Glenn H. Chapman

68 papers A 1C 1Misc 1Journal 7Unranked 58

Year	Rank	Type	Title / Venue / Authors
2024	—	`conf`	Image Degradation due to Interacting Hot Pixels and SEUs. DFT Glenn H. Chapman, Alireza Farahmandpour, Amit Chakma, Israel Koren, Zahava Koren
2023	—	`conf`	Image Degradation in Time Due to Interacting Hot Pixels. DFT Glenn H. Chapman, Klinsmann J. Coelho Silva Meneses, Linda Wu, Israel Koren, Zahava Koren
2022	—	`conf`	Image Degradation due to Interacting Adjacent Hot Pixels. DFT Glenn H. Chapman, Klinsmann J. Coelho Silva Meneses, Israel Koren, Zahava Koren
2021	—	`conf`	Dependence of SEUs in Digital Cameras on Pixel size and Elevation. DFT Glenn H. Chapman, Simone Neufeld, Klinsmann J. Coelho Silva Meneses, Israel Koren, Zahava Koren
2021	—	`conf`	Fault Tolerance for Islandable-Microgrid Sensors. DFT Vijay K. Jain, Glenn H. Chapman
2020	—	`conf`	Using digital imagers to characterize the dependence of energy and area distributions of SEUs on elevation. DFT Glenn H. Chapman, Rohan Thomas, Klinsmann J. Coelho Silva Meneses, Ruoyi Zhao, Israel Koren, Zahava Koren
2019	—	`conf`	Detecting SEUs in Noisy Digital Imagers with small pixels. DFT Glenn H. Chapman, Rohan Thomas, Klinsmann J. Coelho Silva Meneses, Bifei Huang, Hao Yang, Israel Koren, Zahava Koren
2019	—	`conf`	Image degradation from hot pixel defects with pixel size shrinkage. IMSE Glenn H. Chapman, Rohan Thomas, Klinsmann J. Coelho Silva Meneses, Israel Koren, Zahava Koren
2018	—	`conf`	Analysis of Single Event Upsets Based on Digital Cameras with Very Small Pixels. DFT Glenn H. Chapman, Rohan Thomas, Klinsmann J. Coelho Silva Meneses, Israel Koren, Zahava Koren
2018	—	`conf`	Exploring Hot Pixel Characteristics for 7 to 1.3 micron Pixels. IMSE Glenn H. Chapman, Rohan Thomas, Klinsmann J. Coelho Silva Meneses, Parham Purbakht, Israel Koren, Zahava Koren
2017	—	`conf`	Exploring soft errors (SEUs) with digital imager pixels ranging from 7 to 1.3 μm. DFT Glenn H. Chapman, Parham Purbakht, Peter Le, Israel Koren, Zahava Koren
2017	—	`conf`	Hot Pixel Behavior as Pixel Size Reduces to 1 micron. IMSE Glenn H. Chapman, Rahul Thomas, Israel Koren, Zahava Koren
2017	—	`conf`	Post arrays for the immobilization of vapochromic coordination polymers for chemical sensors. IEEE SENSORS David Stevens, Bonnie L. Gray, David Yin, Glenn H. Chapman, Daniel B. Leznoff
2016	—	`conf`	Experimental study and analysis of soft and permanent errors in digital cameras. DFT Glenn H. Chapman, Rahul Thomas, Rohan Thomas, Israel Koren, Zahava Koren
2016	—	`conf`	Increases in Hot Pixel Development Rates for Small Digital Pixel Sizes. IMSE Glenn H. Chapman, Rahul Thomas, Rohan Thomas, Klinsmann J. Coelho Silva Meneses, Tommy Q. Yang, Israel Koren, Zahava Koren
2015	—	`conf`	Enhanced correction methods for high density hot pixel defects in digital imagers. IMSE Glenn H. Chapman, Rahul Thomas, Rohit Thomas, Zahava Koren, Israel Koren
2015	—	`conf`	Single Event Upsets and Hot Pixels in digital imagers. DFTS Glenn H. Chapman, Rahul Thomas, Rohan Thomas, Klinsmann J. Coelho Silva Meneses, Tommy Q. Yang, Israel Koren, Zahava Koren
2014	—	`conf`	Correcting high-density hot pixel defects in digital imagers. IMSE Glenn H. Chapman, Rohit Thomas, Zahava Koren, Israel Koren
2014	—	`conf`	Improved correction for hot pixels in digital imagers. DFT Glenn H. Chapman, Rohit Thomas, Rahul Thomas, Israel Koren, Zahava Koren
2013	—	`conf`	Empirical formula for rates of hot pixel defects based on pixel size, sensor area, and ISO. Sensors, Cameras, and Systems for Industrial and Scientific Applications Glenn H. Chapman, Rohit Thomas, Zahava Koren, Israel Koren
