Gouri Sankar Kar

68 papers A* 1A 8B 2C 3Journal 14Unranked 40

Year	Rank	Type	Title / Venue / Authors
2025	—	`conf`	Accurate off-current evaluation by parasitic capacitance extraction in capacitor-less DRAM cells. IMW Daisuke Matsubayashi, Subhali Subhechha, Hyungrock Oh, Nouredine Rassoul, Shamin Houshmand Sharifi, Yiqun Wan, Shreya Kundu, Harinarayanan Puliyalil, Harold Dekkers, Alexandru Pavel, Inhee Lee, Gouri Sankar Kar, Attilio Belmonte
2025	J	`jnl`	Asymmetric and Adaptive Error Correction in STT-MRAM. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Surendra Hemaram, Mehdi B. Tahoori, Francky Catthoor, Siddharth Rao, Sebastien Couet, Tommaso Marinelli, Valerio Pica, Gouri Sankar Kar
2025	J	`jnl`	Benchmarking of Scaled Majority-Logic-Synthesized Spintronic Circuits Based on Magnetic Tunnel Junction Transducers. IEEE Trans. Circuits Syst. I Regul. Pap. Fanfan Meng, Siang-Yun Lee, Odysseas Zografos, Mohit Gupta, Van D. Nguyen, Giovanni De Micheli, Sorin Cotofana, Inge Asselberghs, Christoph Adelmann, Gouri Sankar Kar, Sebastien Couet, Florin Ciubotaru
2025	—	`conf`	Dielectric Breakdown Analysis on Bottom and Top-Gated IGZO-TFT. IRPS Simon Van Beek, Adrian Vaisman Chasin, Subhali Subhechha, Harold Dekkers, Nouredine Rassoul, Yiqun Wan, Hongwei Tang, Joao P. Bastos, Attilio Belmonte, Gouri Sankar Kar
2025	A	`conf`	InterA-ECC: Interconnect-Aware Error Correction in STT-MRAM. DATE Surendra Hemaram, Mahta Mayahinia, Mehdi B. Tahoori, Francky Catthoor, Siddharth Rao, Sebastien Couet, Tommaso Marinelli, Anita Farokhnejad, Gouri Sankar Kar
2024	—	`conf`	Comprehensive Performance and Reliability Assessment of Se-based Selector-Only Memory. IRPS Taras Ravsher, Robin Degraeve, Daniele Garbin, Sergiu Clima, Andrea Fantini, Gabriele Luca Donadio, Shreya Kundu, Wouter Devulder, Hubert Hody, Goedele Potoms, Jan Van Houdt, Valeri Afanas'ev, Attilio Belmonte, Gouri Sankar Kar
2024	—	`conf`	EOT Scaling Via 300mm MX2 Dry Transfer - Steps Toward a Manufacturable Process Development and Device Integration. VLSI Technology and Circuits S. Ghosh, A. Kruv, Quentin Smets, Tom Schram, D. J. Leech, T. Ding, V. Turkani, Benjamin Groven, A. Dangel, G. Probst, Thomas Uhrmann, Markus Wimplinger, Inge Asselberghs, Cesar J. Lockhart de la Rosa, Steven Brems, Gouri Sankar Kar
2024	—	`conf`	Extremely Scaled Perpendicular SOT-MRAM Array Integration on 300mm Wafer. VLSI Technology and Circuits Farrukh Yasin, A. Palomino, Ankit Kumar, Valerio Pica, Simon Van Beek, Giacomo Talmelli, Van D. Nguyen, Stefan Cosemans, D. Crotti, Kurt Wostyn, Gouri Sankar Kar, Sebastien Couet
2024	—	`conf`	Fundamental understanding of NBTI degradation mechanism in IGZO channel devices. IRPS Ying Zhao, Pietro Rinaudo, Adrian Vaisman Chasin, Brecht Truijen, Ben Kaczer, Nouredine Rassoul, Harold Dekkers, Attilio Belmonte, Ingrid De Wolf, Gouri Sankar Kar, Jacopo Franco
2024	B	`conf`	Hard Error Correction in STT-MRAM. ASPDAC Surendra Hemaram, Mehdi B. Tahoori, Francky Catthoor, Siddharth Rao, Sebastien Couet, Gouri Sankar Kar
