Hans G. Kerkhoff

140 papers A 11B 13C 25Misc 7Journal 27Unranked 57
YearRankTypeTitle / Venue / Authors
2021 C conf
Embedded Test Instrument for Intermittent Resistive Fault Detection at Chip Level and Its Reuse at Board Level.
DDECS
Hassan Ebrahimi, Hans G. Kerkhoff
2020 B conf
A New Monitor Insertion Algorithm for Intermittent Fault Detection.
ETS
Hassan Ebrahimi, Hans G. Kerkhoff
2020 C conf
Life-Time Prognostics of Dependable VLSI-SoCs using Machine-learning.
IOLTS
Leila Bagheriye, Ghazanfar Ali, Hans G. Kerkhoff
2020 C conf
On-Chip Embedded Instruments Data Fusion and Life-Time Prognostics of Dependable VLSI-SoCs using Machine-Learning.
ISCAS
Ghazanfar Ali, Leila Bagheriye, Hans G. Kerkhoff
2020 — conf
On-chip EOL Prognostics Using Data-Fusion of Embedded Instruments for Dependable MP-SoCs.
ATS
Ghazanfar Ali, Leila Bagheriye, Hans A. R. Manhaeve, Hans G. Kerkhoff
2019 J jnl
A Digital On-Line Monitor for Detecting Intermittent Resistance Faults at Board Level.
J. Circuits Syst. Comput.
Hassan Ebrahimi, Hans G. Kerkhoff
2019 — conf
An On-Chip IEEE 1687 Network Controller for Reliability and Functional Safety Management of System-on-Chips.
ITC-Asia
Ahmed M. Y. Ibrahim, Hans G. Kerkhoff
2019 — conf
Analog Test Interface for IEEE 1687 Employing Split SAR Architecture to Support Embedded Instrument Dependability Applications.
DFT
Jerrin Pathrose, Leon van de Logt, Hans G. Kerkhoff
2019 A conf
DARS: An EDA Framework for Reliability and Functional Safety Management of System-on-Chips.
ITC
Ahmed M. Y. Ibrahim, Hans G. Kerkhoff
2019 Misc conf
Efficient Structured Scan Patterns Retargeting for Hierarchical IEEE 1687 Networks.
VTS
Ahmed M. Y. Ibrahim, Hans G. Kerkhoff, Abrar Ibrahim, Mona Safar, M. Watheq El-Kharashi
2019 — conf
IJTAG Compatible Delay-line based Voltage Embedded Instrument with One Clock-cycle Conversion Time.
LATS
Ghazanfar Ali, Jerrin Pathrose, Hans G. Kerkhoff
2019 B conf
IJTAG Compatible Timing Monitor with Robust Self-Calibration for Environmental and Aging Variation.
ETS
Ghazanfar Ali, Jerrin Pathrose, Hans G. Kerkhoff
2018 — conf
Design and implementation of a dependable CPSoC for automotive applications.
ICPS
Ghazanfar Ali, Hassan Ebrahimi, Jerrin Pathrose, Hans G. Kerkhoff
2018 — conf
Enhancing Physical Unclonable Function Robustness Employing Embedded Instruments.
APCCAS
Jerrin Pathrose, Ghazanfar Ali, Hans G. Kerkhoff
2018 — conf
IJTAG compatible analogue embedded instruments for MPSoC life-time prediction.
LATS
Jerrin Pathrose, Ghazanfar Ali, Hans G. Kerkhoff
2018 C conf
Intermittent Resistance Fault Detection at Board Level.
DDECS
Hassan Ebrahimi, Hans G. Kerkhoff
2018 — conf
On-Chip Lifetime Prediction for Dependable Many-Processor SoCs Based on Data Fusion.
MCSoC
Ghazanfar Ali, Jerrin Pathrose, Hans G. Kerkhoff
2017 C conf
A cost-efficient dependability management framework for self-aware system-on-chips based on IEEE 1687.
IOLTS
Ahmed Ibrahim, Hans G. Kerkhoff
2017 — conf
A dependable AMR sensor system for automotive applications.
ITC-Asia
Andreina Zambrano, Hans G. Kerkhoff
2017 — conf
An automotive MP-SoC featuring an advanced embedded instrument infrastructure for high dependability.
ITC-Asia
Hans G. Kerkhoff, Ghazanfar Ali, Hassan Ebrahimi, Ahmed Ibrahim
2017 C conf
Applying IJTAG-compatible embedded instruments for lifetime enhancement of analog front-ends of cyber-physical systems.
