| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2025 | — | conf |
ISSCC
|
| 2025 | J | jnl |
Microelectron. J.
|
| 2025 | J | jnl |
IEEE Access
|
| 2024 | J | jnl |
IEICE Electron. Express
|
| 2024 | J | jnl |
IEICE Electron. Express
|
| 2023 | J | jnl |
IEEE Trans. Circuits Syst. II Express Briefs
|
| 2023 | J | jnl |
IEICE Electron. Express
|
| 2022 | J | jnl |
IEEE J. Solid State Circuits
|
| 2022 | J | jnl |
Sensors
|
| 2022 | J | jnl |
Remote. Sens.
|
| 2022 | J | jnl |
IEICE Electron. Express
|
| 2022 | J | jnl |
IEICE Electron. Express
|
| 2022 | J | jnl |
IEICE Electron. Express
|
| 2022 | J | jnl |
IEEE Trans. Circuits Syst. II Express Briefs
|
| 2021 | J | jnl |
IEEE Trans. Circuits Syst. II Express Briefs
|
| 2021 | J | jnl |
IEICE Electron. Express
|
| 2021 | J | jnl |
IEICE Electron. Express
|
| 2021 | J | jnl |
IEICE Electron. Express
|
| 2020 | J | jnl |
J. Circuits Syst. Comput.
|
| 2018 | J | jnl |
IEEE Access
|
| 2018 | J | jnl |
IEICE Trans. Commun.
|
| 2018 | J | jnl |
IEICE Electron. Express
|
| 2017 | J | jnl |
IEICE Electron. Express
|
| 2017 | J | jnl |
J. Electron. Test.
|
| 2016 | J | jnl |
IEEE Trans. Circuits Syst. II Express Briefs
|
| 2016 | J | jnl |
J. Electron. Test.
|
| 2016 | J | jnl |
IEICE Electron. Express
|
| 2016 | J | jnl |
J. Electron. Test.
|
| 2015 | J | jnl |
Proc. IEEE
|
| 2015 | — | conf |
ASICON
|
| 2014 | J | jnl |
IEEE Trans. Circuits Syst. I Regul. Pap.
|
| 2013 | C | conf |
ISCAS
|
| 2013 | J | jnl |
IEEE Trans. Circuits Syst. I Regul. Pap.
|
| 2013 | — | conf |
ASP-DAC
|
| 2011 | — | conf |
A-SSCC
|
| 2011 | J | jnl |
IEICE Trans. Electron.
|
| 2011 | C | conf |
ISCAS
|
| 2011 | — | conf |
ASICON
|
| 2011 | — | conf |
ASICON
|
| 2010 | C | conf |
ISCAS
|