2013	—	`conf`	Improved image accuracy in Hot Pixel degraded digital cameras. DFTS Glenn H. Chapman, Rohit Thomas, Israel Koren, Zahava Koren
2012	C	`conf`	Do more camera pixels result in a better picture? IOLTS Glenn H. Chapman, Israel Koren, Zahava Koren
2012	—	`conf`	Projecting the rate of in-field pixel defects based on pixel size, sensor area, and ISO. Sensors, Cameras, and Systems for Industrial and Scientific Applications Glenn H. Chapman, Jenny Leung, Rohit Thomas, Ana I. L. Namburete, Zahava Koren, Israel Koren
2012	—	`conf`	Relating digital imager defect rates to pixel size, sensor area and ISO. DFT Glenn H. Chapman, Rohit Thomas, Israel Koren, Zahava Koren
2011	—	`conf`	Creating Defect Tolerance in Microfluidic Capacitive/Photonic Biosensors. DFT Glenn H. Chapman, Bonnie L. Gray, Vijay K. Jain
2011	—	`conf`	Enhanced Defect Tolerance through Matrixed Deployment of Intelligent Sensors for the Smart Power Grid. DFT Vijay K. Jain, Glenn H. Chapman
2011	—	`conf`	Predicting Pixel Defect Rates Based on Image Sensor Parameters. DFT Glenn H. Chapman, Jenny Leung, Ana I. L. Namburete, Israel Koren, Zahava Koren
2011	—	`conf`	Simulating enhanced photo carrier collection in the multifinger photogate active pixel sensors. Sensors, Cameras, and Systems for Industrial, Scientific, and Consumer Applications Phanindra Kalyanam, Glenn H. Chapman, M. Parameswaran
2011	—	`conf`	Tradeoffs in imager design parameters for sensor reliability. Sensors, Cameras, and Systems for Industrial, Scientific, and Consumer Applications Glenn H. Chapman, Jenny Leung, Rahul Thomas, Zahava Koren, Israel Koren
2010	—	`conf`	Massively Deployable Intelligent Sensors for the Smart Power Grid. DFT Vijay K. Jain, Glenn H. Chapman
2010	—	`conf`	Tradeoffs in Imager Design with Respect to Pixel Defect Rates. DFT Glenn H. Chapman, Jenny Leung, Israel Koren, Zahava Koren
2009	—	`conf`	Characterization of Gain Enhanced In-Field Defects in Digital Imagers. DFT Jenny Leung, Glenn H. Chapman, Israel Koren, Zahava Koren
2009	—	`conf`	Statistical identification and analysis of defect development in digital imagers. Digital Photography Jenny Leung, Glenn H. Chapman, Zahava Koren, Israel Koren
2008	—	`conf`	Automatic Detection of In-field eld Defect Growth in Image Sensors. DFT Jenny Leung, Glenn H. Chapman, Israel Koren, Zahava Koren
2008	—	`conf`	Defect Tolerance for a Capacitance Based Nanoscale Biosensor. DFT Glenn H. Chapman, Vijay K. Jain
2007	—	`conf`	A Fault-Tolerant Active Pixel Sensor to Correct In-Field Hot Pixel Defects. DFT Jozsef Dudas, Michelle L. La Haye, Jenny Leung, Glenn H. Chapman
2007	—	`conf`	A Multiprocessor System-on-Chip Implementation of a Laser-based Transparency Meter on an FPGA. FPT James Dykes, Paulman Chan, Glenn H. Chapman, Lesley Shannon
2007	—	`conf`	Identification of in-field defect development in digital image sensors. Digital Photography Jozsef Dudas, Linda Wu, Cory Jung, Glenn H. Chapman, Zahava Koren, Israel Koren
2007	—	`conf`	Quantitative Analysis of In-Field Defects in Image Sensor Arrays. DFT Jenny Leung, Jozsef Dudas, Glenn H. Chapman, Israel Koren, Zahava Koren
2006	—	`conf`	Defect Tolerant and Energy Economized DSP Plane of a 3-D Heterogeneous SoC. DFT Vijay K. Jain, Glenn H. Chapman
2006	—	`conf`	Fault Tolerant Active Pixel Sensors in 0.18 and 0.35 Micron Technologies. DFT Michelle L. La Haye, Cory Jung, David Chen, Glenn H. Chapman, Jozsef Dudas
2006	—	`conf`	On-Line Mapping of In-Field Defects in Image Sensor Arrays. DFT Jozsef Dudas, Cory Jung, Linda Wu, Glenn H. Chapman, Israel Koren, Zahava Koren
2006	—	`conf`	Subsurface Bioimaging using Angular Domain Optical Backscattering Illumination. EMBC Fartash Vasefi, Paulman K. Y. Chan, Bozena Kaminska, Glenn H. Chapman