VLSI-SoC
Hans G. Kerkhoff, Ghazanfar Ali, Jinbo Wan, Ahmed Ibrahim, Jerrin Pathrose
2017 A conf
BASTION: Board and SoC test instrumentation for ageing and no failure found.
DATE
Artur Jutman, Christophe Lotz, Erik Larsson, Matteo Sonza Reorda, Maksim Jenihhin, Jaan Raik, Hans G. Kerkhoff, Rene Krenz-Baath, Piet Engelke
2017 B conf
Improving the dependability of AMR sensors used in automotive applications.
ETS
Andreina Zambrano, Hans G. Kerkhoff
2017 Misc conf
Structured scan patterns retargeting for dynamic instruments access.
VTS
Ahmed Ibrahim, Hans G. Kerkhoff
2016 — conf
A genetic algorithm based remaining lifetime prediction for a VLIW processor employing path delay and IDDX testing.
DTIS
Yong Zhao, Hans G. Kerkhoff
2016 — conf
A software framework to calculate local temperatures in CMOS processors.
PATMOS
Alireza Rohani, Hassan Ebrahimi, Hans G. Kerkhoff
2016 — conf
Accessing on-chip temperature health monitors using the IEEE 1687 standard.
ICECS
Ghazanfar Ali, Ahmed Badawy, Hans G. Kerkhoff
2016 B conf
Analysis and design of an on-chip retargeting engine for IEEE 1687 networks.
ETS
Ahmed Ibrahim, Hans G. Kerkhoff
2016 C conf
Designing reliable cyber-physical systems overview associated to the special session at FDL'16.
FDL
Gadi Aleksandrowicz, Eli Arbel, Roderick Bloem, Timon D. ter Braak, Sergei Devadze, Görschwin Fey, Maksim Jenihhin, Artur Jutman, Hans G. Kerkhoff, Robert Könighofer, Jan Malburg, Shiri Moran, Jaan Raik, Gerard K. Rauwerda, Heinz Riener, Franz Röck, Konstantin Shibin, Kim Sunesen, Jinbo Wan, Yong Zhao
2016 — conf
Detecting intermittent resistive faults in digital CMOS circuits.
DFT
Hassan Ebrahimi, Alireza Rohani, Hans G. Kerkhoff
2016 — conf
Efficient utilization of hierarchical iJTAG networks for interrupts management.
DFT
Ahmed Ibrahim, Hans G. Kerkhoff
2016 — conf
Highly Dependable Multi-processor SoCs Employing Lifetime Prediction Based on Health Monitors.
ATS
Yong Zhao, Hans G. Kerkhoff
2016 J jnl
Investigation of Intermittent Resistive Faults in Digital CMOS Circuits.
J. Circuits Syst. Comput.
Hans G. Kerkhoff, Hassan Ebrahimi
2016 C conf
Online digital compensation Method for AMR sensors.
VLSI-SoC
Andreina Zambrano, Hans G. Kerkhoff
2016 C conf
Online monitoring of the maximum angle error in AMR sensors.
IOLTS
Andreina Zambrano, Hans G. Kerkhoff
2016 C conf
Testing for Intermittent Resistive Faults in CMOS Integrated Systems.
DSD
Hassan Ebrahimi, Hans G. Kerkhoff
2016 Misc conf
Thermal issues in test: An overview of the significant aspects and industrial practice.
VTS
Juergen Alt, Paolo Bernardi, Alberto Bosio, Riccardo Cantoro, Hans G. Kerkhoff, Andreas Leininger, Wolfgang Molzer, Alessandro Motta, Christian Pacha, Alberto Pagani, Alireza Rohani, R. Strasser
2016 — conf
Towards an automated and reusable in-field self-test solution for MPSoCs.
ICM
Ahmed Ibrahim, Hans G. Kerkhoff
2015 — conf
Application of functional IDDQ testing in a VLIW processor towards detection of aging degradation.
DTIS
Yong Zhao, Hans G. Kerkhoff
2015 — conf
Embedded instruments for enhancing dependability of analogue and mixed-signal IPs.
NEWCAS
Jinbo Wan, Hans G. Kerkhoff
2015 C conf
Fault-tolerant system for catastrophic faults in AMR sensors.
IOLTS
Andreina Zambrano, Hans G. Kerkhoff
2015 C conf
Intermittent Resistive Faults in Digital CMOS Circuits.
