Gurgen Harutyunyan

48 papers A 16B 3C 3Misc 9Journal 4Unranked 13

Year	Rank	Type	Title / Venue / Authors
2025	B	`conf`	Analysis and Mitigation of Radiation Effects in SRAM-based Register Files. ETS Zhe Zhang, Surendra Hemaram, Mahta Mayahinia, Christian Weis, Norbert Wehn, Mehdi B. Tahoori, Sani R. Nassif, Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian
2025	B	`conf`	European Test Symposium Teams: an Anniversary Snapshot. ETS Maksim Jenihhin, Jaan Raik, Artur Jutman, Natalia Cherezova, Raimund Ubar, Liviu Miclea, Szilárd Enyedi, I. Stefan, Ovidiu Stan, Cosmina Corches, Z. Peng, Petru Eles, Rolf Drechsler, S. Eggersglüß, Görschwin Fey, Andreas Glowatz, Daniel Tille, Georges G. E. Gielen, Anthony Coyette, Wim Dobbelaere, Ronny Vanhooren, P.-Y. Chuang, Erik Jan Marinissen, Giorgio Di Natale, M. Barragan, Paolo Maistri, S. Mir, Vatajelu I. Vatajelu, Paolo Bernardi, S. Di Carlo, Paolo Prinetto, Matteo Sonza Reorda, Massimo Violante, Haralampos-G. Stratigopoulos, M. K. Michael, Stelios Neophytou, Stavros Hadjitheophanous, Kyriakos Christou, M. Skitsas, Alberto Bosio, Bastien Deveautour, P. Girard, Marcello Traiola, Arnaud Virazel, F. Fernandes Dos Santos, Angeliki Kritikakou, Gioele Casagranda, Marzio Vallero, Flavio Vella, Paolo Rech, Letícia Maria Bolzani Poehls, Milos Krstic, Marko S. Andjelkovic, F. Vargas, Grigor Tshagharyan, Gurgen Harutyunyan, Valery A. Vardanian, Samvel K. Shoukourian, Yervant Zorian, Jennifer Dworak, Kundan Nepal, Theodore W. Manikas, Mottaqiallah Taouil, Moritz Fieback, Anteneh Gebregiorgis, Rajendra Bishnoi, Said Hamdioui, Abhijit Chatterjee, A. Saha, Suhasini Komarraju, K. Ma, Chandramouli N. Amarnath, Mehdi Baradaran Tahoori, Mahta Mayahinia, Maryam Rajabalipanah, Katayoon Basharkhah, N. Nosrati, Zahra Jahanpeima, Zain Navabi, Hans-Joachim Wunderlich, Sybille Hellebrand
2025	A	`conf`	Leveraging UCIe Interface for Silicon Health & Reliabiilty of Chiplets in a 3D Stack. ITC Sandeep Kumar Goel, Ankita Patidar, Stanley John, Frank Lee, Min-Jer Wang, Daniel F. J. Yang, Yervant Zorian, Manish Arora, Firooz Massoudi, Shaan Awasthi, Stelios Balalis, Velmurugan Pathervellaichamy, Bharath Shankaranarayanan, Narasimhalu Raju, Gurgen Harutyunyan, Grigor Tshagharyan, Vahagn Hovakimyan, Arman Karagyozyan, Alvina Manucharyan
2024	Misc	`conf`	Addressing the Combined Effect of Transistor and Interconnect Aging in SRAM towards Silicon Lifecycle Management. VTS Zhe Zhang, Mahta Mayahinia, Christian Weis, Norbert Wehn, Mehdi B. Tahoori, Sani R. Nassif, Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian
2024	C	`conf`	On-Chip Sensor to Monitor Aging Evolution in FinFET-Based Memories. IOLTS Fabian Vargas, Vache Galstyan, Gurgen Harutyunyan, Yervant Zorian
2024	J	`jnl`	Testing for Electromigration in Sub-5-nm FinFET Memories. IEEE Des. Test Mahta Mayahinia, Mehdi Baradaran Tahoori, Grigor Tshagharyan, Karen Amirkhanyan, Artur Ghukasyan, Gurgen Harutyunyan, Yervant Zorian
2024	A	`conf`	Testing for aging in advanced SRAM: From front end of the line transistors to back end of the line interconnects. ITC Zhe Zhang, Mahta Mayahinia, Christian Weis, Norbert Wehn, Mehdi B. Tahoori, Sani R. Nassif, Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian
2023	Misc	`conf`	An Efficient External Memory Test Solution: Case Study for HPC Application. VTS Keqing Ouyang, Minqiang Peng, Yunnong Zhu, Kang Qi, Grigor Tshagharyan, Arun Kumar, Gurgen Harutyunyan, Isaac Wang
2023	B	`conf`	On-chip Electromigration Sensor for Silicon Lifecycle Management of Nanoscale VLSI. ETS Mahta Mayahinia, Mehdi Baradaran Tahoori, Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian
2023	Misc	`conf`	Overcoming Embedded Memory Test & Repair Challenges in the Gate-All-Around Era. VTS Artur Ghukasyan, Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian
2023	A	`conf`	SLM Subsystem for Automotive SoC: Case Study on Path Margin Monitor. ITC Kranthi Kandula, Ramalingam Kolisetti, Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian
2023	A	`conf`	Utilizing ECC Analytics to Improve Memory Lifecycle Management. ITC Costas Argyrides, Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian
2022	A	`conf`	A Novel Protection Technique for Embedded Memories with Optimized PPA. ITC Costas Argyrides, Vilas Sridharan, Hayk Danoyan, Gurgen Harutyunyan, Yervant Zorian
2022	A	`conf`	An Efficient Test Strategy for Detection of Electromigration Impact in Advanced FinFET Memories. ITC Mahta Mayahinia, Mehdi B. Tahoori, Gurgen Harutyunyan, Grigor Tshagharyan, Karen Amirkhanyan
2022	Misc	`conf`	Innovative Practices Track: What's Next for Automotive: Where and How to Improve Field Test and Enhance SoC Safety. VTS Minqiang Peng, Youfa Wu, Jialiang Li, Alex Yu, Grigor Tshagharyan, Costas Argyrides, Vilas Sridharan, Gurgen Harutyunyan, Yervant Zorian, Nilanjan Mukherjee
2020	A	`conf`	Die-to-Die Testing and ECC Error Mitigation in Automotive and Industrial Safety Applications. ITC Gabriele Boschi, Elisa Spano, Hayk T. Grigoryan, Arun Kumar, Gurgen Harutyunyan
2020	J	`jnl`	Memory Physical Aware Multi-Level Fault Diagnosis Flow. IEEE Trans. Emerg. Top. Comput. Gurgen Harutyunyan, Suren Martirosyan, Samvel K. Shoukourian, Yervant Zorian
2020	A	`conf`	Test and Diagnosis Solution for Functional Safety. ITC M. Casarsa, Gurgen Harutyunyan, Yervant Zorian
2019	J	`jnl`	Fault Awareness for Memory BIST Architecture Shaped by Multidimensional Prediction Mechanism. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Gurgen Harutyunyan, Samvel K. Shoukourian, Yervant Zorian
2019	Misc	`conf`	Innovative Practices on In-System Test and Reliability of Memories. VTS S. Bandyopadhyay, J. Mekkoth, Marc Hutner, Hayk T. Grigoryan, Arun Kumar, Samvel K. Shoukourian, Grigor Tshagharyan, Yervant Zorian, Gabriele Boschi, Duccio Lazzarotti, Donato Luongo, Hanna Shaheen, Gurgen Harutyunyan
2019	A	`conf`	Memory FIT Rate Mitigation Technique for Automotive SoCs. ITC Gabriele Boschi, Donato Luongo, Duccio Lazzarotti, Hanna Shaheen, Hayk T. Grigoryan, Gurgen Harutyunyan, Samvel K. Shoukourian, Yervant Zorian
2018	A	`conf`	Advanced ECC-Based FIT Rate Mitigation Technique for Automotive SoCs. ITC Hayk T. Grigoryan, Samvel K. Shoukourian, Gurgen Harutyunyan, Yervant Zorian, Costas Argyrides
2018	A	`conf`	Advanced Uniformed Test Approach For Automotive SoCs. ITC Tal Kogan, Yehonatan Abotbol, Gabriele Boschi, Gurgen Harutyunyan, N. Martirosyan, Yervant Zorian
2018	A	`conf`	Case Study and Advanced Functional Safety Solution for Automotive SoCs. ITC M. Casarsa, Gurgen Harutyunyan
2018	A	`conf`	Defect injection, Fault Modeling and Test Algorithm Generation Methodology for STT-MRAM. ITC Sarath Mohanachandran Nair, Rajendra Bishnoi, Mehdi Baradaran Tahoori, Grigor Tshagharyan, Hayk T. Grigoryan, Gurgen Harutyunyan, Yervant Zorian
2018	Misc	`conf`	Innovative practices on memory test practice. VTS M. Casarsa, Gurgen Harutyunyan, Kaitlyn Chen, Ramesh Sharma, Giri Podichetty, Martin Keim, Sreejit Chakravarty, Ramesh C. Tekumalla
2018	A	`conf`	Modeling and Testing of Aging Faults in FinFET Memories for Automotive Applications. ITC Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian, Anteneh Gebregiorgis, Mohammad Saber Golanbari, Rajendra Bishnoi, Mehdi Baradaran Tahoori