2024	—	`conf`	Light-Assisted Investigation of the Role of Oxygen Flow during IGZO Deposition on Deep Subgap States and their Evolution Under PBTI. IRPS Pietro Rinaudo, Adrian Vaisman Chasin, Ying Zhao, Ben Kaczer, Nouredine Rassoul, Harold Dekkers, Michiel J. van Setten, Attilio Belmonte, Ingrid De Wolf, Gouri Sankar Kar, Jacopo Franco
2024	—	`conf`	Novel Cross-Point Architecture utilizing Distributed Diode Selector for Read Margin Amplification. IMW Taras Ravsher, Andrea Fantini, Kruti Trivedi, Nouredine Rassoul, Harold Dekkers, Attilio Belmonte, Jan Van Houdt, Valeri Afanas'ev, Kurt Wostyn, Sebastien Couet, Gouri Sankar Kar
2024	J	`jnl`	Soft and Hard Error-Correction Techniques in STT-MRAM. IEEE Des. Test Surendra Hemaram, Mehdi B. Tahoori, Francky Catthoor, Siddharth Rao, Sebastien Couet, Valerio Pica, Gouri Sankar Kar
2023	—	`conf`	Demonstration of multilevel multiply accumulate operations for AiMC using engineered a-IGZO transistors-based 2T1C gain cell arrays. IMW Subhali Subhechha, Stefan Cosemans, Attilio Belmonte, Nouredine Rassoul, Shamin Houshmand Sharifi, Peter Debacker, Diederik Verkest, Romain Delhougne, Gouri Sankar Kar
2023	C	`conf`	Design Technology co-optimization of 1D-1VCMA to improve read performance for SCM applications. ISCAS Mohit Kumar Gupta, Manu Perumkunnil, Dwaipayan Biswas, Saeideh Alinezhad Chamazcoti, Gouri Sankar Kar, Arnaud Furnémont, Julien Ryckaert
2023	A	`conf`	Device-Aware Test for Back-Hopping Defects in STT-MRAMs. DATE Sicong Yuan, Mottaqiallah Taouil, Moritz Fieback, Hanzhi Xun, Erik Jan Marinissen, Gouri Sankar Kar, Sidharth Rao, Sebastien Couet, Said Hamdioui
2023	J	`jnl`	Exploring Pareto-Optimal Hybrid Main Memory Configurations Using Different Emerging Memories. IEEE Trans. Circuits Syst. I Regul. Pap. Saeideh Alinezhad Chamazcoti, Mohit Gupta, Hyungrock Oh, Timon Evenblij, Francky Catthoor, Manu Perumkunnil Komalan, Gouri Sankar Kar, Arnaud Furnémont
2023	—	`conf`	Impact of gate stack processing on the hysteresis of 300 mm integrated WS2 FETs. IRPS L. Panarella, Ben Kaczer, Quentin Smets, Devin Verreck, Tom Schram, Daire Cott, Dennis Lin, Stanislav Tyaginov, Inge Asselberghs, Cesar J. Lockhart de la Rosa, Gouri Sankar Kar, Valeri Afanas'ev
2023	—	`conf`	Integration of epitaxial monolayer MX₂ channels on 300mm wafers via Collective-Die-To-Wafer (CoD2W) transfer. VLSI Technology and Circuits Souvik Ghosh, Quentin Smets, S. Banerjee, Tom Schram, Koen Kennes, R. Verheyen, P. Kumar, M.-E. Boulon, Benjamin Groven, H. M. Silva, Shreya Kundu, Daire Cott, Dennis Lin, P. Favia, T. Nuytten, A. Phommahaxay, Inge Asselberghs, C. De La Rosa, Gouri Sankar Kar, Steven Brems
2023	—	`conf`	Lowest IOFF < 3×10 VLSI Technology and Circuits Attilio Belmonte, Shreya Kundu, S. Subhechha, Adrian Vaisman Chasin, Nouredine Rassoul, Harold Dekkers, H. Puliyalil, F. Seidel, P. Carolan, Romain Delhougne, Gouri Sankar Kar
2023	A	`conf`	Magnetic Coupling Based Test Development for Contact and Interconnect Defects in STT-MRAMs. ITC Sicong Yuan, Ziwei Zhang, Moritz Fieback, Hanzhi Xun, Erik Jan Marinissen, Gouri Sankar Kar, Sidharth Rao, Sebastien Couet, Mottaqiallah Taouil, Said Hamdioui
2023	—	`conf`	Magnetic Domain Wall Memory: A DTCO study for Memory Applications. ESSDERC M. Gupta, Siddharth Rao, Gouri Sankar Kar, Sebastien Couet
