Harald Gossner

22 papers Misc 3Journal 14Unranked 5
YearRankTypeTitle / Venue / Authors
2025 J jnl
System-Efficient ESD Design Based on a Modular Measurement System Applied to USB.
IEEE Trans. Instrum. Meas.
Lucas Speckbacher, David Johannes Pommerenke, Gabriel Fellner, Lukas Pertoll, Harald Gossner
2018 — conf
Contact and junction engineering in bulk FinFET technology for improved ESD/latch-up performance with design trade-offs and its implications on hot carrier reliability.
IRPS
Milova Paul, Boeila Sampath Kumar, Harald Gossner, Mayank Shrivastava
2017 Misc conf
Physics of Current Filamentation in ggNMOS Revisited: Was Our Understanding Scientifically Complete?
VLSID
Milova Paul, Christian Russ, Boeila Sampath Kumar, Harald Gossner, Mayank Shrivastava
2016 Misc conf
A Fully-Integrated Radio-Frequency Power Amplifier in 28nm CMOS Technology Mounted in BGA Package.
VLSID
Ankur Gupta, Mayank Shrivastava, Maryam Shojaei Baghini, Harald Gossner, V. Ramgopal Rao
2015 J jnl
System efficient ESD design.
Microelectron. Reliab.
Harald Gossner, Charvaka Duvvury
2012 — conf
Electronic design automation (EDA) solutions for ESD-robust design and verification.
CICC
Michael G. Khazhinsky, Shuqing Cao, Harald Gossner, Gianluca Boselli, Melanie Etherton
2010 J jnl
System ESD robustness by co-design of on-chip and on-board protection measures.
Microelectron. Reliab.
Harald Gossner, Werner Simbürger, Matthias Stecher
2009 J jnl
Do ESD fails in systems correlate with IC ESD robustness?
Microelectron. Reliab.
Wolfgang Stadler, Tilo Brodbeck, Reinhold Gärtner, Harald Gossner
2009 J jnl
Reliability aspects of gate oxide under ESD pulse stress.
Microelectron. Reliab.
Adrien Ille, Wolfgang Stadler, Thomas Pompl, Harald Gossner, Tilo Brodbeck, Kai Esmark, Philipp Riess, David Alvarez, Kiran V. Chatty, Robert Gauthier, Alain Bravaix
2007 — conf
A 10GHz Broadband Amplifier with Bootstrapped 2kV ESD Protection.
ISSCC
Wolfgang Soldner, Moon-Jung Kim, Martin Streibl, Harald Gossner, Thomas H. Lee, Doris Schmitt-Landsiedel
2007 — conf
High-Voltage-Tolerant I/O Circuit Design for USB 2.0-Compliant Applications.
CICC
Moon-Jung Kim, Henrik Icking, Harald Gossner, Thomas H. Lee
2007 J jnl
RF ESD protection strategies: Codesign vs. low-C protection.
Microelectron. Reliab.
Wolfgang Soldner, Martin Streibl, U. Hodel, Marc Tiebout, Harald Gossner, Doris Schmitt-Landsiedel, Jung-Hoon Chun, Choshu Ito, Robert W. Dutton
2006 — conf
Circuit design issues in multi-gate FET CMOS technologies.
ISSCC
Christian Pacha, Klaus von Arnim, Thomas Schulz, Weize Xiong, Michael Gostkowski, Gerhard Knoblinger, Andrew Marshall, Thomas Nirschl, Jörg Berthold, Christian Russ, Harald Gossner, Charvaka Duvvury, Paul Patruno, C. Rinn Cleavelin, Klaus Schruefer
2005 J jnl
A Dedicated TLP Set-Up to Investigate the ESD Robustness of RF Elements and Circuits.
Microelectron. Reliab.
Heinrich Wolf, Horst A. Gieser, Wolfgang Soldner, Harald Gossner
2005 J jnl
High abstraction level permutational ESD concept analysis.
Microelectron. Reliab.
Martin Streibl, Franz Zängl, Kai Esmark, Robert Schwencker, Wolfgang Stadler, Harald Gossner, S. Drüen, Doris Schmitt-Landsiedel
2004 Misc conf
ESD protection for the deep sub micron regime - a challenge for design methodology.
VLSI Design
Harald Gossner
2003 J jnl
Harnessing the base-pushout effect for ESD protection in bipolar and BiCMOS technologies.
Microelectron. Reliab.
Martin Streibl, Kai Esmark, A. Sieck, Wolfgang Stadler, M. Wendel, J. Szatkowski, Harald Gossner
2002 J jnl
Case study of a technology transfer causing ESD problems.
Microelectron. Reliab.
Franz Zängl, Harald Gossner, Kai Esmark, R. Owen, G. Zimmermann
2002 J jnl
Device Simulation and Backside Laser Interferometry--Powerful Tools for ESD Protection Development.
Microelectron. Reliab.
Wolfgang Stadler, Kai Esmark, Harald Gossner, Martin Streibl, M. Wendel, Wolfgang Fichtner, Dionyz Pogany, Martin Litzenberger, Erich Gornik
2001 J jnl
Advanced 2D/3D ESD device simulation - a powerful tool already used in a pre-Si phase.
Microelectron. Reliab.
Kai Esmark, Wolfgang Stadler, M. Wendel, Harald Gossner, X. Guggenmos, Wolfgang Fichtner
2001 J jnl
Effect of pulse risetime on trigger homogeneity in single finger grounded gate nMOSFET electrostatic discharge protection devices.
Microelectron. Reliab.
Martin Litzenberger, R. Pichler, Sergey Bychikhin, Dionyz Pogany, Erich Gornik, Kai Esmark, Harald Gossner
2001 J jnl
Wide range control of the sustaining voltage of electrostatic discharge protection elements realized in a smart power technology.
Microelectron. Reliab.
Harald Gossner, T. Müller-Lynch, Kai Esmark, Matthias Stecher