| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2021 | J | jnl |
J. Circuits Syst. Comput.
|
| 2017 | J | jnl |
Microelectron. Reliab.
|
| 2017 | J | jnl |
J. Circuits Syst. Comput.
|
| 2016 | J | jnl |
Microelectron. Reliab.
|
| 2016 | J | jnl |
J. Circuits Syst. Comput.
|
| 2015 | J | jnl |
J. Electron. Test.
|
| 2015 | C | conf |
DDECS
|
| 2014 | J | jnl |
J. Circuits Syst. Comput.
|
| 2013 | C | conf |
DDECS
|
| 2013 | J | jnl |
J. Circuits Syst. Comput.
|
| 2012 | J | jnl |
Int. J. Reason. based Intell. Syst.
|
| 2008 | J | jnl |
Microelectron. Reliab.
|
| 2000 | — | conf |
EUSIPCO
|
| 1997 | — | conf |
EUROSPEECH
|
| 1992 | — | conf |
CONPAR
|
| 1986 | J | jnl |
IEEE Trans. Acoust. Speech Signal Process.
|