Guido Gronthoud

25 papers A 9B 3Misc 4Journal 6Unranked 3
YearRankTypeTitle / Venue / Authors
2012 J jnl
ADC Multi-Site Test Based on a Pre-test with Digital Input Stimulus.
J. Electron. Test.
Xiaoqin Sheng, Hans G. Kerkhoff, Amir Zjajo, Guido Gronthoud
2009 B conf
Algorithms for ADC Multi-site Test with Digital Input Stimulus.
ETS
Xiaoqin Sheng, Hans G. Kerkhoff, Amir Zjajo, Guido Gronthoud
2008 B conf
Analog Test Bus Infrastructure for RF/AMS Modules in Core-Based Design.
ETS
Vladimir A. Zivkovic, Frank van der Heyden, Guido Gronthoud, Frans G. M. de Jong
2007 J jnl
Extending gate-level diagnosis tools to CMOS intra-gate faults.
IET Comput. Digit. Tech.
Xinyue Fan, Will R. Moore, Camelia Hora, Guido Gronthoud
2007 J jnl
Memory Testing Under Different Stress Conditions: An Industrial Evaluation
CoRR
Ananta K. Majhi, Mohamed Azimane, Guido Gronthoud, Maurice Lousberg, Stefan Eichenberger, Fred Bowen
2007 J jnl
Modeling Power Supply Noise in Delay Testing.
IEEE Des. Test Comput.
Jing Wang, Duncan M. Hank Walker, Xiang Lu, Ananta K. Majhi, Bram Kruseman, Guido Gronthoud, Luis Elvira Villagra, Paul J. A. M. van de Wiel, Stefan Eichenberger
2007 Misc conf
On Performance Testing with Path Delay Patterns.
VTS
Bram Kruseman, Ananta K. Majhi, Guido Gronthoud
2007 A conf
Re-configuration of sub-blocks for effective application of time domain tests.
DATE
Jens Anders, Shaji Krishnan, Guido Gronthoud
2006 Misc conf
A Gate-Level Method for Transistor-Level Bridging Fault Diagnosis.
VTS
Xinyue Fan, Will R. Moore, Camelia Hora, Mario Konijnenburg, Guido Gronthoud
2006 A conf
Power Supply Noise in Delay Testing.
ITC
Jing Wang, D. M. H. Walker, Ananta K. Majhi, Bram Kruseman, Guido Gronthoud, Luis Elvira Villagra, Paul van de Wiel, Stefan Eichenberger
2006 J jnl
Structural Fault Modeling and Fault Detection Through Neyman-Pearson Decision Criteria for Analog Integrated Circuits.
J. Electron. Test.
Amir Zjajo, José Pineda de Gyvez, Guido Gronthoud
2005 Misc conf
A New Algorithm for Dynamic Faults Detection in RAMs.
VTS
Mohamed Azimane, Ananta K. Majhi, Guido Gronthoud, Maurice Lousberg
2005 A conf
A novel stuck-at based method for transistor stuck-open fault diagnosis.
ITC
Xinyue Fan, Will R. Moore, Camelia Hora, Guido Gronthoud
2005 A conf
Functional vs. multi-VDD testing of RF circuits.
ITC
Estella Silva, José Pineda de Gyvez, Guido Gronthoud
2005 A conf
Memory Testing Under Different Stress Conditions: An Industrial Evaluation.
DATE
Ananta K. Majhi, Mohamed Azimane, Guido Gronthoud, Maurice Lousberg, Stefan Eichenberger, Fred Bowen
2005 — conf
Memory testing improvements through different stress conditions.
ESSCIRC
Ananta K. Majhi, Mohamed Azimane, Guido Gronthoud, Maurice Lousberg, Stefan Eichenberger, Fred Bowen
2005 J jnl
Multi-VDD Testing for Analog Circuits.
J. Electron. Test.
José Pineda de Gyvez, Guido Gronthoud, Rashid Amine
2005 B conf
Stuck-open fault diagnosis with stuck-at model.
ETS
Xinyue Fan, Will R. Moore, Camelia Hora, Guido Gronthoud
2004 A conf
On Hazard-free Patterns for Fine-delay Fault Testing.
ITC
Bram Kruseman, Ananta K. Majhi, Guido Gronthoud, Stefan Eichenberger
2004 A conf
Power Supply Ramping for Quasi-static Testing of PLLs.
ITC
José Pineda de Gyvez, Guido Gronthoud, Cristiano Cenci, Martin Posch, Thomas Burger, Manfred Koller
2003 Misc conf
Improving Diagnostic Resolution of Delay Faults using Path Delay Fault Model.
VTS
Ananta K. Majhi, Guido Gronthoud, Camelia Hora, Maurice Lousberg, Pop Valer, Stefan Eichenberger
2003 — conf
Process-variability aware delay fault testing of ΔV
ETW
Daniel Arumí-Delgado, Rosa Rodríguez-Montañés, José Pineda de Gyvez, Guido Gronthoud
2003 A conf
VDD Ramp Testing for RF Circuits.
ITC
José Pineda de Gyvez, Guido Gronthoud, Rashid Amine
2001 — conf
Reducing analogue fault-simulation time by using high-level modelling in dotss for an industrial design.
ETW
Liquan Fang, Guido Gronthoud, Hans G. Kerkhoff
2000 A conf
Delay-fault testing and defects in deep sub-micron ICs-does critical resistance really mean anything?
ITC
Will R. Moore, Guido Gronthoud, Keith Baker, Maurice Lousberg