Hari Balachandran

11 papers A 8Misc 3

Year	Rank	Type	Title / Venue / Authors
2004	A	`conf`	K Longest Paths Per Gate (KLPG) Test Generation for Scan-Based Sequential Circuits. ITC Wangqi Qiu, Jing Wang, D. M. H. Walker, Divya Reddy, Zhuo Li, Weiping Shi, Hari Balachandran
2002	A	`conf`	Facilitating Rapid First Silicon Debug. ITC Hari Balachandran, Kenneth M. Butler, Neil Simpson
2000	Misc	`conf`	Clustering Based Evaluation of IDDQ Measurements: Applications in Testing and Classification of ICs. VTS Sri Jandhyala, Hari Balachandran, Manidip Sengupta, Anura P. Jayasumana
2000	A	`conf`	Computer-aided fault to defect mapping (CAFDM) for defect diagnosis. ITC Zoran Stanojevic, Hari Balachandran, D. M. H. Walker, Fred Lakbani, Jayashree Saxena, Kenneth M. Butler
2000	A	`conf`	Logic mapping on a microprocessor. ITC Anjali Kinra, Hari Balachandran, Regy Thomas, John Carulli
1999	A	`conf`	Clustering based techniques for I_DDQ testing. ITC Sri Jandhyala, Hari Balachandran, Anura P. Jayasumana
1999	A	`conf`	Correlation of logical failures to a suspect process step. ITC Hari Balachandran, Jason Parker, Daniel Shupp, Stephanie Butler, Kenneth M. Butler, Craig Force, Jason Smith
1999	A	`conf`	Expediting ramp-to-volume production. ITC Hari Balachandran, Jason Parker, Gordon Gammie, John W. Olson, Craig Force, Kenneth M. Butler, Sri Jandhyala
1999	Misc	`conf`	REDO - Probabilistic Excitation and Deterministic Observation - First Commercial Experimen. VTS Michael R. Grimaila, Sooryong Lee, Jennifer Dworak, Kenneth M. Butler, Bret Stewart, Hari Balachandran, Bryan Houchins, Vineet Mathur, Jaehong Park, Li-C. Wang, M. Ray Mercer
1998	A	`conf`	On applying non-classical defect models to automated diagnosis. ITC Jayashree Saxena, Kenneth M. Butler, Hari Balachandran, David B. Lavo, Tracy Larrabee, F. Joel Ferguson, Brian Chess
1996	Misc	`conf`	Improvement of SRAM-based failure analysis using calibrated Iddq testing. VTS Hari Balachandran, D. M. H. Walker