| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2025 | J | jnl |
Frontiers Inf. Technol. Electron. Eng.
|
| 2024 | J | jnl |
Expert Syst. Appl.
|
| 2023 | J | jnl |
J. Electron. Test.
|
| 2023 | J | jnl |
Frontiers Inf. Technol. Electron. Eng.
|
| 2023 | J | jnl |
Appl. Soft Comput.
|
| 2023 | J | jnl |
J. Real Time Image Process.
|
| 2023 | J | jnl |
CoRR
|
| 2022 | J | jnl |
J. Electron. Test.
|
| 2021 | J | jnl |
Expert Syst. Appl.
|
| 2021 | J | jnl |
Circuits Syst. Signal Process.
|
| 2020 | J | jnl |
Expert Syst. Appl.
|
| 2019 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2017 | J | jnl |
J. Electron. Test.
|
| 2012 | J | jnl |
J. Circuits Syst. Comput.
|
| 2012 | — | conf |
ISQED
|
| 2011 | C | conf |
ICSEng
|
| 2010 | — | conf |
BICoB
|