Guilherme Cardoso Medeiros

27 papers A 2B 6C 1Misc 1Journal 9Unranked 8

Year	Rank	Type	Title / Venue / Authors
2022	J	`jnl`	Defects, Fault Modeling, and Test Development Framework for RRAMs. ACM J. Emerg. Technol. Comput. Syst. Moritz Fieback, Guilherme Cardoso Medeiros, Lizhou Wu, Hassen Aziza, Rajendra Bishnoi, Mottaqiallah Taouil, Said Hamdioui
2022	B	`conf`	Hierarchical Memory Diagnosis. ETS Guilherme Cardoso Medeiros, Moritz Fieback, Anteneh Gebregiorgis, Mottaqiallah Taouil, Letícia Maria Veiras Bolzani, Said Hamdioui
2022	B	`conf`	PVT Analysis for RRAM and STT-MRAM-based Logic Computation-in-Memory. ETS Moritz Fieback, Christopher Münch, Anteneh Gebregiorgis, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Said Hamdioui, Mehdi B. Tahoori
2021	J	`jnl`	Defect and Fault Modeling Framework for STT-MRAM Testing. IEEE Trans. Emerg. Top. Comput. Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Guilherme Cardoso Medeiros, Moritz Fieback, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui
2021	B	`conf`	Detecting Random Read Faults to Reduce Test Escapes in FinFET SRAMs. ETS Guilherme Cardoso Medeiros, Moritz Fieback, Anteneh Gebregiorgis, Mottaqiallah Taouil, Leticia Bolzani Poehls, Said Hamdioui
2021	J	`jnl`	Evaluation of Single Event Upset Susceptibility of FinFET-based SRAMs with Weak Resistive Defects. J. Electron. Test. Thiago Copetti, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Said Hamdioui, Letícia Maria Bolzani Poehls, Tiago Roberto Balen
2021	J	`jnl`	Hard-to-Detect Fault Analysis in FinFET SRAMs. IEEE Trans. Very Large Scale Integr. Syst. Guilherme Cardoso Medeiros, Moritz Fieback, Lizhou Wu, Mottaqiallah Taouil, Letícia Maria Bolzani Poehls, Said Hamdioui
2021	—	`conf`	Improving the Detection of Undefined State Faults in FinFET SRAMs. DTIS Guilherme Cardoso Medeiros, Moritz Fieback, Thiago Santos Copetti, Anteneh Gebregiorgis, Mottaqiallah Taouil, Leticia B. Poehls, Said Hamdioui
2021	B	`conf`	Intermittent Undefined State Fault in RRAMs. ETS Moritz Fieback, Guilherme Cardoso Medeiros, Anteneh Gebregiorgis, Hassen Aziza, Mottaqiallah Taouil, Said Hamdioui
2021	—	`conf`	Modeling Soft-Error Reliability Under Variability. DFT Aneesh Balakrishnan, Guilherme Cardoso Medeiros, Cemil Cem Gürsoy, Said Hamdioui, Maksim Jenihhin, Dan Alexandrescu
2020	A	`conf`	A DFT Scheme to Improve Coverage of Hard-to-Detect Faults in FinFET SRAMs. DATE Guilherme Cardoso Medeiros, Cemil Cem Gürsoy, Lizhou Wu, Moritz Fieback, Maksim Jenihhin, Mottaqiallah Taouil, Said Hamdioui
2020	—	`conf`	Evaluating the Impact of Ionizing Particles on FinFET -based SRAMs with Weak Resistive Defects. LATS Thiago Copetti, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Said Hamdioui, Leticia Bolzani Poehls, Tiago R. Balen
2019	B	`conf`	DFT Scheme for Hard-to-Detect Faults in FinFET SRAMs. ETS Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Moritz Fieback, Leticia Bolzani Poehls, Said Hamdioui
