Hang-Ting Lue

17 papers A* 1C 1Journal 3Unranked 12
YearRankTypeTitle / Venue / Authors
2025 — conf
A Novel 3D Stacked Vertical-Channel High-Voltage Peripheral Transistor for Largely Scaled the WL Driver Circuit of 1000-layer 3D NAND Flash.
IMW
Teng-Hao Yeh, Hang-Ting Lue, Wei-Chen Chen, Keh-Chung Wang, Chih-Yuan Lu
2024 — conf
Charge Loss Improvement in 3D Flash Memory by Molecular Oxidation of Tunneling Oxide.
IRPS
Pei-Ci Jhang, Chi-Pin Lu, Jung-Yu Shieh, Ling-Wu Yang, Tahone Yang, Kuang-Chao Chen, Hang-Ting Lue, Pei-Ying Du, Chih-Yuan Lu
2024 — conf
Improved 3D DRAM Design Based on Gate-Controlled Thyristor Featuring Two Asymmetrical Horizontal WL's and Vertical BL for Better Cell Size Scaling and Array Selection.
IMW
Wei-Chen Chen, Hang-Ting Lue, Ming-Hung Wu, Yu-Tang Lin, Keh-Chung Wang, Chih-Yuan Lu
2024 — conf
Multi-Gate Access Transistor to Minimize GIDL Leakage Current for Scaling 2-tier Stacked 4F
IMW
Hang-Ting Lue, Wei-Chen Chen, Yu-Tang Lin, Keh-Chung Wang, Chih-Yuan Lu
2023 — conf
A Simulation Study of Scaling Capability toward 10nm for the 3D Stackable Gate-Controlled Thyristor (GCT) DRAM Device.
IMW
Wei-Chen Chen, Hang-Ting Lue, Tzu-Hsuan Hsu, Keh-Chung Wang, Chih-Yuan Lu
2023 — conf
Chip Demonstration of a High-Density (43Gb) and High-Search-Bandwidth (300Gb/s) 3D NAND Based In-Memory Search Accelerator for Ternary Content Addressable Memory (TCAM) and Proximity Search of Hamming Distance.
VLSI Technology and Circuits
Chih-Chang Hsieh, Hang-Ting Lue, Yung-Chun Li, Shuo-Nan Hung, Chun-Hsiung Hung, Keh-Chung Wang, Chih-Yuan Lu
2022 — conf
First Experimental Study of Floating-Body Cell Transient Reliability Characteristics of Both N- and P-Channel Vertical Gate-All-Around Devices with Split-Gate Structures.
IRPS
Cheng-Lin Sung, Sheng-Ting Fan, Hang-Ting Lue, Wei-Chen Chen, Pei-Ying Du, Teng-Hao Yeh, Keh-Chung Wang, Chih-Yuan Lu
2021 C conf
Design of Computing-in-Memory (CIM) with Vertical Split-Gate Flash Memory for Deep Neural Network (DNN) Inference Accelerator.
ISCAS
Hang-Ting Lue, Han-Wen Hu, Tzu-Hsuan Hsu, Po-Kai Hsu, Keh-Chung Wang, Chih-Yuan Lu
2021 — conf
First Study of P-Channel Vertical Split-Gate Flash Memory Device with Various Electron and Hole Injection Methods and Potential Future Possibility to Enable Functional Memory Circuits.
IMW
Cheng-Lin Sung, Hang-Ting Lue, Wei-Chen Chen, Tzu-Hsuan Hsu, Keh-Chung Wang, Chih-Yuan Lu
2021 — conf
Robust Brain-Inspired Computing: On the Reliability of Spiking Neural Network Using Emerging Non-Volatile Synapses.
IRPS
Ming-Liang Wei, Hussam Amrouch, Cheng-Lin Sung, Hang-Ting Lue, Chia-Lin Yang, Keh-Chung Wang, Chih-Yuan Lu
2021 — conf
Write-In-Place Operation and It's Advantages to Upgrade the 3D AND-type Flash Memory Performances.
IMW
Hang-Ting Lue, Tzu-Hsuan Hsu, Cheng-Lin Sung, Teng-Hao Yeh, Keh-Chung Wang, Chih-Yuan Lu
2020 — conf
Introduction of Non-Volatile Computing In Memory (nvCIM) by 3D NAND Flash for Inference Accelerator of Deep Neural Network (DNN) and the Read Disturb Reliability Evaluation : (Invited Paper).
IRPS
Hang-Ting Lue, Po-Kai Hsu, Keh-Chung Wang, Chih-Yuan Lu
2020 — conf
Study of the Walk-Out Effect of Junction Breakdown Instability of the High-Voltage Depletion-Mode N-Channel MOSFET for NAND Flash Peripheral Device and an Efficient Layout Solution.
IRPS
Chieh Roger Lo, Teng-Hao Yeh, Wei-Chen Chen, Hang-Ting Lue, Keh-Chung Wang, Chih-Yuan Lu, Yao-Wen Chang, Yung-Hsiang Chen, Chu-Yung Liu
2015 J jnl
Layer-Aware Program-and-Read Schemes for 3D Stackable Vertical-Gate BE-SONOS NAND Flash Against Cross-Layer Process Variations.
IEEE J. Solid State Circuits
Chun-Hsiung Hung, Meng-Fan Chang, Yih-Shan Yang, Yao-Jen Kuo, Tzu-Neng Lai, Shin-Jang Shen, Jo-Yu Hsu, Shuo-Nan Hung, Hang-Ting Lue, Yen-Hao Shih, Shih-Lin Huang, Ti-Wen Chen, Tzung Shen Chen, Chung Kuang Chen, Chi-Yu Hung, Chih-Yuan Lu
2014 A* conf
On Trading Wear-leveling with Heal-leveling.
DAC
Yu-Ming Chang, Yuan-Hao Chang, Jian-Jia Chen, Tei-Wei Kuo, Hsiang-Pang Li, Hang-Ting Lue
2011 J jnl
State-of-the-art flash memory devices and post-flash emerging memories.
Sci. China Inf. Sci.
Chihyuan Lu, Hang-Ting Lue, Yichou Chen
2002 J jnl
Microwave penetration depth measurement for high T
IEEE Trans. Instrum. Meas.
Hang-Ting Lue, Juh-Tzeng Lue, Tseung-Yuen Tseng