| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2006 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2006 | Misc | conf |
VLSI Design
|
| 2006 | A | conf |
DATE
|
| 2006 | — | conf |
ASP-DAC
|
| 2005 | A | conf |
DATE
|
| 2005 | — | conf |
ACM Great Lakes Symposium on VLSI
|
| 2005 | A* | conf |
DAC
|
| 2005 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2005 | — | conf |
ISQED
|
| 2005 | A | conf |
ICCAD
|
| 2005 | Misc | conf |
VLSI Design
|
| 2005 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2005 | — | conf |
ACM Great Lakes Symposium on VLSI
|
| 2005 | — | conf |
Asian Test Symposium
|
| 2005 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2005 | Misc | conf |
Modeling and Testing of SRAM for New Failure Mechanisms Due to Process Variations in Nanoscale CMOS.
VTS
|
| 2005 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2005 | C | conf |
ICCD
|
| 2005 | — | conf |
ISQED
|
| 2005 | — | conf |
ISCAS (3)
|
| 2004 | C | conf |
ICCD
|
| 2004 | J | jnl |
IEEE J. Solid State Circuits
|
| 2004 | — | conf |
ISCAS (2)
|
| 2004 | J | jnl |
IEEE Trans. Circuits Syst. I Regul. Pap.
|
| 2004 | — | conf |
ISCAS (2)
|
| 2004 | — | conf |
CICC
|
| 2004 | — | conf |
DFT
|
| 2004 | A | conf |
ICCAD
|
| 2003 | A | conf |
ISLPED
|
| 2003 | J | jnl |
Proc. IEEE
|
| 2002 | A | conf |
ISLPED
|
| 2002 | J | jnl |
J. Circuits Syst. Comput.
|
| 2001 | — | conf |
ISCAS (4)
|