Hadi Jahanirad

17 papers C 1Journal 14Unranked 2
YearRankTypeTitle / Venue / Authors
2025 J jnl
Effective fault detection in M3D ICs: a cluster-based BIST for enhanced inter-layer via fault coverage.
Frontiers Inf. Technol. Electron. Eng.
Hadi Jahanirad, Ahmad Menbari, Hemin Rahimi, Daniel Ziener
2024 J jnl
Deep transfer learning approach for digital circuits vulnerability analysis.
Expert Syst. Appl.
Mohammad Mehdi Rahimifar, Hadi Jahanirad, Mohammad Fathi
2023 J jnl
A Tunable Concurrent BIST Design Based on Reconfigurable LFSR.
J. Electron. Test.
Ahmad Menbari, Hadi Jahanirad
2023 J jnl
Dynamic power-gating for leakage power reduction in FPGAs.
Frontiers Inf. Technol. Electron. Eng.
Hadi Jahanirad
2023 J jnl
FPGA-based implementation of deep neural network using stochastic computing.
Appl. Soft Comput.
Maedeh Nobari, Hadi Jahanirad
2023 J jnl
Hardware acceleration of YOLOv7-tiny using high-level synthesis tools.
J. Real Time Image Process.
Adib Hosseiny, Hadi Jahanirad
2023 J jnl
Implementation of Digital Circuits on Three-Dimensional FPGAs Using Simulated Annealing.
CoRR
Hemin Rahimi, Hadi Jahanirad
2022 J jnl
A Low-cost BIST Design Supporting Offline and Online Tests.
J. Electron. Test.
Ahmad Menbari, Hadi Jahanirad
2021 J jnl
An evolutionary approach to implement logic circuits on three dimensional FPGAs.
Expert Syst. Appl.
Hemin Rahimi, Hadi Jahanirad
2021 J jnl
Reliability Estimation of Logic Circuits at the Transistor Level.
Circuits Syst. Signal Process.
Hadi Jahanirad
2020 J jnl
NN-SSTA: A deep neural network approach for statistical static timing analysis.
Expert Syst. Appl.
M. Amin Savari, Hadi Jahanirad
2019 J jnl
CC-SPRA: Correlation Coefficients Approach for Signal Probability-Based Reliability Analysis.
IEEE Trans. Very Large Scale Integr. Syst.
Hadi Jahanirad
2017 J jnl
Reliability Model for Multiple-Error Protected Static Memories.
J. Electron. Test.
Hadi Jahanirad
2012 J jnl
Sequential Logic Circuits Reliability Analysis.
J. Circuits Syst. Comput.
Hadi Jahanirad, Karim Mohammadi
2012 — conf
Single fault reliability analysis in FPGA implemented circuits.
ISQED
Hadi Jahanirad, Karim Mohammadi, Pejman Attarsharghi
2011 C conf
Fast Reliability Analysis Method for Sequential Logic Circuits.
ICSEng
Karim Mohammadi, Hadi Jahanirad, Pejman Attarsharghi
2010 — conf
A GA based Approach for Image Shadow Removal using PCNN.
BICoB
Gholam Ali Rezaei Rad, Hadi Jahanirad