| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2022 | J | jnl |
ACM Trans. Design Autom. Electr. Syst.
|
| 2022 | A* | conf |
DAC
|
| 2019 | — | conf |
ACM Great Lakes Symposium on VLSI
|
| 2019 | — | conf |
ACM Great Lakes Symposium on VLSI
|
| 2019 | J | jnl |
IEEE Trans. Circuits Syst. I Regul. Pap.
|
| 2019 | A | conf |
ICCAD
|
| 2018 | J | jnl |
CoRR
|
| 2018 | J | jnl |
ACM Trans. Design Autom. Electr. Syst.
|
| 2018 | — | conf |
ACM Great Lakes Symposium on VLSI
|
| 2016 | — | conf |
SoCC
|
| 2016 | C | conf |
ISCAS
|
| 2016 | C | conf |
ICCD
|
| 2016 | A* | conf |
DAC
|
| 2016 | C | conf |
VLSI-SoC
|
| 2016 | — | conf |
ISQED
|
| 2016 | J | jnl |
Microelectron. Reliab.
|
| 2016 | J | jnl |
Microelectron. Reliab.
|
| 2014 | A | conf |
DATE
|
| 2014 | J | jnl |
Microelectron. J.
|
| 2014 | — | conf |
ACM Great Lakes Symposium on VLSI
|
| 2014 | J | jnl |
IEEE Comput. Archit. Lett.
|
| 2014 | J | jnl |
Microelectron. Reliab.
|
| 2013 | J | jnl |
Microelectron. Reliab.
|
| 2013 | J | jnl |
Integr.
|
| 2012 | — | conf |
ICECS
|
| 2012 | C | conf |
VLSI-SoC
|
| 2012 | — | conf |
ISQED
|
| 2012 | J | jnl |
Microelectron. Reliab.
|
| 2012 | J | jnl |
Microelectron. Reliab.
|
| 2012 | C | conf |
VLSI-SoC
|
| 2011 | J | jnl |
IEICE Electron. Express
|
| 2011 | C | conf |
ICCD
|
| 2011 | — | conf |
ISQED
|
| 2011 | C | conf |
ICCD
|
| 2011 | J | jnl |
Microelectron. J.
|
| 2011 | — | ch. |
Low-Power Variation-Tolerant Design in Nanometer Silicon
|
| 2011 | C | conf |
ICCD
|
| 2010 | — | conf |
SoCC
|
| 2010 | — | conf |
CICC
|
| 2010 | J | jnl |
J. Signal Process. Syst.
|
| 2010 | J | jnl |
ACM Trans. Design Autom. Electr. Syst.
|
| 2010 | — | conf |
ISQED
|
| 2010 | J | jnl |
IEEE Des. Test Comput.
|
| 2010 | — | conf |
Reliability analysis of power gated SRAM under combined effects of NBTI and PBTI in nano-scale CMOS.
ACM Great Lakes Symposium on VLSI
|
| 2010 | — | conf |
SoCC
|
| 2009 | — | conf |
MSE
|
| 2009 | — | conf |
SoCC
|
| 2009 | — | conf |
ISQED
|
| 2009 | C | conf |
ISCAS
|
| 2009 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2009 | — | conf |
ITNG
|
| 2008 | — | conf |
SoCC
|
| 2008 | J | jnl |
IEEE J. Solid State Circuits
|
| 2008 | J | jnl |
J. Electron. Test.
|
| 2008 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2008 | — | conf |
CICC
|
| 2007 | A | conf |
ISLPED
|
| 2007 | C | conf |
ISCAS
|
| 2007 | J | jnl |
Design of a Process Variation Tolerant Self-Repairing SRAM for Yield Enhancement in Nanoscaled CMOS.
IEEE J. Solid State Circuits
|
| 2007 | A | conf |
ICCAD
|
| 2007 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2007 | — | conf |
ISQED
|
| 2006 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2006 | — | conf |
SoCC
|
| 2005 | A | conf |
ITC
|
| 2005 | J | jnl |
IEEE J. Solid State Circuits
|
| 2005 | C | conf |
IOLTS
|
| 2005 | A | conf |
ITC
|
| 2004 | — | conf |
ICASSP (5)
|