| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | — | conf |
LATS
|
| 2025 | — | conf |
LATS
|
| 2025 | B | conf |
ETS
|
| 2025 | J | jnl |
J. Electron. Test.
|
| 2024 | A | conf |
ITC
|
| 2024 | B | conf |
ETS
|
| 2024 | — | conf |
LATS
|
| 2023 | C | conf |
IOLTS
|
| 2023 | — | conf |
DSN-W
|
| 2023 | A | conf |
ITC
|
| 2023 | A | conf |
Robust Resistive Open Defect Identification Using Machine Learning with Efficient Feature Selection.
DATE
|
| 2023 | — | conf |
LATS
|
| 2022 | A | conf |
DATE
|