DDECS
Hans G. Kerkhoff, Hassan Ebrahimi
2015 B conf
New drain current model for nano-meter MOS transistors on-chip threshold voltage test.
ETS
Jinbo Wan, Hans G. Kerkhoff
2015 C conf
On the maximization of the sustained switching activity in a processor.
IOLTS
Riccardo Cantoro, Matteo Sonza Reorda, Alireza Rohani, Hans G. Kerkhoff
2015 — conf
Online digital offset voltage compensation method for AMR sensors.
I2MTC
Andreina Zambrano, Hans G. Kerkhoff
2015 C conf
Unit-Based Functional IDDT Testing for Aging Degradation Monitoring in a VLIW Processor.
DSD
Yong Zhao, Hans G. Kerkhoff
2014 A conf
An embedded offset and gain instrument for OpAmp IPs.
DATE
Jinbo Wan, Hans G. Kerkhoff
2014 — conf
Day 1: Invited talk 2: Dependable mixed-signal integrated systems under aging.
IDT
Hans G. Kerkhoff
2014 C conf
Design of an Embedded Health Monitoring Infrastructure for Accessing Multi-processor SoC Degradation.
DSD
Yong Zhao, Hans G. Kerkhoff
2014 — conf
Linking aging measurements of health-monitors and specifications for multi-processor SoCs.
DTIS
Hans G. Kerkhoff, Jinbo Wan, Yong Zhao
2014 C conf
Studying DAC capacitor-array degradation in charge-redistribution SAR ADCs.
DDECS
Muhammad Aamir Khan, Hans G. Kerkhoff
2014 B conf
Two soft-error mitigation techniques for functional units of DSP processors.
ETS
Alireza Rohani, Hans G. Kerkhoff
2014 — conf
iJTAG integration of complex digital embedded instruments.
IDT
Ahmed Ibrahim, Hans G. Kerkhoff
2013 — conf
An arbitrary stressed NBTI compact model for analog/mixed-signal reliability simulations.
ISQED
Jinbo Wan, Hans G. Kerkhoff
2013 C conf
An indirect technique for estimating reliability of analog and mixed-signal systems during operational life.
DDECS
Muhammad Aamir Khan, Hans G. Kerkhoff
2013 — conf
Analysing degradation effects in charge-redistribution SAR ADCs.
DFTS
Muhammad Aamir Khan, Hans G. Kerkhoff
2013 J jnl
Exploiting Multiple Mahalanobis Distance Metrics to Screen Outliers From Analog Product Manufacturing Test Responses.
IEEE Des. Test
Shaji Krishnan, Hans G. Kerkhoff
2013 — conf
Monitoring operating temperature and supply voltage in achieving high system dependability.
DTIS
Muhammad Aamir Khan, Hans G. Kerkhoff
2013 — conf
Power-dissipation comparison of two dependability approaches for multi-processor systems.
DTIS
Yong Zhao, Xiao Zhang, Hans G. Kerkhoff
2013 — conf
Pulse-length determination techniques in the rectangular single event transient fault model.
ICSAMOS
Alireza Rohani, Hans G. Kerkhoff, Enrico Costenaro, Dan Alexandrescu
2013 J jnl
Rapid transient fault insertion in large digital systems.
Microprocess. Microsystems
Alireza Rohani, Hans G. Kerkhoff
2013 C conf
The Essence of Reliability Estimation during Operational Life for Achieving High System Dependability.
DSD
Muhammad Aamir Khan, Hans G. Kerkhoff
2012 B conf
A robust metric for screening outliers from analogue product manufacturing tests responses.
ETS
Shaji Krishnan, Hans G. Kerkhoff
2012 J jnl
ADC Multi-Site Test Based on a Pre-test with Digital Input Stimulus.
J. Electron. Test.
Xiaoqin Sheng, Hans G. Kerkhoff, Amir Zjajo, Guido Gronthoud
2012 — conf
An on-line soft error mitigation technique for control logic of VLIW processors.
DFT
Alireza Rohani, Hans G. Kerkhoff
2012 C conf
Investigating Dependability of Short-Range Wireless Embedded Systems through Hardware Platform Based Design.
DSD
Benaoumeur Senouci, Anne-Johan Annema, Mark J. Bentum, Hans G. Kerkhoff
2012 A conf
Monitoring active filters under automotive aging scenarios with embedded instrument.
DATE
Jinbo Wan, Hans G. Kerkhoff
2012 C conf
The design of dependable flexible multi-sensory System-on-Chips for security applications.
