Haruki Yokoyama

21 papers A* 1A 1C 3Misc 1Journal 9Unranked 6
YearRankTypeTitle / Venue / Authors
2025 C conf
Investigating the Applicability of Image Generation Models to Weakness Detection Tasks.
SERA
Haruki Yokoyama, Fuyuki Ishikawa
2023 — conf
Verifying Attention Robustness of Deep Neural Networks Against Semantic Perturbations.
NFM
Satoshi Munakata, Caterina Urban, Haruki Yokoyama, Koji Yamamoto, Kazuki Munakata
2022 J jnl
An Exploratory Study of AI System Risk Assessment from the Lens of Data Distribution and Uncertainty.
CoRR
Zhijie Wang, Yuheng Huang, Lei Ma, Haruki Yokoyama, Susumu Tokumoto, Kazuki Munakata
2022 C conf
Verifying Attention Robustness of Deep Neural Networks against Semantic Perturbations.
APSEC
Satoshi Munakata, Caterina Urban, Haruki Yokoyama, Koji Yamamoto, Kazuki Munakata
2022 J jnl
Verifying Attention Robustness of Deep Neural Networks against Semantic Perturbations.
CoRR
Satoshi Munakata, Caterina Urban, Haruki Yokoyama, Koji Yamamoto, Kazuki Munakata
2021 A conf
Sirius: Static Program Repair with Dependence Graph-Based Systematic Edit Patterns.
ICSME
Kunihiro Noda, Haruki Yokoyama, Shinji Kikuchi
2021 J jnl
Sirius: Static Program Repair with Dependence Graph-Based Systematic Edit Patterns.
CoRR
Kunihiro Noda, Haruki Yokoyama, Shinji Kikuchi
2020 A* conf
Towards Building Robust DNN Applications: An Industrial Case Study of Evolutionary Data Augmentation.
ASE
Haruki Yokoyama, Satoshi Onoue, Shinji Kikuchi
2019 — conf
Machine Learning System Architectural Pattern for Improving Operational Stability.
ICSA Companion
Haruki Yokoyama
2017 — conf
Evaluating Automated Program Repair Using Characteristics of Defects.
IWESEP
Haruki Yokoyama, Yoshiki Higo, Shinji Kusumoto
2017 — conf
New Strategies for Selecting Reuse Candidates on Automated Program Repair.
COMPSAC (2)
Akito Tanikado, Haruki Yokoyama, Masahiro Yamamoto, Soichi Sumi, Yoshiki Higo, Shinji Kusumoto
2016 C conf
Toward Developer-like Automated Program Repair - Modification Comparisons between GenProg and Developers.
APSEC
Hiroki Nakajima, Yoshiki Higo, Haruki Yokoyama, Shinji Kusumoto
2016 Misc conf
Toward improving ability to repair bugs automatically: a patch candidate location mechanism using code similarity.
SAC
Haruki Yokoyama, Yoshiki Higo, Keisuke Hotta, Takafumi Ohta, Kozo Okano, Shinji Kusumoto
2014 — conf
400-G coherent receiver using silica-based heterogeneously-integrated PLC with newly developed waveplate type PBS.
ECOC
Yu Kurata, Yasuaki Hashizume, Shinichi Aozasa, Mikitaka Itoh, Toshikazu Hashimoto, Hiromasa Tanobe, Yasuhiko Nakanishi, Eiji Yoshida, Hiroyuki Fukuyama, Hiroshi Yamazaki, Takashi Goh, Haruki Yokoyama, Yoshifumi Muramoto
2014 — conf
High-speed avalanche photodiodes for 100-Gb/s systems and beyond.
ECOC
Masahiro Nada, Yoshifumi Muramoto, Haruki Yokoyama, Toshihide Yoshimatsu, Hideaki Matsuzaki
2012 J jnl
Estimation of Transit Time in Terahertz Oscillating Resonant Tunneling Diodes with Graded Emitter and Thin Barriers.
IEICE Trans. Electron.
Atsushi Teranishi, Safumi Suzuki, Kaoru Shizuno, Masahiro Asada, Hiroki Sugiyama, Haruki Yokoyama
2012 J jnl
Fundamental oscillation up to 1.08THz in resonant tunneling diodes with high-indium-composition transit layers for reduction of transit delay.
IEICE Electron. Express
Atsushi Teranishi, Kaoru Shizuno, Safumi Suzuki, Masahiro Asada, Hiroki Sugiyama, Haruki Yokoyama
2005 J jnl
SAW characteristics of GaN layers with surfaces exposed by dry etching.
IEICE Electron. Express
Kazumi Nishimura, Naoteru Shigekawa, Haruki Yokoyama, Masanobu Hiroki, Kohji Hohkawa
2005 J jnl
Velocity dispersion in GaN-based surface acoustic wave filters on (0001) sapphire substrates.
IEICE Electron. Express
Naoteru Shigekawa, Kazumi Nishimura, Haruki Yokoyama, Kenji Shiojima, Kohji Hohkawa
2004 J jnl
Suppression of short-channel effect in pseudomorphic In0.25Al0.75P/In0.75Ga0.25As high electron mobility transistors.
IEICE Electron. Express
Hideaki Matsuzaki, Hiroki Sugiyama, Haruki Yokoyama, Takashi Kobayashi, Takatomo Enoki
2002 J jnl
Bias-stress-induced increase in parasitic resistance of InP-based InAlAs/InGaAs HEMTs.
Microelectron. Reliab.
Tetsuya Suemitsu, Yoshino K. Fukai, Hiroki Sugiyama, Kazuo Watanabe, Haruki Yokoyama