2017	C	`conf`	Advanced ECC solution for automotive SoCs. IOLTS Hanna Shaheen, Gabriele Boschi, Gurgen Harutyunyan, Yervant Zorian
2017	A	`conf`	Advanced functional safety mechanisms for embedded memories and IPs in automotive SoCs. ITC Tal Kogan, Yehonatan Abotbol, Gabriele Boschi, Gurgen Harutyunyan, I. Kroul, Hanna Shaheen, Yervant Zorian
2017	A	`conf`	An effective functional safety solution for automotive systems-on-chip. ITC Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian
2017	—	`conf`	An efficient testing methodology for embedded flash memories. EWDTS Suren Martirosyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Yervant Zorian
2017	—	`conf`	Automated flow for test pattern creation for IPs in SoC. EWDTS D. Sargsyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Yervant Zorian
2017	—	`conf`	Experimental study on Hamming and Hsiao codes in the context of embedded applications. EWDTS Grigor Tshagharyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Yervant Zorian
2016	—	`conf`	Extending fault periodicity table for testing external memory faults. EWDTS Gurgen Harutyunyan
2016	—	`conf`	Securing test infrastructure of system-on-chips. EWDTS Grigor Tshagharyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Yervant Zorian
2015	—	`conf`	A power based memory BIST grouping methodology. EWDTS L. Martirosyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Yervant Zorian
2015	Misc	`conf`	Impact of parameter variations on FinFET faults. VTS Gurgen Harutyunyan, Grigor Tshagharyan, Yervant Zorian
2015	—	`conf`	Overview study on fault modeling and test methodology development for FinFET-based memories. EWDTS Grigor Tshagharyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Yervant Zorian
2014	—	`conf`	Extending fault periodicity table for testing faults in memories under 20nm. EWDTS Gurgen Harutyunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian
2014	Misc	`conf`	Fault modeling and test algorithm creation strategy for FinFET-based memories. VTS Gurgen Harutyunyan, Grigor Tshagharyan, Valery A. Vardanian, Yervant Zorian
2013	Misc	`conf`	An effective solution for building memory BIST infrastructure based on fault periodicity. VTS Gurgen Harutyunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian
2013	—	`conf`	An efficient fault diagnosis and localization algorithm for Successive-Approximation Analog to Digital Converters. EWDTS T. Melkumyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian
2013	—	`conf`	Application of defect injection flow for fault validation in memories. EWDTS K. Amirkhanyan, A. Davtyan, Gurgen Harutyunyan, T. Melkumyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian
2013	—	`conf`	Impact of process variations on read failures in SRAMs. EWDTS Gurgen Harutyunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian
2013	C	`conf`	Integrating embedded test infrastructure in SRAM cores to detect aging. IOLTS W. Prates, Letícia Maria Veiras Bolzani, Gurgen Harutyunyan, A. Davtyan, Fabian Vargas, Yervant Zorian
2012	J	`jnl`	A New Method for March Test Algorithm Generation and Its Application for Fault Detection in RAMs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Gurgen Harutyunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian
2011	—	`conf`	A Robust Solution for Embedded Memory Test and Repair. Asian Test Symposium K. Darbinyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian
2010	—	`conf`	An efficient March test for detection of all two-operation dynamic faults from subclass Sav. EWDTS H. Avetisyan, Gurgen Harutyunyan, Valery A. Vardanian, Yervant Zorian