Grady Giles

20 papers A 15Journal 4Unranked 1
YearRankTypeTitle / Venue / Authors
2017 A conf
Maximizing scan pin and bandwidth utilization with a scan routing fabric.
ITC
Yan Dong, Grady Giles, Guoliang Li, Jeff Rearick, John Schulze, James Wingfield, Tim Wood
2016 — conf
Toward more efficient scan data bandwidth utilization on modern SOCs.
SoCC
Yan Dong, Grady Giles, Guoliang Li, Jeff Rearick, John Schulze, James Wingfield, Tim Wood
2015 J jnl
Scan Test Bandwidth Management for Ultralarge-Scale System-on-Chip Architectures.
IEEE Trans. Very Large Scale Integr. Syst.
Wu-Tung Cheng, Yan Dong, Grady Giles, Yu Huang, Jakub Janicki, Mark Kassab, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer
2013 A conf
EDT bandwidth management - Practical scenarios for large SoC designs.
ITC
Jakub Janicki, Jerzy Tyszer, Wu-Tung Cheng, Yu Huang, Mark Kassab, Nilanjan Mukherjee, Janusz Rajski, Yan Dong, Grady Giles
2010 A conf
The scan-DFT features of AMD's next-generation microprocessor core.
ITC
Mahmut Yilmaz, Baosheng Wang, Jayalakshmi Rajaraman, Tom Olsen, Kanwaldeep Sobti, Dwight Elvey, Jeff Fitzgerald, Grady Giles, Wei-Yu Chen
2009 J jnl
Test Access Mechanism in the Quad-Core AMD Opteron Microprocessor.
IEEE Des. Test Comput.
Kedarnath J. Balakrishnan, Grady Giles, James Wingfield
2009 A conf
Test access mechanism for multiple identical cores.
ITC
Grady Giles, Jing Wang, Anuja Sehgal, Kedarnath J. Balakrishnan, James Wingfield
2008 A conf
Test Access Mechanism for Multiple Identical Cores.
ITC
Grady Giles, Jing Wang, Anuja Sehgal, Kedarnath J. Balakrishnan, James Wingfield
2008 A conf
The Test Features of the Quad-Core AMD Opteron- Microprocessor.
ITC
Tim Wood, Grady Giles, Chris Kiszely, Martin Schuessler, Daniela Toneva, Joel Irby, Michael Mateja
2005 A conf
Built-in constraint resolution.
ITC
Grady Giles, Joel Irby, Daniela Toneva, Kun-Han Tsai
2002 A conf
Is Scan (Alone) Sufficient to Test Today?s Microprocessors? Not Quite, but We Can?t Get the Job Done Without It.
ITC
Grady Giles
2000 A conf
Conversion of small functional test sets of nonscan blocks to scan patterns.
ITC
Don E. Ross, Tim Wood, Grady Giles
1998 J jnl
Test Development for Second-Generation ColdFire Microprocessors.
IEEE Des. Test Comput.
Dale Amason, Alfred L. Crouch, Renny Eisele, Grady Giles, Michael Mateja
1997 A conf
A Case Study of the Test Development for the 2nd Generation ColdFire® Microprocessors.
ITC
Michael Mateja, Alfred L. Crouch, Renny Eisele, Grady Giles, Dale Amason
1993 J jnl
Case study of 1149.01 microprocessor implementations.
Microprocess. Microsystems
William C. Bruce, Michael G. Gallup, Grady Giles, Tom Munns
1992 A conf
Implementing 1149.1 on CMOS Microprocessors.
ITC
William C. Bruce, Michael G. Gallup, Grady Giles, Tom Munns
1991 A conf
Implementing 1149.1 on CMOS Microprocessors.
ITC
William C. Bruce, Michael G. Gallup, Grady Giles, Tom Munns
1990 A conf
Testability considerations in the design of the MC68340 Integrated Processor Unit.
ITC
Philip E. Bishop, Grady Giles, Sudarshan Iyengar, C. Thomas Glover, Wai-On Law
1986 A conf
Testability Features of the MC68851 PMMU.
ITC
Grady Giles, Kenneth Scheuer
1985 A conf
A Methodology for Testing Content Addressable Memories.
ITC
Grady Giles, Craig Hunter