Gordon Russell

24 papers A 1C 3Journal 9Unranked 11
YearRankTypeTitle / Venue / Authors
2012 — conf
Modelling and Analysis of Manufacturing Variability Effects from Process to Architectural Level.
PATMOS
Chenxi Ni, Ziyad Al Tarawneh, Gordon Russell, Alexandre V. Bystrov
2012 C conf
Reconfigurable time interval measurement circuit incorporating a programmable gain time difference amplifier.
DDECS
Ahmed Naif M. Alahmadi, Gordon Russell, Alex Yakovlev
2012 — conf
Statistical delay modelling of manufacturing process variations at system level.
NEWCAS
Chenxi Ni, Gordon Russell, Alex Bystrov
2012 C conf
VARMA - VARiability modelling and analysis tool.
DDECS
Gordon Russell, Frank P. Burns, Alex Yakovlev
2011 J jnl
Design and analysis of a low-swing driver scheme for long interconnects.
Microelectron. J.
Nor Muzlifah Mahyuddin, Gordon Russell, E. Graeme Chester
2011 J jnl
M-PRES: a statistical tool for modelling the impact of manufacturing process variations on circuit-level performance parameters.
IET Circuits Devices Syst.
Santosh Shedabale, Gordon Russell, Alexandre Yakovlev
2011 J jnl
Sub-threshold synchronizer.
Microelectron. J.
Jun Zhou, Maryam Ashouei, David Kinniment, Jos Huisken, Gordon Russell, Alexandre Yakovlev
2010 — conf
Extending Synchronization from Super-Threshold to Sub-threshold Region.
ASYNC
Jun Zhou, Maryam Ashouei, David Kinniment, Jos Huisken, Gordon Russell
2008 — conf
Adapting Synchronizers to the Effects of on Chip Variability.
ASYNC
Jun Zhou, David Kinniment, Gordon Russell, Alex Yakovlev
2008 — conf
FPGA Implementation of an Asynchronous Processor with Both Online and Offline Testing Capabilities.
ASYNC
Nikolaos Minas, Matthew Marshall, Gordon Russell, Alex Yakovlev
2008 — conf
High resolution flash time-to-digital converter with sub-picosecond measurement capabilities.
SoC
Nikolaos Minas, David Kinniment, Gordon Russell, Alex Yakovlev
2008 J jnl
On-Chip Measurement of Deep Metastability in Synchronizers.
IEEE J. Solid State Circuits
Jun Zhou, David Kinniment, Charles E. Dike, Gordon Russell, Alexandre Yakovlev
2008 J jnl
Statistical modelling of the variation in advanced process technologies using a multi-level partitioned response.
IET Circuits Devices Syst.
Santosh Shedabale, Hiran Ramakrishnan, Gordon Russell, Alexandre Yakovlev, Sanatan Chattopadhyay
2008 — conf
The impact of variability on the reliability of long on-chip interconnect in the presence of crosstalk.
SLIP
Basel Halak, Santosh Shedabale, Hiran Ramakrishnan, Alexandre Yakovlev, Gordon Russell
2007 — conf
A High Resolution Flash Time-to-Digital Converter Taking Into Account Process Variability.
ASYNC
Nikolaos Minas, David Kinniment, Keith Heron, Gordon Russell
2007 C conf
A Low Power Information Redundant Concurrent Error Detecting Asynchronous Processor.
DSD
Matthew Marshall, Gordon Russell
2007 J jnl
Built-in time measurement circuits - a comparative design study.
IET Comput. Digit. Tech.
M. Amir Abas, Gordon Russell, David Kinniment
2007 J jnl
Embedded high-resolution delay measurement system using time amplification.
IET Comput. Digit. Tech.
M. Amir Abas, Gordon Russell, David Kinniment
2007 J jnl
Measuring Deep Metastability and Its Effect on Synchronizer Performance.
IEEE Trans. Very Large Scale Integr. Syst.
David Kinniment, Charles E. Dike, Keith Heron, Gordon Russell, Alexandre Yakovlev
2006 — conf
A Robust Synchronizer.
ISVLSI
Jun Zhou, David Kinniment, Gordon Russell, Alexandre Yakovlev
2006 — conf
Measuring Deep Metastability.
ASYNC
David Kinniment, Keith Heron, Gordon Russell
2004 A conf
Design of Sub-10-Picoseconds On-Chip Time Measurement Circuit.
DATE
M. Amir Abas, Gordon Russell, D. J. Kinniment
2003 J jnl
On-chip structures for timing measurement and test.
Microprocess. Microsystems
D. J. Kinniment, Oleh V. Maevsky, Alexandre V. Bystrov, Gordon Russell, Alexandre Yakovlev
2002 — conf
On-Chip Structures for Timing Measurements and Test.
ASYNC
D. J. Kinniment, Oleh V. Maevsky, Gordon Russell, Alexandre Yakovlev, Alexandre V. Bystrov