2019	A	`conf`	Device-Aware Test: A New Test Approach Towards DPPB Level. ITC Moritz Fieback, Lizhou Wu, Guilherme Cardoso Medeiros, Hassen Aziza, Siddharth Rao, Erik Jan Marinissen, Mottaqiallah Taouil, Said Hamdioui
2019	J	`jnl`	Evaluating the Impact of Temperature on Dynamic Fault Behaviour of FinFET-Based SRAMs with Resistive Defects. J. Electron. Test. Guilherme Cardoso Medeiros, E. Brum, Leticia Bolzani Poehls, Thiago Copetti, Tiago R. Balen
2019	B	`conf`	Pinhole Defect Characterization and Fault Modeling for STT-MRAM Testing. ETS Lizhou Wu, Siddharth Rao, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Erik Jan Marinissen, Farrukh Yasin, Sebastien Couet, Said Hamdioui, Gouri Sankar Kar
2018	J	`jnl`	A defect-oriented test approach using on-Chip current sensors for resistive defects in FinFET SRAMs. Microelectron. Reliab. Guilherme Cardoso Medeiros, Letícia Maria Veiras Bolzani, Mottaqiallah Taouil, Fabian Vargas, Said Hamdioui
2018	—	`conf`	A hardware-based approach for SEU monitoring in SRAMs with weak resistive defects. LATS George Redivo Pinto, Guilherme Cardoso Medeiros, Fabian Vargas, Leticia Bolzani Poehls
2018	—	`conf`	Influence of temperature on dynamic fault behavior due to resistive defects in FinFET-based SRAMs. LATS Guilherme Cardoso Medeiros, E. Brum, Leticia Bolzani Poehls, Thiago Copetti, Tiago R. Balen
2017	J	`jnl`	Analysing NBTI Impact on SRAMs with Resistive Defects. J. Electron. Test. M. Tulio Martins, Guilherme Cardoso Medeiros, Thiago Copetti, Fabian Vargas, Marcus Pohls
2017	C	`conf`	Analyzing the behavior of FinFET SRAMs with resistive defects. VLSI-SoC Thiago Santos Copetti, Tiago R. Balen, Guilherme Cardoso Medeiros, Letícia Maria Bolzani Poehls
2017	—	`conf`	Evaluating the Impact of Resistive Defects on FinFET-Based SRAMs. VLSI-SoC (Selected Papers) Thiago Santos Copetti, Guilherme Cardoso Medeiros, Letícia Maria Bolzani Poehls, Tiago R. Balen
2016	—	`conf`	Analyzing NBTI impact on SRAMs with resistive-open defects. LATS M. Tulio Martins, Guilherme Cardoso Medeiros, Thiago Copetti, Fabian Vargas, Letícia Maria Bolzani Poehls
2016	Misc	`conf`	Analyzing the Impact of SEUs on SRAMs with Resistive-Bridge Defects. VLSID Guilherme Cardoso Medeiros, Letícia Maria Bolzani Pöhls, Fabian Vargas
2016	J	`jnl`	Identification and Rejuvenation of NBTI-Critical Logic Paths in Nanoscale Circuits. J. Electron. Test. Maksim Jenihhin, Giovanni Squillero, Thiago Santos Copetti, Valentin Tihhomirov, Sergei Kostin, Marco Gaudesi, Fabian Vargas, Jaan Raik, Matteo Sonza Reorda, Leticia Bolzani Poehls, Raimund Ubar, Guilherme Cardoso Medeiros
2016	J	`jnl`	NBTI-Aware Design of Integrated Circuits: A Hardware-Based Approach for Increasing Circuits' Life Time. J. Electron. Test. Thiago Copetti, Guilherme Cardoso Medeiros, Leticia Bolzani Poehls, Fabian Vargas
2015	—	`conf`	NBTI-aware design of integrated circuits: a hardware-based approach. LATS Thiago Copetti, Guilherme Cardoso Medeiros, Letícia Maria Bolzani Poehls, Fabian Vargas