| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
Eng. Appl. Artif. Intell.
|
| 2026 | J | jnl |
IEEE Trans. Netw. Sci. Eng.
|
| 2025 | J | jnl |
CoRR
|
| 2025 | J | jnl |
CoRR
|
| 2024 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2024 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2024 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2023 | J | jnl |
A Nonlinearity-Sensitive Approach for Early Damage Detection Using NOFRFs and the Hybrid-LSTM Model.
IEEE Trans. Instrum. Meas.
|
| 2023 | J | jnl |
J. Frankl. Inst.
|
| 2023 | — | conf |
SENSORS
|
| 2023 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2023 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2022 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2022 | J | jnl |
J. Comput. Phys.
|
| 2022 | J | jnl |
IEEE Instrum. Meas. Mag.
|
| 2021 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2020 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2018 | J | jnl |
Int. J. Syst. Sci.
|
| 2018 | J | jnl |
Sensors
|
| 2017 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2017 | J | jnl |
Entropy
|
| 2016 | — | conf |
ICIRA (2)
|
| 2016 | J | jnl |
Entropy
|
| 2015 | J | jnl |
J. Frankl. Inst.
|
| 2015 | J | jnl |
IEEE Signal Process. Lett.
|
| 2015 | J | jnl |
Sensors
|
| 2014 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2014 | J | jnl |
IEEE Trans. Signal Process.
|
| 2014 | J | jnl |
Sensors
|
| 2014 | J | jnl |
Microelectron. Reliab.
|
| 2013 | J | jnl |
IEEE Trans. Reliab.
|
| 2013 | J | jnl |
Expert Syst. Appl.
|
| 2013 | J | jnl |
Sensors
|
| 2013 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2012 | — | conf |
ICIRA (1)
|
| 2012 | J | jnl |
Sensors
|
| 2012 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2011 | J | jnl |
Expert Syst. Appl.
|
| 2011 | — | conf |
ICIRA (1)
|
| 2011 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2011 | J | jnl |
Circuits Syst. Signal Process.
|
| 2011 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2010 | J | jnl |
Sensors
|
| 2010 | J | jnl |
IEEE Trans Autom. Sci. Eng.
|
| 2010 | — | conf |
BIOSIGNALS
|
| 2010 | J | jnl |
IEEE Trans. Reliab.
|
| 2009 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2009 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2009 | J | jnl |
Microelectron. Reliab.
|
| 2009 | — | conf |
AICI
|
| 2009 | — | conf |
SIGMAP
|
| 2009 | J | jnl |
Sensors
|
| 2005 | J | jnl |
Adv. Eng. Softw.
|
| 2005 | — | conf |
ISNN (3)
|
| 2005 | J | jnl |
Microelectron. Reliab.
|
| 2004 | — | conf |
ISNN (2)
|
| 2003 | J | jnl |
Int. J. Bifurc. Chaos
|