Hans A. R. Manhaeve

20 papers A 5B 2C 1Journal 4Unranked 8
YearRankTypeTitle / Venue / Authors
2020 — conf
On-chip EOL Prognostics Using Data-Fusion of Embedded Instruments for Dependable MP-SoCs.
ATS
Ghazanfar Ali, Leila Bagheriye, Hans A. R. Manhaeve, Hans G. Kerkhoff
2015 J jnl
Dependable Multicore Architectures at Nanoscale: The View From Europe.
IEEE Des. Test
Marco Ottavi, Salvatore Pontarelli, Dimitris Gizopoulos, Cristiana Bolchini, Maria K. Michael, Lorena Anghel, Mehdi Baradaran Tahoori, Antonis M. Paschalis, Pedro Reviriego, Oliver Bringmann, Viacheslav Izosimov, Hans A. R. Manhaeve, Christos Strydis, Said Hamdioui
2013 B conf
Current testing: Dead or alive?
ETS
Hans A. R. Manhaeve, Pete Harrod, Adit D. Singh, Chintan Patel, Ralf Arnolc, Davide Appello
2013 J jnl
Guest Editorial - Special Issue on Manufacturable and Dependable Multicore Architectures at Nanoscale (MEDIAN).
J. Electron. Test.
Dimitris Gizopoulos, Said Hamdioui, Hans A. R. Manhaeve
2013 B conf
Semiconductor failure modes and mitigation for critical systems embedded tutorial.
ETS
Hans A. R. Manhaeve, Esko Mikkola
2008 C conf
The Quest for Test: Will Redundancy Cover All?
DDECS
Hans A. R. Manhaeve
2008 A conf
Theoretical and Practical Aspects of IDDQ Settling-Impact on Measurement Timing and Quality.
DATE
B. Straka, Hans A. R. Manhaeve, J. Brenkus, Stefaan Kerckenaere
2005 — conf
Current Testing for Nanotechnologies: A Demystifying Application Perspective..
Asian Test Symposium
Hans A. R. Manhaeve
2004 J jnl
Current testing for nanotechnologies: Myths, facts, and figures.
IEEE Des. Test Comput.
Hans A. R. Manhaeve
2003 — conf
A practical evaluation of I
ETW
Alessandra Fudoli, Alberto Ascagni, Davide Appello, Hans A. R. Manhaeve
2002 — conf
A real world application used to implement a true IDDQ based test strategy (facts and figures).
ETW
Hans A. R. Manhaeve, Joseph S. Vaccaro, Loren Benecke, David Prystasz
2001 — conf
An On-Chip Detection Circuit for the Verification of IC Supply Connections.
DFT
Hans A. R. Manhaeve, Stefaan Kerckenaere
2000 J jnl
Application of Supply Current Testing to Analogue Circuits, Towards a Structural Analogue Test Methodology.
J. Electron. Test.
Hans A. R. Manhaeve, Johan Verfaillie, B. Straka, J. P. Cornil
1999 — conf
Application of supply current testing to analogue circuits, towards a structural analogue test methodology.
ETW
Hans A. R. Manhaeve, Johan Verfaillie, B. Straka, J. P. Cornil
1999 A conf
On-Chip Transient Current Monitor for Testing of Low Voltage CMOS IC.
DATE
Viera Stopjaková, Hans A. R. Manhaeve, M. Sidiropulos
1998 A conf
A Fully Digital Controlled Off-Chip IDDQ Measurement Unit.
DATE
B. Straka, Hans A. R. Manhaeve, Jozef Vanneuville, M. Svajda
1998 A conf
IOCIMU - An Integrated Off-Chip IDDQ Measurement Unit.
DATE
M. Svajda, B. Straka, Hans A. R. Manhaeve
1997 — conf
A monolithic off-chip IDDQ monitor.
ED&TC
M. Svajda, B. Straka, Hans A. R. Manhaeve
1997 — conf
CCII+ current conveyor based BIC monitor for I
ED&TC
Viera Stopjaková, Hans A. R. Manhaeve
1994 A conf
An Off-chip I
ITC
Hans A. R. Manhaeve, Paul L. Wrighton, Jos van Sas, Urbain Swerts