| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2025 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2025 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2025 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2024 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2024 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2023 | J | jnl |
Graph. Model.
|
| 2023 | J | jnl |
CoRR
|
| 2022 | J | jnl |
Comput. Syst. Sci. Eng.
|
| 2022 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2022 | J | jnl |
Comput. Aided Des.
|
| 2022 | J | jnl |
Intell. Autom. Soft Comput.
|
| 2020 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2020 | J | jnl |
Vis. Comput.
|
| 2020 | J | jnl |
J. Comput. Appl. Math.
|
| 2019 | J | jnl |
Eur. J. Oper. Res.
|
| 2018 | J | jnl |
Vis. Comput.
|
| 2016 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2016 | J | jnl |
Neural Networks
|
| 2016 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2014 | J | jnl |
Comput. Aided Des.
|
| 2013 | — | conf |
CAAD Futures
|
| 2006 | — | conf |
SoCC
|
| 2006 | A* | conf |
DAC
|
| 2005 | J | jnl |
IEEE Des. Test Comput.
|
| 2004 | — | conf |
ISVLSI
|