2023	—	`conf`	NPN Si/SiGe memory selector with non-linearity>10 ESSDERC Gaspard Hiblot, Taras Ravsher, Roger Loo, Bhuvaneshwari Yengula Venkata Ramana, Nathali Franchina-Vergel, Andrea Fantini, Shamin Houshmand Sharifi, Nina Bazzazian, Kurt Wostyn, Loris Angelo Labbate, Sebastien Couet, Gouri Sankar Kar
2023	—	`conf`	The Promise of 2-D Materials for Scaled Digital and Analog Applications. ISSCC Devin Verreck, Piet Wambacq, Maarten Van De Put, Zubair Ahmed, Quentin Smets, Aryan Afzalian, Rutger Duflou, Xiangyu Wu, Gioele Mirabelli, Rongmei Chen, Inge Asselberghs, Gouri Sankar Kar
2023	—	`conf`	Towards low damage and fab-compatible top-contacts in MX2 transistors using a combined synchronous pulse atomic layer etch and wet-chemical etch approach. VLSI Technology and Circuits Shreya Kundu, D. H. van Doip, Tom Schram, Quentin Smets, S. Banerjee, Benjamin Groven, Daire Cott, Stefan Decoster, P. Bezard, F. Lazzarino, K. Banerjee, Souvik Ghosh, J. F. de Mamelfe, Pierre Morin, Cesar J. Lockhart de la Rosa, Inge Asselberghs, Gouri Sankar Kar
2023	—	`conf`	Understanding the impact of La dopant position on the ferroelectric properties of hafnium zirconate. ESSDERC Mihaela Ioana Popovici, Jasper Bizindavyi, Gourab De, Dae Seon Kwon, Gouri Sankar Kar, Jan Van Houdt
2022	J	`jnl`	Challenges and targets of MRAM-enabled scaled spintronic logic circuits. CoRR Fanfan Meng, Florin Ciubotaru, S.-Y. Lee, Odysseas Zografos, M. Gupta, Van D. Nguyen, Sebastien Couet, Gouri Sankar Kar, Giovanni De Micheli, Christoph Adelmann, Inge Asselberghs
2022	J	`jnl`	Characterization, Modeling, and Test of Intermediate State Defects in STT-MRAMs. IEEE Trans. Computers Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui
2022	—	`conf`	Degradation mechanism of amorphous IGZO-based bipolar metal-semiconductor-metal selectors. IRPS Taras Ravsher, Andrea Fantini, Adrian Vaisman Chasin, Shamin H. Sharifi, Hubert Hody, Harold Dekkers, Thomas Witters, Jan Van Houdt, Valeri Afanas'ev, Sebastien Couet, Gouri Sankar Kar
2022	—	`conf`	Design exploration of IGZO diode based VCMA array design for Storage Class Memory Applications. ESSDERC Mohit Gupta, Manu Perumkunnil, Andrea Fantini, Saeideh Alinezhad Chamazcoti, Woojin Kim, Marie Garcia Bardon, Gouri Sankar Kar, Arnaud Furnémont
2022	—	`conf`	Device engineering guidelines for performance boost in IGZO front gated TFTs based on defect control. ICICDT S. Subhechha, Nouredine Rassoul, Attilio Belmonte, Hubert Hody, Harold Dekkers, Michiel J. van Setten, Adrian Vaisman Chasin, Shamin H. Sharifi, K. Banerjee, H. Puliyalil, Shreya Kundu, M. Pak, D. Tsvetanova, Nina Bazzazian, Kevin Vandersmissen, D. Batuk, J. Geypen, J. Heijlen, Romain Delhougne, Gouri Sankar Kar
2022	—	`conf`	Enhanced performance and low-power capability of SiGeAsSe-GeSbTe 1S1R phase-change memory operated in bipolar mode. VLSI Technology and Circuits Taras Ravsher, Daniele Garbin, Andrea Fantini, Robin Degraeve, Sergiu Clima, Gabriele Luca Donadio, Shreya Kundu, Hubert Hody, Wouter Devulder, Jan Van Houdt, Valeri Afanas'ev, Romain Delhougne, Gouri Sankar Kar
2022	J	`jnl`	MFA-MTJ Model: Magnetic-Field-Aware Compact Model of pMTJ for Robust STT-MRAM Design. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui
2022	—	`conf`	MTJ degradation in SOT-MRAM by self-heating-induced diffusion. IRPS Simon Van Beek, Kaiming Cai, Siddharth Rao, Ganesh Jayakumar, Sebastien Couet, Nico Jossart, Adrian Vaisman Chasin, Gouri Sankar Kar
2022	—	`conf`	Selective operations of multi-pillar SOT-MRAM for high density and low power embedded memories. VLSI Technology and Circuits Kaiming Cai, Simon Van Beek, Siddharth Rao, Kaiquan Fan, M. Gupta, Van D. Nguyen, Ganesh Jayakumar, Giacomo Talmelli, Sebastien Couet, Gouri Sankar Kar
2022	J	`jnl`	Time-Dependent Electromigration Modeling for Workload-Aware Design-Space Exploration in STT-MRAM. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Mahta Mayahinia, Mehdi B. Tahoori, Manu Perumkunnil Komalan, Houman Zahedmanesh, Kristof Croes, Tommaso Marinelli, José Ignacio Gómez Pérez, Timon Evenblij, Gouri Sankar Kar, Francky Catthoor
2022	—	`conf`	Ultra-low Leakage IGZO-TFTs with Raised Source/Drain for Vt > 0 V and Ion > 30 µA/µm. VLSI Technology and Circuits S. Subhechha, Nouredine Rassoul, Attilio Belmonte, Hubert Hody, Harold Dekkers, Michiel J. van Setten, Adrian Vaisman Chasin, Shamin H. Sharifi, S. Sutar, L. Magnarin, Umberto Celano, H. Puliyalil, Shreya Kundu, M. Pak, Lieve Teugels, D. Tsvetanova, Nina Bazzazian, Kevin Vandersmissen, C. Biasotto, D. Batuk, J. Geypen, J. Heijlen, Romain Delhougne, Gouri Sankar Kar
2021	A	`conf`	Characterization and Fault Modeling of Intermediate State Defects in STT-MRAM. DATE Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui
2021	J	`jnl`	Defect and Fault Modeling Framework for STT-MRAM Testing. IEEE Trans. Emerg. Top. Comput. Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Guilherme Cardoso Medeiros, Moritz Fieback, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui
2021	—	`conf`	Edge-induced reliability & performance degradation in STT-MRAM: an etch engineering solution. IRPS Simon Van Beek, Siddharth Rao, Shreya Kundu, Woojin Kim, Barry J. O'Sullivan, Stefan Cosemans, Farrukh Yasin, Robert Carpenter, Sebastien Couet, Shamin H. Sharifi, Nico Jossart, Davide Crotti, Gouri Sankar Kar
2021	—	`conf`	Enhanced data integrity of In-Ga-Zn-Oxide based Capacitor-less 2T memory for DRAM applications. ESSDERC Hyungrock Oh, Attilio Belmonte, Manu Perumkunnil, Jérôme Mitard, Nouredine Rassoul, Gabriele Luca Donadio, Romain Delhougne, Arnaud Furnémont, Gouri Sankar Kar, Wim Dehaene
2021	—	`conf`	Modeling and spectroscopy of ovonic threshold switching defects. IRPS Robin Degraeve, Taras Ravsher, Shoichi Kabuyanagi, Andrea Fantini, Sergiu Clima, Daniele Garbin, Gouri Sankar Kar
2021	—	`conf`	Process-induced charging damage in IGZO nTFTs. IRPS Gaspard Hiblot, Nouredine Rassoul, Lieve Teugels, Katia Devriendt, Adrian Vaisman Chasin, Michiel J. van Setten, Attilio Belmonte, Romain Delhougne, Gouri Sankar Kar
2021	—	`conf`	STT-MRAM array performance improvement through optimization of Ion Beam Etch and MTJ for Last-Level Cache application. IMW Sidharth Rao, Woojin Kim, Simon Van Beek, Shreya Kundu, Manu Perumkunnil, Stefan Cosemans, Farrukh Yasin, Sebastien Couet, Robert Carpenter, Barry J. O'Sullivan, Shamin H. Sharifi, N. Jossart, Laurent Souriau, Ludovic Goux, Dimitri Crotti, Gouri Sankar Kar