DDECS
Hans G. Kerkhoff, Yong Zhao
2011 C conf
A Dependability Solution for Homogeneous MPSoCs.
PRDC
Xiao Zhang, Hans G. Kerkhoff
2011 B conf
A Robust Metric for Screening Outliers from Analogue Product Manufacturing Tests Responses.
ETS
Shaji Krishnan, Hans G. Kerkhoff
2011 C conf
A Technique for Accelerating Injection of Transient Faults in Complex SoCs.
DSD
Alireza Rohani, Hans G. Kerkhoff
2011 C conf
A system-level platform for dependability enhancement and its analysis for mixed-signal SoCs.
DDECS
Muhammad Aamir Khan, Hans G. Kerkhoff
2011 — conf
Boosted gain programmable Opamp with embedded gain monitor for dependable SoCs.
ISOCC
Jinbo Wan, Hans G. Kerkhoff
2011 — conf
SoC Mixed-Signal Dependability Enhancement: A Strategy from Design to End-of-Life.
DFT
Muhammad Aamir Khan, Hans G. Kerkhoff
2011 — conf
Study of the effects of SET induced faults on submicron technologies.
DSN Workshops
Alireza Rohani, Hans G. Kerkhoff
2010 A conf
Block-level bayesian diagnosis of analogue electronic circuits.
DATE
Shaji Krishnan, Klaas D. Doornbos, Rudi Brand, Hans G. Kerkhoff
2010 — conf
Design of an Infrastructural IP Dependability Manager for a Dependable Reconfigurable Many-Core Processor.
DELTA
Hans G. Kerkhoff, Xiao Zhang
2010 B conf
Multivariate model for test response analysis.
ETS
Shaji Krishnan, Hans G. Kerkhoff
2010 B conf
New scan-based test strategy for a dependable many-core processor using a NoC as a Test Access Mechanism.
ETS
Xiao Zhang, Hans G. Kerkhoff, Bart Vermeulen
2010 C conf
On-chip Scan-Based Test Strategy for a Dependable Many-Core Processor Using a NoC as a Test Access Mechanism.
DSD
Xiao Zhang, Hans G. Kerkhoff, Bart Vermeulen
2010 — conf
On-line dependability enhancement of multiprocessor SoCs by resource management.
SoC
Timon D. ter Braak, S. T. Burgess, H. Hurskainen, Hans G. Kerkhoff, Bart Vermeulen, Xiao Zhang
2010 B conf
Predicting dynamic specifications of ADCs with a low-quality digital input signal.
ETS
Xiaoqin Sheng, Vincent Kerzerho, Hans G. Kerkhoff
2010 — conf
The Test Ability of an Adaptive Pulse Wave for ADC Testing.
Asian Test Symposium
Xiaoqin Sheng, Hans G. Kerkhoff
2009 B conf
Algorithms for ADC Multi-site Test with Digital Input Stimulus.
ETS
Xiaoqin Sheng, Hans G. Kerkhoff, Amir Zjajo, Guido Gronthoud
2009 C conf
Design of a Highly Dependable Beamforming Chip.
DSD
Xiao Zhang, Hans G. Kerkhoff
2009 J jnl
Fault co-simulation for test evaluation of heterogeneous integrated biological systems.
Microelectron. J.
Hans G. Kerkhoff, Xiao Zhang
2008 J jnl
A Dependable Micro-Electronic Peptide Synthesizer Using Electrode Data.
VLSI Design
Hans G. Kerkhoff, Xiao Zhang, Frédérick Mailly, Pascal Nouet, Hongyuan Liu, Andrew Richardson
2008 — conf
Built-in-Self-Diagnostics for a NoC-Based Reconfigurable IC for Dependable Beamforming Applications.
DFT
Oscar Kuiken, Xiao Zhang, Hans G. Kerkhoff
2008 — conf
Testing of a Highly Reconfigurable Processor Core for Dependable Data Streaming Applications.
DELTA
Hans G. Kerkhoff, Jarkko J. M. Huijts
2007 J jnl
Testing Microelectronic Biofluidic Systems.
IEEE Des. Test Comput.
Hans G. Kerkhoff
2006 — conf
Fault Modelling and Co-Simulation in FlowFET-Based Biological Array Systems.
DELTA
Hans G. Kerkhoff, Xiao Zhang, R. W. Barber, D. R. Emerson
2005 B conf
Testing of MEMS-based microsystems.
