Haoze Luo

12 papers C 1Journal 11
YearRankTypeTitle / Venue / Authors
2023 J jnl
Investigation of Off-State Stress Induced Degradation of SiC MOSFETs Under Short-Circuit Condition.
IEEE Trans. Ind. Electron.
Jianlong Kang, Qing Liu, Haoze Luo, Hu Cao, Zi-Hui Zhang, Zhen Xin
2019 J jnl
AR-Aided Smart Sensing for In-Line Condition Monitoring of IGBT Wafer.
IEEE Trans. Ind. Electron.
Kongjing Li, Gui Yun Tian, Xiaotian Chen, Chaoqing Tang, Haoze Luo, Wuhua Li, Bin Gao, Xiangning He, Nick Wright
2018 J jnl
Enabling Junction Temperature Estimation via Collector-Side Thermo-Sensitive Electrical Parameters Through Emitter Stray Inductance in High-Power IGBT Modules.
IEEE Trans. Ind. Electron.
Haoze Luo, Wuhua Li, Francesco Iannuzzo, Xiangning He, Frede Blaabjerg
2018 J jnl
Investigating SiC MOSFET body diode's light emission as temperature-sensitive electrical parameter.
Microelectron. Reliab.
Lorenzo Ceccarelli, Haoze Luo, Francesco Iannuzzo
2018 J jnl
On-line solder layer degradation measurement for SiC-MOSFET modules under accelerated power cycling condition.
Microelectron. Reliab.
Haoze Luo, Paula Diaz Reigosa, Francesco Iannuzzo, Frede Blaabjerg
2017 J jnl
Die degradation effect on aging rate in accelerated cycling tests of SiC power MOSFET modules.
Microelectron. Reliab.
Haoze Luo, Nick Baker, Francesco Iannuzzo, Frede Blaabjerg
2017 C conf
Separation test method for investigation of current density effects on bond wires of SiC power MOSFET modules.
IECON
Haoze Luo, Francesco Iannuzzo, Frede Blaabjerg, Wuhua Li, Xiangning He
2017 J jnl
Uneven temperature effect evaluation in high-power IGBT inverter legs and relative test platform design.
Microelectron. Reliab.
Haoze Luo, Wuhua Li, Xiangning He, Francesco Iannuzzo, Frede Blaabjerg
2016 J jnl
Modern IGBT gate driving methods for enhancing reliability of high-power converters - An overview.
Microelectron. Reliab.
Haoze Luo, Francesco Iannuzzo, Paula Diaz Reigosa, Frede Blaabjerg, Wuhua Li, Xiangning He
2015 J jnl
Decoupling-Controlled Triport Composited DC/DC Converter for Multiple Energy Interface.
IEEE Trans. Ind. Electron.
Wuhua Li, Chi Xu, Haoze Luo, Yihua Hu, Xiangning He, Changliang Xia
2015 J jnl
Theoretical Evaluation of Stability Improvement Brought by Resonant Current Loop for Paralleled LLC Converters.
IEEE Trans. Ind. Electron.
Sheng Zong, Haoze Luo, Wuhua Li, Xiangning He, Changliang Xia
2015 J jnl
Topology Review and Derivation Methodology of Single-Phase Transformerless Photovoltaic Inverters for Leakage Current Suppression.
IEEE Trans. Ind. Electron.
Wuhua Li, Yunjie Gu, Haoze Luo, Wenfeng Cui, Xiangning He, Changliang Xia