| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2026 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2026 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2025 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2025 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2025 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2025 | — | conf |
EUROCON
|
| 2025 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2025 | J | jnl |
IEEE Internet Things J.
|
| 2025 | J | jnl |
IEEE Access
|
| 2025 | — | conf |
EUROCON
|
| 2024 | C | conf |
IECON
|
| 2024 | C | conf |
IECON
|
| 2024 | C | conf |
IECON
|
| 2024 | J | jnl |
IEEE Access
|
| 2024 | C | conf |
IECON
|
| 2024 | C | conf |
IECON
|
| 2024 | C | conf |
IECON
|
| 2024 | C | conf |
IECON
|
| 2024 | C | conf |
IECON
|
| 2024 | C | conf |
IECON
|
| 2024 | C | conf |
IECON
|
| 2024 | C | conf |
IECON
|
| 2024 | C | conf |
IECON
|
| 2024 | J | jnl |
IEEE Access
|
| 2024 | J | jnl |
Model Predictive Control Method With Reduced Switching States for Single-Stage Buck-Boost Rectifier.
IEEE Trans. Ind. Electron.
|
| 2024 | C | conf |
IECON
|
| 2024 | C | conf |
Optimizing the Charging Process of Electric Vehicles in the Context of Renewable Energy Integration.
IECON
|
| 2024 | J | jnl |
IEEE Trans. Veh. Technol.
|
| 2024 | C | conf |
IECON
|
| 2024 | C | conf |
IECON
|
| 2024 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2024 | C | conf |
IECON
|
| 2024 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2024 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2023 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2023 | — | conf |
ISIE
|
| 2023 | J | jnl |
IEEE Access
|
| 2023 | C | conf |
IECON
|
| 2023 | C | conf |
IECON
|
| 2023 | C | conf |
IECON
|
| 2023 | J | jnl |
IEEE Access
|
| 2023 | C | conf |
IECON
|
| 2023 | J | jnl |
IEEE Access
|
| 2023 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2022 | C | conf |
IECON
|
| 2022 | J | jnl |
IEEE Access
|
| 2022 | C | conf |
IECON
|
| 2022 | J | jnl |
IEEE Access
|
| 2021 | C | conf |
IECON
|
| 2021 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2021 | J | jnl |
IEEE Access
|
| 2021 | J | jnl |
IEEE Access
|
| 2021 | J | jnl |
IEEE Access
|
| 2021 | J | jnl |
IEEE Access
|
| 2021 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2021 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2021 | J | jnl |
IEEE Access
|
| 2021 | J | jnl |
IEEE Access
|
| 2021 | J | jnl |
IEEE Access
|
| 2021 | J | jnl |
IEEE Access
|
| 2021 | J | jnl |
IEEE Access
|
| 2021 | J | jnl |
IEEE Access
|
| 2021 | — | conf |
SSD
|
| 2021 | C | conf |
IECON
|
| 2021 | — | conf |
ISIE
|
| 2021 | C | conf |
IECON
|
| 2021 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2021 | J | jnl |
IEEE Access
|
| 2021 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2021 | — | conf |
SSD
|
| 2021 | J | jnl |
IEEE Access
|
| 2020 | C | conf |
IECON
|
| 2020 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2020 | C | conf |
IECON
|
| 2020 | J | jnl |
IEEE Access
|
| 2020 | — | conf |
IEEE BigData
|
| 2020 | J | jnl |
IEEE Access
|
| 2020 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2020 | — | conf |
IEEE BigData
|
| 2020 | C | conf |
IECON
|
| 2020 | — | conf |
ICIT
|
| 2020 | C | conf |
IECON
|
| 2019 | — | conf |
ISIE
|
| 2019 | C | conf |
IECON
|
| 2019 | — | conf |
IEEE BigData
|
| 2019 | J | jnl |
IEEE Access
|
| 2019 | — | conf |
IINTEC
|
| 2019 | — | conf |
IEEE BigData
|
| 2019 | J | jnl |
IEEE Access
|
| 2019 | — | conf |
ISIE
|
| 2019 | J | jnl |
IEEE Access
|
| 2019 | — | conf |
ICIT
|
| 2018 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2018 | C | conf |
IECON
|
| 2018 | — | conf |
ISIE
|
| 2018 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2018 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2018 | C | conf |
IECON
|
| 2018 | — | conf |
ISIE
|
| 2018 | — | conf |
ICIT
|
| 2018 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2018 | — | conf |
Open-Circuit Fault Diagnosis and Fault- Tolerant Model Predictive Control of SubMultilevel Inverter.