2005	—	`conf`	A highly reconfigurable computing array: DSP plane of a 3D heterogeneous SoC. SoCC Vijay K. Jain, Sanjukta Bhanja, Glenn H. Chapman, Lavanya Doddannagari
2005	—	`conf`	A parallel architecture for the ICA algorithm: DSP plane of a 3-D heterogeneous sensor. ICASSP (5) Vijay K. Jain, Sanjukta Bhanja, Glenn H. Chapman, Lavanya Doddannagari, Nguyen Nguyen
2005	—	`conf`	Inter-Plane Via Defect Detection Using the Sensor Plane in 3-D Heterogeneous Sensor Systems. DFT Glenn H. Chapman, Vijay K. Jain, Shekhar Bhansali
2005	—	`conf`	On-Line Identification of Faults in Fault-Tolerant Imagers. DFT Glenn H. Chapman, Israel Koren, Zahava Koren, Jozsef Dudas, Cory Jung
2004	J	`jnl`	A Self-Correcting Active Pixel Sensor Using Hardware and Software Correction. IEEE Des. Test Comput. Glenn H. Chapman, Sunjaya Djaja, Desmond Y. H. Cheung, Yves Audet, Israel Koren, Zahava Koren
2004	—	`conf`	Characteristics of Fault-Tolerant Photodiode and Photogate Active Pixel Sensor (APS). DFT Michelle L. La Haye, Glenn H. Chapman, Cory Jung, Desmond Y. H. Cheung, Sunjaya Djaja, Benjamin Wang, Gary Liaw, Yves Audet
2004	—	`conf`	Defect Avoidance in a 3-D Heterogeneous Sensor. DFT Glenn H. Chapman, Vijay K. Jain, Shekhar Bhansali
2003	—	`conf`	Implementation and Testing of Fault-Tolerant Photodiode-Based Active Pixel Sensor (APS). DFT Sunjaya Djaja, Glenn H. Chapman, Desmond Y. H. Cheung, Yves Audet
2003	—	`conf`	Level-Hybrid Optoelectronic TESH Interconnection Network. DFT Vijay K. Jain, Glenn H. Chapman
2003	J	`jnl`	Special section on defect and fault tolerance in VLSI systems. Microelectron. J. Régis Leveugle, Glenn H. Chapman
2001	—	`conf`	Advanced Fault-Tolerance Techniques for a Color Digital Camera-on-a-Chip. DFT Israel Koren, Zahava Koren, Glenn H. Chapman
2001	—	`conf`	Design of a Self-Correcting Active Pixel Sensor. DFT Yves Audet, Glenn H. Chapman
2000	—	`conf`	A Self-Correcting Active Pixel Camera. DFT Israel Koren, Zahava Koren, Glenn H. Chapman
1999	—	`conf`	Creating 35 mm Camera Active Pixel Sensors. DFT Glenn H. Chapman, Yves Audet
1998	—	`conf`	FPGA Design for Decimeter Scale Integration (DMSI). DFT Glenn H. Chapman
1998	J	`jnl`	Using Laser Defect Avoidance to Build Large-Area FPGAs. IEEE Des. Test Comput. Glenn H. Chapman, Benoit Dufort
1997	J	`jnl`	Guest Editorial Foreword to the Special Section on WSI'95. IEEE Trans. Very Large Scale Integr. Syst. Stuart K. Tewksbury, Glenn H. Chapman
1997	A	`conf`	Laser Correcting Defects to Create Transparent Routing for Large Area FPGA's. FPGA Glenn H. Chapman, Benoit Dufort
1997	Misc	`conf`	Laser defect correction applications to FPGA based custom computers. FCCM Glenn H. Chapman, Benoit Dufort
1997	J	`jnl`	Yield improvement of a large area magnetic field sensor array using redundancy schemes. IEEE Trans. Very Large Scale Integr. Syst. Yves Audet, Glenn H. Chapman
1996	—	`conf`	Making defect avoidance nearly invisible to the user in wafer scale field programmable gate arrays. DFT Glenn H. Chapman, Benoit Dufort
1995	—	`conf`	Wafer-scale integration defect avoidance tradeoffs between laser links and Omega network switching. DFT Glenn H. Chapman, D. E. Bergen, K. Fang
1994	—	`conf`	Laser Processes for Defect Correction in Large Area VLSI Systems. DFT Glenn H. Chapman
1992	J	`jnl`	Wafer-Scale Transducer Arrays. Computer Glenn H. Chapman, M. Parameswaran, Marek Syrzycki
1988	J	`jnl`	A Monolithic Hough Transform Processor Based on Restructurable VLSI. IEEE Trans. Pattern Anal. Mach. Intell. F. Matthew Rhodes, Joseph J. Dituri, Glenn H. Chapman, Bruce E. Emerson, Antonio M. Soares, Jack I. Raffel