Hans Martin von Staudt

13 papers A 9B 1C 1Misc 2
YearRankTypeTitle / Venue / Authors
2025 A conf
Making IJTAG Address Physical-World Digital and Mixed-Signal Test Challenges.
ITC
Hans Martin von Staudt, Jeff Rearick, Michael Laisne
2022 A conf
High-Coverage DfT and Reliability Enhancements for Automotive Floating Gate OTP Beyond AEC-Q100.
ITC
Hans Martin von Staudt, Franz Schuler, Rohitaswa Bhattacharya, Justin Wei-Lin Cheng, Cheng-Da Huang, Parker Chih-Chun Chen
2022 A conf
IEEE P1687.1: Extending the Network Boundaries for Test.
ITC
Michael Laisne, Alfred L. Crouch, Michele Portolan, Martin Keim, Hans Martin von Staudt, Bradford G. Van Treuren, Jeff Rearick, Songlin Zuo
2022 A conf
Probeless DfT Scheme for Testing 20k I/Os of an Automotive Micro-LED Headlamp Driver IC.
ITC
Hans Martin von Staudt, Luai Tarek Elnawawy, Sarah Wang, Larry Ping, Jung Woo Choi
2021 B conf
Exploring and Comparing IEEE P1687.1 and IEEE 1687 Modeling of Non-TAP Interfaces.
ETS
Hans Martin von Staudt, Bradford G. Van Treuren, Jeff Rearick, Michele Portolan, Martin Keim
2020 A conf
Industrial Application of IJTAG Standards to the Test of Big-A/little-d devices.
ITC
Hans Martin von Staudt, Mohamed Anas Benhebibi, Jeff Rearick, Michael Laisne
2020 A conf
Modeling Novel Non-JTAG IEEE 1687-Like Architectures.
ITC
Mike Laisne, Alfred L. Crouch, Michele Portolan, Martin Keim, Hans Martin von Staudt, M. Abdalwahab, Bradford G. Van Treuren, Jeff Rearick
2019 Misc conf
Innovative Design for Test in State-of-the-Art Analog Systems.
VTS
Hans Martin von Staudt, Amit Majumdar, Bill Taylor, Jennifer Kitchen
2019 Misc conf
Innovative Practices on IEEE 1687.xyz.
VTS
Jeff Rearick, Alfred L. Crouch, Hans Martin von Staudt
2017 A conf
Single-pin test control for Big A, little D devices.
ITC
Michael Laisne, Hans Martin von Staudt, Sourabh Bhalerao, Mark Eason
2007 A conf
A sophisticated memory test engine for LCD display drivers.
DATE
Oliver Spang, Hans Martin von Staudt, Michael G. Wahl
2006 C conf
Productivity and Code Quality Improvement of Mixed-Signal Test Software by Applying Software Engineering Methods.
DDECS
Stefan Vock, Ulrich Flogaus, Hans Martin von Staudt
2006 A conf
Test Software Generation Productivity and Code Quality Improvement by applying Software Engineering Techniques.
ITC
Stefan Vock, Markus Schmid, Hans Martin von Staudt