| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2025 | J | jnl |
A reliability framework for NB-IoT devices: Addressing transient faults and silent data corruptions.
Comput. Electr. Eng.
|
| 2025 | J | jnl |
IEEE Trans. Reliab.
|
| 2025 | J | jnl |
CoRR
|
| 2025 | Misc | conf |
CSICC
|
| 2025 | J | jnl |
Sustain. Comput. Informatics Syst.
|
| 2025 | J | jnl |
J. Supercomput.
|
| 2024 | J | jnl |
Future Gener. Comput. Syst.
|
| 2024 | J | jnl |
CoRR
|
| 2024 | J | jnl |
CoRR
|
| 2022 | C | conf |
DSD
|
| 2022 | Misc | conf |
EDCC
|
| 2021 | J | jnl |
IEEE Trans. Emerg. Top. Comput.
|
| 2021 | J | jnl |
Microprocess. Microsystems
|
| 2020 | J | jnl |
Microprocess. Microsystems
|
| 2020 | J | jnl |
Microprocess. Microsystems
|
| 2019 | Misc | conf |
EDCC
|
| 2019 | J | jnl |
Microelectron. J.
|
| 2019 | J | jnl |
IEEE Trans. Parallel Distributed Syst.
|
| 2019 | J | jnl |
J. Circuits Syst. Comput.
|
| 2018 | C | conf |
IOLTS
|
| 2018 | J | jnl |
Microelectron. Reliab.
|
| 2018 | J | jnl |
IEEE Comput. Archit. Lett.
|
| 2018 | C | conf |
DSD
|
| 2018 | J | jnl |
J. Supercomput.
|
| 2018 | C | conf |
DSD
|
| 2017 | — | conf |
DepCoS-RELCOMEX
|
| 2017 | — | conf |
NORCAS
|
| 2017 | J | jnl |
Qual. Reliab. Eng. Int.
|
| 2017 | C | conf |
IOLTS
|
| 2016 | C | conf |
PDP
|
| 2016 | C | conf |
PDP
|
| 2016 | C | conf |
PDP
|
| 2016 | J | jnl |
J. Circuits Syst. Comput.
|
| 2016 | C | conf |
PDP
|
| 2016 | J | jnl |
CoRR
|
| 2016 | C | conf |
PDP
|
| 2016 | — | conf |
ReCoSoC
|
| 2016 | J | jnl |
Microelectron. Reliab.
|
| 2015 | J | jnl |
Microelectron. Reliab.
|
| 2015 | J | jnl |
Microelectron. Reliab.
|
| 2014 | J | jnl |
J. Supercomput.
|
| 2014 | J | jnl |
Microprocess. Microsystems
|
| 2014 | J | jnl |
J. Circuits Syst. Comput.
|
| 2014 | J | jnl |
Microprocess. Microsystems
|
| 2013 | J | jnl |
IEEE Trans. Reliab.
|
| 2013 | C | conf |
PDP
|
| 2013 | J | jnl |
IET Comput. Digit. Tech.
|
| 2013 | J | jnl |
Math. Comput. Model.
|
| 2012 | — | conf |
CSE
|
| 2012 | — | conf |
NORCHIP
|
| 2012 | J | jnl |
Microelectron. Reliab.
|
| 2012 | — | conf |
DFT
|
| 2012 | — | conf |
CSE
|
| 2012 | J | jnl |
Microelectron. J.
|
| 2011 | B | conf |
SAFECOMP
|
| 2011 | J | jnl |
Sci. Iran.
|
| 2011 | — | conf |
EWDC
|
| 2011 | — | conf |
HPCS
|
| 2011 | — | conf |
SIES
|
| 2011 | C | conf |
IOLTS
|
| 2011 | C | conf |
IOLTS
|
| 2011 | J | jnl |
Des. Autom. Embed. Syst.
|
| 2011 | J | jnl |
J. Syst. Archit.
|
| 2011 | — | conf |
ISED
|
| 2011 | J | jnl |
Microelectron. J.
|
| 2011 | J | jnl |
Comput. Electr. Eng.
|
| 2011 | C | conf |
DSD
|
| 2010 | — | conf |
DFT
|
| 2010 | — | conf |
ASP-DAC
|
| 2010 | B | conf |
ARES
|
| 2010 | B | conf |
ARES
|
| 2010 | C | conf |
PDP
|
| 2010 | J | jnl |
Perform. Evaluation
|
| 2010 | J | jnl |
Microelectron. J.
|
| 2010 | — | conf |
PATMOS
|
| 2010 | C | conf |
PRDC
|
| 2010 | J | jnl |
Microelectron. Reliab.
|
| 2009 | — | conf |
CDES
|
| 2009 | — | conf |
ReConFig
|
| 2009 | B | conf |
ARES
|
| 2009 | — | conf |
SoC
|
| 2009 | C | conf |
IOLTS
|
| 2009 | — | conf |
LATW
|
| 2009 | — | conf |
PATMOS
|
| 2007 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2007 | C | conf |
ISCAS
|
| 2007 | C | conf |
ISCAS
|
| 2007 | J | jnl |
Microelectron. Reliab.
|
| 2007 | A | conf |
IPDPS
|
| 2007 | — | conf |
DFT
|
| 2007 | C | conf |
ISCAS
|
| 2007 | — | conf |
ISQED
|
| 2007 | C | conf |
ISCAS
|
| 2006 | J | jnl |
Microelectron. Reliab.
|
| 2006 | J | jnl |
J. Circuits Syst. Comput.
|
| 2005 | J | jnl |
J. Supercomput.
|
| 2005 | — | conf |
ECBS
|
| 2005 | — | conf |
LADC
|
| 2004 | B | conf |
SAFECOMP
|
| 2004 | — | conf |
ESA/VLSI
|
| 2004 | C | conf |
PRDC
|
| 2004 | C | conf |
IOLTS
|
| 2003 | A | conf |
DSN
|
| 2003 | — | conf |
DFT
|
| 2003 | C | conf |
ISPDC
|
| 2003 | — | conf |
FPT
|