ETS
Hans G. Kerkhoff
2005 J jnl
The test search for true mixed-signal cores.
Microelectron. J.
Hans G. Kerkhoff
2004 J jnl
Scan Test Strategy for Asynchronous-Synchronous Interfaces.
J. Electron. Test.
Octavian Petre, Hans G. Kerkhoff
2004 — conf
Testability Issues in Superconductor Electronic.
DELTA
Hans G. Kerkhoff, Arun A. Joseph
2003 J jnl
Analog and mixed signal test techniques for SoCs.
Microelectron. J.
Hans G. Kerkhoff, Bozena Kaminska
2003 — conf
Enhanced P1500 compliant wrapper suitable for delay fault testing of embedded cores.
ETW
H. J. Vermaak, Hans G. Kerkhoff
2003 J jnl
Fast Fault Simulation for Nonlinear Analog Circuits.
IEEE Des. Test Comput.
Nur Engin, Hans G. Kerkhoff
2003 — conf
Scan test strategy for asynchronous-synchronous interfaces [SoC testing].
ETW
Octavian Petre, Hans G. Kerkhoff
2003 J jnl
Synchronous Full-Scan for Asynchronous Handshake Circuits.
J. Electron. Test.
Frank te Beest, Ad M. G. Peeters, Kees van Berkel, Hans G. Kerkhoff
2003 J jnl
Testability-analysis driven test-generation of analogue cores.
Microelectron. J.
M. Stancic, Hans G. Kerkhoff
2003 Misc conf
Testable Design and Testing of Micro-Electro-Fluidic Arrays.
VTS
Hans G. Kerkhoff, Mustafa Acar
2003 A conf
Towards Structural Testing of Superconductor Electronics.
ITC
Arun A. Joseph, Hans G. Kerkhoff
2002 A conf
A New Test Generation Approach for Embedded Analogue Cores in SoC.
ITC
M. Stancic, Liquan Fang, M. H. H. Weusthof, R. M. W. Tijink, Hans G. Kerkhoff
2002 J jnl
An Implementation for Test-Time Reduction in VLIW Transport-Triggered Architectures.
J. Electron. Test.
V. A. Zivkovic, Ronald J. W. T. Tangelder, Hans G. Kerkhoff
2002 A conf
Automatic Scan Insertion and Test Generation for Asynchronous Circuits.
ITC
Frank te Beest, Ad M. G. Peeters, Marc Verra, Kees van Berkel, Hans G. Kerkhoff
2002 — conf
On-Chip Tap-Delay Measurements for a Digital Delay-Line Used in High-Speed Inter-Chip Data Communications.
Asian Test Symposium
Octavian Petre, Hans G. Kerkhoff
2002 Misc conf
SoCs with MEMS? Can We Include MEMS in the SoCs Design and Test Flow?
VTS
Salvador Mir, H. Bederr, R. D. (Shawn) Blanton, Hans G. Kerkhoff, H. J. Klim
2002 — conf
Testable Design and Testing of High-Speed Superconductor Microelectronics.
DELTA
Hans G. Kerkhoff, Arun A. Joseph, Sander Heuvelmans
2001 — conf
An implementation for test-time reduction in VLIW transport-triggered architectures.
ETW
V. A. Zivkovic, Ronald J. W. T. Tangelder, Hans G. Kerkhoff
2001 J jnl
Design for Delay Testability in High-Speed Digital ICs.
J. Electron. Test.
Hans G. Kerkhoff, Han Speek, M. Shashani, Manoj Sachdev
2001 J jnl
Fault Modeling and Fault Simulation in Mixed Micro-Fluidic Microelectronic Systems.
J. Electron. Test.
Hans G. Kerkhoff, Hans P. A. Hendriks
2001 — conf
Increasing the Fault Coverage in Multiple Clock Domain Systems by Using On-Line Testing of Synchronizers.
IOLTW
Octavian Petre, Hans G. Kerkhoff
2001 J jnl
Modeling a Verification Test System for Mixed-Signal Circuits.
IEEE Des. Test Comput.
David San Segundo Bello, Ronald J. W. T. Tangelder, Hans G. Kerkhoff
2001 — conf
Reducing analogue fault-simulation time by using high-level modelling in dotss for an industrial design.
ETW
Liquan Fang, Guido Gronthoud, Hans G. Kerkhoff
2001 — conf
Reducing the susceptibility of design-for-delay-testability structures to process- and application-induced variations.
