| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2025 | J | jnl |
IEEE Access
|
| 2022 | — | conf |
ICACT
|
| 2021 | J | jnl |
IEEE Trans. Commun.
|
| 2020 | J | jnl |
IEEE Trans. Wirel. Commun.
|
| 2020 | B | conf |
GLOBECOM
|
| 2019 | J | jnl |
IEEE Wirel. Commun. Lett.
|
| 2019 | J | jnl |
CoRR
|
| 2019 | — | conf |
CAMSAP
|
| 2019 | J | jnl |
Reliability Analysis of Large Intelligent Surfaces (LISs): Rate Distribution and Outage Probability.
CoRR
|
| 2019 | J | jnl |
Reliability Analysis of Large Intelligent Surfaces (LISs): Rate Distribution and Outage Probability.
IEEE Wirel. Commun. Lett.
|
| 2019 | B | conf |
GLOBECOM
|
| 2018 | J | jnl |
CoRR
|
| 2016 | — | conf |
APCCAS
|
| 2010 | J | jnl |
IEEE Trans. Consumer Electron.
|
| 2010 | J | jnl |
IEEE Trans. Consumer Electron.
|
| 2009 | J | jnl |
IEICE Electron. Express
|