Grigor Tshagharyan

24 papers A 8B 3C 1Misc 7Journal 1Unranked 4

Year	Rank	Type	Title / Venue / Authors
2025	B	`conf`	Analysis and Mitigation of Radiation Effects in SRAM-based Register Files. ETS Zhe Zhang, Surendra Hemaram, Mahta Mayahinia, Christian Weis, Norbert Wehn, Mehdi B. Tahoori, Sani R. Nassif, Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian
2025	B	`conf`	European Test Symposium Teams: an Anniversary Snapshot. ETS Maksim Jenihhin, Jaan Raik, Artur Jutman, Natalia Cherezova, Raimund Ubar, Liviu Miclea, Szilárd Enyedi, I. Stefan, Ovidiu Stan, Cosmina Corches, Z. Peng, Petru Eles, Rolf Drechsler, S. Eggersglüß, Görschwin Fey, Andreas Glowatz, Daniel Tille, Georges G. E. Gielen, Anthony Coyette, Wim Dobbelaere, Ronny Vanhooren, P.-Y. Chuang, Erik Jan Marinissen, Giorgio Di Natale, M. Barragan, Paolo Maistri, S. Mir, Vatajelu I. Vatajelu, Paolo Bernardi, S. Di Carlo, Paolo Prinetto, Matteo Sonza Reorda, Massimo Violante, Haralampos-G. Stratigopoulos, M. K. Michael, Stelios Neophytou, Stavros Hadjitheophanous, Kyriakos Christou, M. Skitsas, Alberto Bosio, Bastien Deveautour, P. Girard, Marcello Traiola, Arnaud Virazel, F. Fernandes Dos Santos, Angeliki Kritikakou, Gioele Casagranda, Marzio Vallero, Flavio Vella, Paolo Rech, Letícia Maria Bolzani Poehls, Milos Krstic, Marko S. Andjelkovic, F. Vargas, Grigor Tshagharyan, Gurgen Harutyunyan, Valery A. Vardanian, Samvel K. Shoukourian, Yervant Zorian, Jennifer Dworak, Kundan Nepal, Theodore W. Manikas, Mottaqiallah Taouil, Moritz Fieback, Anteneh Gebregiorgis, Rajendra Bishnoi, Said Hamdioui, Abhijit Chatterjee, A. Saha, Suhasini Komarraju, K. Ma, Chandramouli N. Amarnath, Mehdi Baradaran Tahoori, Mahta Mayahinia, Maryam Rajabalipanah, Katayoon Basharkhah, N. Nosrati, Zahra Jahanpeima, Zain Navabi, Hans-Joachim Wunderlich, Sybille Hellebrand
2025	A	`conf`	Leveraging UCIe Interface for Silicon Health & Reliabiilty of Chiplets in a 3D Stack. ITC Sandeep Kumar Goel, Ankita Patidar, Stanley John, Frank Lee, Min-Jer Wang, Daniel F. J. Yang, Yervant Zorian, Manish Arora, Firooz Massoudi, Shaan Awasthi, Stelios Balalis, Velmurugan Pathervellaichamy, Bharath Shankaranarayanan, Narasimhalu Raju, Gurgen Harutyunyan, Grigor Tshagharyan, Vahagn Hovakimyan, Arman Karagyozyan, Alvina Manucharyan
2024	Misc	`conf`	Addressing the Combined Effect of Transistor and Interconnect Aging in SRAM towards Silicon Lifecycle Management. VTS Zhe Zhang, Mahta Mayahinia, Christian Weis, Norbert Wehn, Mehdi B. Tahoori, Sani R. Nassif, Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian
2024	J	`jnl`	Testing for Electromigration in Sub-5-nm FinFET Memories. IEEE Des. Test Mahta Mayahinia, Mehdi Baradaran Tahoori, Grigor Tshagharyan, Karen Amirkhanyan, Artur Ghukasyan, Gurgen Harutyunyan, Yervant Zorian
2024	A	`conf`	Testing for aging in advanced SRAM: From front end of the line transistors to back end of the line interconnects. ITC Zhe Zhang, Mahta Mayahinia, Christian Weis, Norbert Wehn, Mehdi B. Tahoori, Sani R. Nassif, Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian
2023	Misc	`conf`	An Efficient External Memory Test Solution: Case Study for HPC Application. VTS Keqing Ouyang, Minqiang Peng, Yunnong Zhu, Kang Qi, Grigor Tshagharyan, Arun Kumar, Gurgen Harutyunyan, Isaac Wang