ETW
Herman J. Vermaak, Hans G. Kerkhoff
2001 A conf
Tackling test trade-offs from design, manufacturing to market using economic modeling.
ITC
Erik H. Volkerink, Ajay Khoche, Linda A. Kamas, Jochen Rivoir, Hans G. Kerkhoff
2001 J jnl
Testing of a microanalysis system.
IEEE Trans. Instrum. Meas.
Hans G. Kerkhoff
2000 Misc conf
A Low-Speed BIST Framework for High-Performance Circuit Testing.
VTS
Hans G. Kerkhoff, Mansour Shashaani, Manoj Sachdev
2000 — conf
Bridging the testing speed gap: design for delay testability.
ETW
Han Speek, Hans G. Kerkhoff, Manoj Sachdev, Mansour Shashaani
2000 A conf
Design and Test Space Exploration of Transport-Triggered Architectures.
DATE
V. A. Zivkovic, Ronald J. W. T. Tangelder, Hans G. Kerkhoff
1999 J jnl
Configurations for IDDQ-Testable PLAs.
IEEE Des. Test Comput.
Manoj Sachdev, Hans G. Kerkhoff
1999 J jnl
Integrated Design and Test of Mixed-Signal Circuits.
J. Electron. Test.
Nur Engin, Hans G. Kerkhoff, Ronald J. W. T. Tangelder, Han Speek
1999 J jnl
Integration of the Scan-Test Method into an Architecture Specific Core-Test Approach.
J. Electron. Test.
Chris Feige, Jan Ten Pierick, Clemens Wouters, Ronald J. W. T. Tangelder, Hans G. Kerkhoff
1999 J jnl
Off-Chip Diagnosis of Aperture Jitter in Full-Flash Analog-to-Digital Converters.
J. Electron. Test.
Richard Rosing, Hans G. Kerkhoff, Ronald J. W. T. Tangelder, Manoj Sachdev
1998 — conf
Microsystem Testing: Challenge or Common Knowledge?
Asian Test Symposium
Hans G. Kerkhoff
1997 — conf
Compact structural test generation for analog macros.
ED&TC
V. Kaal, Hans G. Kerkhoff
1997 — conf
Smart sensor system application: an integrated compass.
ED&TC
Ronald J. W. T. Tangelder, G. Diemel, Hans G. Kerkhoff
1996 — conf
MISMATCH: a basis for semi-automatic functional mixed-signal test-pattern generation.
ICECS
Hans G. Kerkhoff, Ronald J. W. T. Tangelder, Han Speek, Nur Engin
1996 — conf
Test Structures on MCM Active Substrate: Is it worthwhile?
ED&TC
Joan Oliver, Hans G. Kerkhoff
1995 — conf
Gate delay fault test generation for non-scan circuits.
ED&TC
G. Van Brakel, Uwe Gläser, Hans G. Kerkhoff, Heinrich Theodor Vierhaus
1992 — conf
A fast and accurate characterization method for full-CMOS circuits.
EURO-DAC
Rafael Peset Llopis, Hans G. Kerkhoff
1991 Misc conf
A design-for-testability expert system for silicon compilers.
VTS
R. P. van Riessen, Hans G. Kerkhoff, J. M. J. Janssen
1991 — conf
A performance analysis tool for performance-driven micro-cell generation.
EURO-DAC
Rafael Peset Llopis, R. J. H. Koopman, Hans G. Kerkhoff, J. A. Braat
1990 — conf
A Comparative Analysis of Multiplexer Techniques for the Minimization of Function Cost Using the Costtable Approach.
ISMVL
Jon T. Butler, Hans G. Kerkhoff, Siep Onneweer
1990 J jnl
Designing and Implementing an Architecture with Boundary Scan.
IEEE Des. Test Comput.
R. P. van Riessen, Hans G. Kerkhoff, A. Kloppenburg
1990 J jnl
Testability analysis of analog systems.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Gertjan J. Hemink, Berend W. Meijer, Hans G. Kerkhoff
1988 J jnl
Multiple-Valued CCD Circuits.
Computer
Jon T. Butler, Hans G. Kerkhoff
1988 A conf
TASTE: A Tool for Analog System Testability Evaluation.
ITC
Gertjan J. Hemink, Berend W. Meijer, Hans G. Kerkhoff
1981 J jnl
Multiple-Valued Logic Charge-Coupled Devices.
IEEE Trans. Computers
Hans G. Kerkhoff, Marius L. Tervoert