| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2012 | J | jnl |
IEEE Commun. Lett.
|
| 2008 | J | jnl |
IEICE Trans. Electron.
|
| 2005 | J | jnl |
Reliability investigations on LTG-GaAs photomixers for THz generation based on optical heterodyning.
Microelectron. Reliab.
|
| 2004 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2003 | J | jnl |
Microelectron. Reliab.
|
| 2002 | J | jnl |
Microelectron. Reliab.
|
| 2002 | J | jnl |
Microelectron. Reliab.
|
| 2001 | J | jnl |
Microelectron. Reliab.
|
| 1999 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 1997 | J | jnl |
Ann. des Télécommunications
|
| 1996 | — | conf |
ISMVL
|
| 1994 | — | conf |
ISMVL
|