Configuration Set for RA Estimation.
ITC
Hayoung Lee, Keewon Cho, Sungho Kang, Wooheon Kang, Seungtaek Lee, Woosik Jeong
2020 J jnl
Fine-Grained Defect Diagnosis for CMOL FPGA Circuits.
IEEE Access
Jihye Kim, Hayoung Lee, Seokjun Jang, Sungho Kang
2020 J jnl
GPU-Based Redundancy Analysis Using Concurrent Evaluation.
IEEE Trans. Very Large Scale Integr. Syst.
Tae Hyun Kim, Hayoung Lee, Sungho Kang
2020 — conf
Memory-like Defect Diagnosis for CMOL FPGAs.
ISOCC
Jihye Kim, Hayoung Lee, Seokjun Jang, Hogyeong Kim, Sungho Kang
2020 — conf
Redundancy Analysis Optimization with Clustered Known Solutions for High Speed Repair.
ISOCC
Hayoung Lee, Donghyun Han, Hogyeong Kim, Sungho Kang
2020 — conf
W-ERA: One-Time Memory Repair with Wafer-Level Early Repair Analysis for Cost Reduction.
ITC-Asia
Hayoung Lee, Donghyun Han, Hogyeong Kim, Sungho Kang
2019 J jnl
Dynamic Built-In Redundancy Analysis for Memory Repair.
IEEE Trans. Very Large Scale Integr. Syst.
Hayoung Lee, Donghyun Han, Seungtaek Lee, Sungho Kang
2019 — conf
Redundancy Analysis based on Fault Distribution for Memory with Complex Spares.
ISOCC
Hayoung Lee, Donghyun Han, Seungtaek Lee, Sungho Kang
2018 C conf
3D Memory Formed of Unrepairable Memory Dice and Spare Layer.
TENCON
Donghyun Han, Hayoung Lee, Seungtaek Lee, Minho Moon, Sungho Kang
2018 J jnl
An Area-Efficient BIRA With 1-D Spare Segments.
IEEE Trans. Very Large Scale Integr. Syst.
Donghyun Kim, Hayoung Lee, Sungho Kang
2018 J jnl
Fast Built-In Redundancy Analysis Based on Sequential Spare Line Allocation.
IEEE Trans. Reliab.
Hayoung Lee, Jooyoung Kim, Keewon Cho, Sungho Kang
2018 J jnl
Fault Group Pattern Matching With Efficient Early Termination for High-Speed Redundancy Analysis.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Hayoung Lee, Kiwon Cho, Donghyun Kim, Sungho Kang
2017 — conf
A new repair scheme for TSV-based 3D memory using base die repair cells.
ISOCC
Donghyun Han, Hayoung Lee, Donghyun Kim, Sungho Kang
2016 — conf
Discussion of cost-effective redundancy architectures.
ISOCC
Keewon Cho, Jooyoung Kim, Hayoung Lee, Sungho Kang
2013 Misc conf
Punobot: Mobile Botnet Using Push Notification Service in Android.
WISA
Hayoung Lee, Taeho Kang, Sangho Lee, Jong Kim, Yoonho Kim