Hao Chen - RankMe

12 papers A* 1A 5Journal 1Unranked 5

Year	Rank	Type	Title / Venue / Authors
2020	—	`conf`	A Deep Learning-Based Screening Method for Improving the Quality and Reliability of Integrated Passive Devices. ITC-Asia Chien-Hui Chuang, Kuan-Wei Hou, Cheng-Wen Wu, Mincent Lee, Chia-Heng Tsai, Hao Chen, Min-Jer Wang
2020	A	`conf`	A Deep Learning-Based Screening Method for Improving the Quality and Reliability of Integrated Passive Devices. ITC Chien-Hui Chuang, Kuan-Wei Hou, Cheng-Wen Wu, Mincent Lee, Chia-Heng Tsai, Hao Chen, Min-Jer Wang
2020	—	`conf`	Novel Circuit Probing for Tiny Inductor. ITC-Asia Chia-Heng Tsai, Chi-Chang Lai, Hao Chen, Min-Jer Wang
2020	—	`conf`	Site-aware Anomaly Detection with Machine Learning for Circuit Probing to Prevent Overkill. ITC-Asia Mincent Lee, Cheng-Tse Lu, Chia-Heng Tsai, Hao Chen, Min-Jer Wang
2019	A	`conf`	High Quality Test Methodology for Highly Reliable Devices. ITC Hao Chen, Mincent Lee, Liang-Yen Chen, Min-Jer Wang
2017	—	`conf`	Fan-out wafer level chip scale package testing. ITC-Asia Hao Chen, Hung-Chih Lin, Min-Jer Wang
2017	J	`jnl`	Test Cost Reduction Methodology for InFO Wafer-Level Chip-Scale Package. IEEE Des. Test Kai-Li Wang, Bing-Yang Lin, Cheng-Wen Wu, Mincent Lee, Hao Chen, Hung-Chih Lin, Ching-Nen Peng, Min-Jer Wang
2016	A*	`conf`	Efficient probing schemes for fine-pitch pads of InFO wafer-level chip-scale package. DAC Yu-Chieh Huang, Bing-Yang Lin, Cheng-Wen Wu, Mincent Lee, Hao Chen, Hung-Chih Lin, Ching-Nen Peng, Min-Jer Wang
2014	—	`conf`	A novel DFT architecture for 3DIC test, diagnosis and repair. VLSI-DAT Mincent Lee, Saman Adham, Min-Jer Wang, Ching-Nen Peng, Hung-Chih Lin, Sen-Kuei Hsu, Hao Chen
2014	A	`conf`	Wafer Level Chip Scale Package copper pillar probing. ITC Hao Chen, Hung-Chih Lin, Ching-Nen Peng, Min-Jer Wang
2013	A	`conf`	Test-yield improvement of high-density probing technology using optimized metal backer with plastic patch. ITC Sen-Kuei Hsu, Hao Chen, Chung-Han Huang, Der-Jiann Liu, Wei-Hsun Lin, Hung-Chih Lin, Ching-Nen Peng, Min-Jer Wang
2012	A	`conf`	A memory yield improvement scheme combining built-in self-repair and error correction codes. ITC Tze-Hsin Wu, Po-Yuan Chen, Mincent Lee, Bin-Yen Lin, Cheng-Wen Wu, Chen-Hung Tien, Hung-Chih Lin, Hao Chen, Ching-Nen Peng, Min-Jer Wang