2021	A	`conf`	Testing STT-MRAM: Manufacturing Defects, Fault Models, and Test Solutions. ITC Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui
2021	—	`conf`	Threshold switching in a-Si and a-Ge based MSM selectors and its implications for device reliability. IMW Taras Ravsher, Shamin H. Sharifi, Andrea Fantini, Hubert Hody, Thomas Witters, Daniele Garbin, Robin Degraeve, Valeri Afanas'ev, Jan Van Houdt, Ludovic Goux, D. Crotti, Gouri Sankar Kar
2020	A	`conf`	Characterization, Modeling and Test of Synthetic Anti-Ferromagnet Flip Defect in STT-MRAMs. ITC Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui
2020	A	`conf`	Impact of Magnetic Coupling and Density on STT-MRAM Performance. DATE Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui
2020	J	`jnl`	Impact of Magnetic Coupling and Density on STT-MRAM Performance. CoRR Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui
2020	—	`conf`	Physics based modeling of bimodal electromigration failure distributions and variation analysis for VLSI interconnects. IRPS Sarath Mohanachandran Nair, Rajendra Bishnoi, Mehdi B. Tahoori, Houman Zahedmanesh, Kristof Croes, Kevin Garello, Gouri Sankar Kar, Francky Catthoor
2020	—	`conf`	Understanding and empirical fitting the breakdown of MgO in end-of-line annealed MTJs. IRPS Simon Van Beek, Barry J. O'Sullivan, Sebastien Couet, Davide Crotti, Dimitri Linten, Gouri Sankar Kar
2019	C	`conf`	A Comparative Analysis on the Impact of Bank Contention in STT-MRAM and SRAM Based LLCs. ICCD Timon Evenblij, Christian Tenllado, Manu Perumkunnil, Francky Catthoor, Sushil Sakhare, Peter Debacker, Gouri Sankar Kar, Arnaud Furnémont, Nicolas Bueno, José Ignacio Gómez Pérez
2019	—	`conf`	Manufacturable 300mm platform solution for Field-Free Switching SOT-MRAM. VLSI Circuits Kevin Garello, Farrukh Yasin, Hubert Hody, Sebastien Couet, Laurent Souriau, Shamin H. Sharifi, Johan Swerts, Robert Carpenter, Sidharth Rao, Wonsub Kim, J. Wu, K. K. V. Sethu, M. Pak, N. Jossart, D. Crotti, Arnaud Furnémont, Gouri Sankar Kar
2019	B	`conf`	Pinhole Defect Characterization and Fault Modeling for STT-MRAM Testing. ETS Lizhou Wu, Siddharth Rao, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Erik Jan Marinissen, Farrukh Yasin, Sebastien Couet, Said Hamdioui, Gouri Sankar Kar
2019	A*	`conf`	Process, Circuit and System Co-optimization of Wafer Level Co-Integrated FinFET with Vertical Nanosheet Selector for STT-MRAM Applications. DAC Trong Huynh Bao, Anabela Veloso, Sushil Sakhare, Philippe Matagne, Julien Ryckaert, Manu Perumkunnil, Davide Crotti, Farrukh Yasin, Alessio Spessot, Arnaud Furnémont, Gouri Sankar Kar, Anda Mocuta
2019	—	`conf`	Variation-Aware Physics-Based Electromigration Modeling and Experimental Calibration for VLSI Interconnects. IRPS Sarath Mohanachandran Nair, Rajendra Bishnoi, Mehdi Baradaran Tahoori, Houman Zahedmanesh, Kristof Croes, Kevin Garello, Gouri Sankar Kar, Francky Catthoor
2018	—	`conf`	Extended RVS characterisation of STT-MRAM devices: Enabling detection of AP/P switching and breakdown. IRPS Barry J. O'Sullivan, Simon Van Beek, Philippe J. Roussel, Sidharth Rao, Wonsub Kim, Sebastien Couet, Johan Swerts, Farrukh Yasin, Dimitri Crotti, Dimitri Linten, Gouri Sankar Kar