2023	B	`conf`	On-chip Electromigration Sensor for Silicon Lifecycle Management of Nanoscale VLSI. ETS Mahta Mayahinia, Mehdi Baradaran Tahoori, Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian
2023	Misc	`conf`	Overcoming Embedded Memory Test & Repair Challenges in the Gate-All-Around Era. VTS Artur Ghukasyan, Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian
2023	A	`conf`	SLM Subsystem for Automotive SoC: Case Study on Path Margin Monitor. ITC Kranthi Kandula, Ramalingam Kolisetti, Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian
2023	A	`conf`	Utilizing ECC Analytics to Improve Memory Lifecycle Management. ITC Costas Argyrides, Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian
2022	A	`conf`	An Efficient Test Strategy for Detection of Electromigration Impact in Advanced FinFET Memories. ITC Mahta Mayahinia, Mehdi B. Tahoori, Gurgen Harutyunyan, Grigor Tshagharyan, Karen Amirkhanyan
2022	Misc	`conf`	Innovative Practices Track: What's Next for Automotive: Where and How to Improve Field Test and Enhance SoC Safety. VTS Minqiang Peng, Youfa Wu, Jialiang Li, Alex Yu, Grigor Tshagharyan, Costas Argyrides, Vilas Sridharan, Gurgen Harutyunyan, Yervant Zorian, Nilanjan Mukherjee
2019	Misc	`conf`	Innovative Practices on In-System Test and Reliability of Memories. VTS S. Bandyopadhyay, J. Mekkoth, Marc Hutner, Hayk T. Grigoryan, Arun Kumar, Samvel K. Shoukourian, Grigor Tshagharyan, Yervant Zorian, Gabriele Boschi, Duccio Lazzarotti, Donato Luongo, Hanna Shaheen, Gurgen Harutyunyan
2019	C	`conf`	Variation-aware Fault Modeling and Test Generation for STT-MRAM. IOLTS Sarath Mohanachandran Nair, Rajendra Bishnoi, Mehdi Baradaran Tahoori, Hayk T. Grigoryan, Grigor Tshagharyan
2018	A	`conf`	Defect injection, Fault Modeling and Test Algorithm Generation Methodology for STT-MRAM. ITC Sarath Mohanachandran Nair, Rajendra Bishnoi, Mehdi Baradaran Tahoori, Grigor Tshagharyan, Hayk T. Grigoryan, Gurgen Harutyunyan, Yervant Zorian
2018	—	`conf`	Implementation of Memory Static, Coupling and Dynamic Fault Models at the Register Transfer Level. EWDTS Davit Hayrapetyan, Aleksandr Manukvan, Grigor Tshagharyan
2018	A	`conf`	Modeling and Testing of Aging Faults in FinFET Memories for Automotive Applications. ITC Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian, Anteneh Gebregiorgis, Mohammad Saber Golanbari, Rajendra Bishnoi, Mehdi Baradaran Tahoori
2017	A	`conf`	An effective functional safety solution for automotive systems-on-chip. ITC Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian
2017	—	`conf`	Experimental study on Hamming and Hsiao codes in the context of embedded applications. EWDTS Grigor Tshagharyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Yervant Zorian
2016	—	`conf`	Securing test infrastructure of system-on-chips. EWDTS Grigor Tshagharyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Yervant Zorian
2015	Misc	`conf`	Impact of parameter variations on FinFET faults. VTS Gurgen Harutyunyan, Grigor Tshagharyan, Yervant Zorian
2015	—	`conf`	Overview study on fault modeling and test methodology development for FinFET-based memories. EWDTS Grigor Tshagharyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Yervant Zorian
2014	Misc	`conf`	Fault modeling and test algorithm creation strategy for FinFET-based memories. VTS Gurgen Harutyunyan, Grigor Tshagharyan, Valery A. Vardanian, Yervant Zorian