ISIE
|
| 2018 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2018 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2018 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2018 | — | conf |
ICIT
|
| 2018 | J | jnl |
IEEE Trans. Syst. Man Cybern. Syst.
|
| 2018 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2017 | — | conf |
ICIT
|
| 2017 | — | conf |
IEEE BigData
|
| 2017 | C | conf |
IECON
|
| 2017 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2017 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2017 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2017 | — | conf |
ICIT
|
| 2017 | — | conf |
ISIE
|
| 2017 | — | conf |
ISIE
|
| 2017 | C | conf |
IECON
|
| 2017 | — | conf |
ISIE
|
| 2017 | C | conf |
IECON
|
| 2017 | C | conf |
IECON
|
| 2017 | C | conf |
IECON
|
| 2017 | J | jnl |
IEEE Trans. Cybern.
|
| 2017 | J | jnl |
Proc. IEEE
|
| 2017 | — | conf |
ISGT
|
| 2017 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2016 | — | conf |
ICIT
|
| 2016 | C | conf |
IECON
|
| 2016 | J | jnl |
J. Frankl. Inst.
|
| 2016 | C | conf |
IECON
|
| 2016 | C | conf |
IECON
|
| 2016 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2016 | C | conf |
IECON
|
| 2016 | — | conf |
IEEE BigData
|
| 2016 | J | jnl |
Int. J. Circuit Theory Appl.
|
| 2016 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2016 | — | conf |
ICIT
|
| 2016 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2016 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2016 | J | jnl |
J. Control. Decis.
|
| 2016 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2016 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2016 | C | conf |
IECON
|
| 2016 | — | conf |
ICIT
|
| 2016 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2016 | — | conf |
ICIT
|
| 2016 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2016 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2016 | C | conf |
IECON
|
| 2015 | C | conf |
IECON
|
| 2015 | J | jnl |
Int. J. Circuit Theory Appl.
|
| 2015 | C | conf |
IECON
|
| 2015 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2015 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2015 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2015 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2015 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2015 | C | conf |
IECON
|
| 2015 | C | conf |
IECON
|
| 2015 | — | conf |
ICIT
|
| 2015 | C | conf |
IECON
|
| 2015 | — | conf |
ICIT
|
| 2015 | — | conf |
ISIE
|
| 2015 | — | conf |
ICIT
|
| 2015 | J | jnl |
Int. J. Circuit Theory Appl.
|
| 2015 | — | conf |
ICIT
|
| 2014 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2014 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2014 | C | conf |
IECON
|
| 2014 | — | conf |
ISIE
|
| 2014 | — | conf |
ISIE
|
| 2014 | — | conf |
ISIE
|
| 2014 | — | conf |
ISIE
|
| 2014 | C | conf |
IECON
|
| 2014 | — | conf |
ISIE
|
| 2014 | C | conf |
IECON
|
| 2014 | C | conf |
IECON
|
| 2014 | C | conf |
IECON
|
| 2014 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2014 | C | conf |
IECON
|
| 2014 | C | conf |
IECON
|
| 2014 | C | conf |
IECON
|
| 2013 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2013 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2013 | C | conf |
IECON
|
| 2013 | C | conf |
IECON
|
| 2013 | C | conf |
IECON
|
| 2013 | — | conf |
SSD
|
| 2013 | C | conf |
IECON
|
| 2013 | C | conf |
IECON
|
| 2013 | C | conf |
IECON
|
| 2013 | C | conf |
IECON
|
| 2013 | — | conf |
SSD
|
| 2013 | C | conf |
IECON
|
| 2013 | C | conf |
IECON
|
| 2013 | C | conf |
IECON
|
| 2013 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2013 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2013 | — | conf |
SSD
|
| 2012 | — | conf |
ISIE
|
| 2012 | — | conf |
ISIE
|
| 2012 | — | conf |
ISIE
|
| 2012 | C | conf |
IECON
|
| 2012 | C | conf |
IECON
|
| 2012 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2012 | C | conf |
IECON
|
| 2012 | C | conf |
IECON
|
| 2011 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2011 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2011 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2010 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2010 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2010 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2010 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2009 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2004 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2004 | J | jnl |
IEEE Trans. Ind. Electron.
|