2018	A	`conf`	Main memory organization trade-offs with DRAM and STT-MRAM options based on gem5-NVMain simulation frameworks. DATE Manu Komalan, Oh Hyung Rock, Matthias Hartmann, Sushil Sakhare, Christian Tenllado, José Ignacio Gómez, Gouri Sankar Kar, Arnaud Furnémont, Francky Catthoor, Sophiane Senni, David Novo, Abdoulaye Gamatié, Lionel Torres
2018	—	`conf`	SOT-MRAM 300MM Integration for Low Power and Ultrafast Embedded Memories. VLSI Circuits Kevin Garello, Kevin Garello Yasin, Sebastien Couet, Laurent Souriau, Johan Swerts, Sidharth Rao, Simon Van Beek, Wonsub Kim, Enlong Liu, Shreya Kundu, Diana Tsvetanova, Kris Croes, N. Jossart, E. Grimaldi, M. Baumgartner, D. Crotti, Arnaud Fumemont, Pietro Gambardella, Gouri Sankar Kar
2018	J	`jnl`	SOT-MRAM 300mm integration for low power and ultrafast embedded memories. CoRR Kevin Garello, Farrukh Yasin, Sebastien Couet, Laurent Souriau, Johan Swerts, Sidharth Rao, Simon Van Beek, Wonsub Kim, Enlong Liu, Shreya Kundu, Diana Tsvetanova, N. Jossart, Kris Croes, E. Grimaldi, M. Baumgartner, D. Crotti, Arnaud Furnémont, Pietro Gambardella, Gouri Sankar Kar
2018	—	`conf`	Study of breakdown in STT-MRAM using ramped voltage stress and all-in-one maximum likelihood fit. ESSDERC Simon Van Beek, Philippe Roussel, Barry J. O'Sullivan, Robin Degraeve, Stefan Cosemans, Dimitri Linten, Gouri Sankar Kar
2017	J	`jnl`	A Smaller, Faster, and More Energy-Efficient Complementary STT-MRAM Cell Uses Three Transistors and a Ground Grid: More Is Actually Less. IEEE Trans. Very Large Scale Integr. Syst. Raf Appeltans, Praveen Raghavan, Gouri Sankar Kar, Arnaud Furnémont, Liesbet Van der Perre, Wim Dehaene
2017	C	`conf`	Cross-layer design and analysis of a low power, high density STT-MRAM for embedded systems. ISCAS Manu Komalan, Sushil Sakhare, Trong Huynh Bao, Siddharth Rao, Woojin Kim, Christian Tenllado, José Ignacio Gómez, Gouri Sankar Kar, Arnaud Furnémont, Francky Catthoor
2017	—	`conf`	Doped GeSe materials for selector applications. ESSDERC Naga Sruti Avasarala, Bogdan Govoreanu, Karl Opsomer, Wouter Devulder, Sergiu Clima, Christophe Detavernier, Marleen van der Veen, Jan Van Houdt, Marc Henys, Ludovic Goux, Gouri Sankar Kar
2017	—	`conf`	Enhancement of CBRAM performance by controlled formation of a hourglass-shaped filament. NVMTS Attilio Belmonte, Ludovic Goux, Jiyong Woo, Umberto Celano, Augusto Redolfi, Sergiu Clima, Gouri Sankar Kar
2015	—	`conf`	Four point probe ramped voltage stress as an efficient method to understand breakdown of STT-MRAM MgO tunnel junctions. IRPS Simon Van Beek, Koen Martens, Philippe Roussel, Gabriele Luca Donadio, Johan Swerts, Sofie Mertens, Gouri Sankar Kar, Tai Min, Guido Groeseneken
2006	J	`jnl`	Morphological evolution and lateral ordering of uniform SiGe/Si(001) islands. Microelectron. J. Mathieu Stoffel, Armando Rastelli, T. Merdzhanova, Gouri Sankar Kar, Oliver G. Schmidt
2006	J	`jnl`	Reading the footprints of strained islands. Microelectron. J. Armando Rastelli, Mathieu Stoffel, G. Katsaros, J. Tersoff, U. Denker, T. Merdzhanova, Gouri Sankar Kar, Giovanni Costantini, K. Kern, H. von Känel