Hajdin Ceric

15 papers Journal 11Unranked 4
YearRankTypeTitle / Venue / Authors
2025 — conf
Electromigration in Gold: Challenges and Possibilities (Invited).
IRPS
Hajdin Ceric
2025 J jnl
Novel Concept-Oriented Synthetic Data approach for Training Generative AI-Driven Crystal Grain Analysis Using Diffusion Model.
CoRR
Ahmed Sobhi Saleh, Kristof Croes, Hajdin Ceric, Ingrid De Wolf, Houman Zahedmanesh
2023 — conf
Impact of via geometry and line extension on via-electromigration in nano-interconnects.
IRPS
Ahmed Sobhi Saleh, Houman Zahedmanesh, Hajdin Ceric, Ingrid De Wolf, Kris Croes
2022 — conf
Impact of Gold Interconnect Microstructure on Electromigration Failure Time Statistics.
ESSDERC
Hajdin Ceric, Roberto Lacerda de Orio, Siegfried Selberherr
2015 J jnl
Comparison of analytic distribution function models for hot-carrier degradation modeling in nLDMOSFETs.
Microelectron. Reliab.
Prateek Sharma, Stanislav Tyaginov, Yannick Wimmer, Florian Rudolf, Karl Rupp, Hubert Enichlmair, J. H. Park, Hajdin Ceric, Tibor Grasser
2014 J jnl
Electromigration reliability of open TSV structures.
Microelectron. Reliab.
Wolfhard H. Zisser, Hajdin Ceric, Josef Weinbub, Siegfried Selberherr
2013 J jnl
Stress evolution in the metal layers of TSVs with Bosch scallops.
Microelectron. Reliab.
Anderson Pires Singulani, Hajdin Ceric, Siegfried Selberherr
2012 J jnl
Electromigration failure in a copper dual-damascene structure with a through silicon via.
Microelectron. Reliab.
Roberto Lacerda de Orio, Hajdin Ceric, Siegfried Selberherr
2012 J jnl
Interconnect reliability dependence on fast diffusivity paths.
Microelectron. Reliab.
Hajdin Ceric, Roberto Lacerda de Orio, Siegfried Selberherr
2011 J jnl
A compact model for early electromigration failures of copper dual-damascene interconnects.
Microelectron. Reliab.
R. L. de Orio, Hajdin Ceric, Siegfried Selberherr
2011 — conf
A simulator for local anodic oxidation of silicon surfaces.
CCECE
Lado Filipovic, Hajdin Ceric, Johann Cervenka, Siegfried Selberherr
2011 J jnl
An analytical approach for physical modeling of hot-carrier induced degradation.
Microelectron. Reliab.
Stanislav Tyaginov, Ivan A. Starkov, Hubert Enichlmair, Christoph Jungemann, Jong Mun Park, Ehrenfried Seebacher, R. L. de Orio, Hajdin Ceric, Tibor Grasser
2010 J jnl
Interface traps density-of-states as a vital component for hot-carrier degradation modeling.
Microelectron. Reliab.
Stanislav Tyaginov, Ivan A. Starkov, Oliver Triebl, Johann Cervenka, Christoph Jungemann, Sara Carniello, Jong Mun Park, Hubert Enichlmair, Markus Karner, Ch. Kernstock, Ehrenfried Seebacher, Rainer Minixhofer, Hajdin Ceric, Tibor Grasser
2010 J jnl
Physically based models of electromigration: From Black's equation to modern TCAD models.
Microelectron. Reliab.
R. L. de Orio, Hajdin Ceric, Siegfried Selberherr
2002 J jnl
Simulative prediction of the resistance change due to electromigration induced void evolution.
Microelectron. Reliab.
Hajdin Ceric, Siegfried Selberherr