| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2025 | C | conf |
ISCAS
|
| 2024 | — | conf |
SMACD
|
| 2024 | J | jnl |
IEEE Access
|
| 2024 | — | conf |
M&N
|
| 2024 | — | conf |
SMACD
|
| 2024 | — | conf |
M&N
|
| 2023 | C | conf |
ISCAS
|
| 2023 | — | conf |
MetroAutomotive
|
| 2023 | — | conf |
SMACD
|
| 2023 | — | conf |
SMACD
|
| 2023 | — | conf |
EvoApplications@EvoStar
|
| 2022 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2022 | — | conf |
SMACD
|
| 2022 | — | conf |
SMACD
|
| 2022 | — | conf |
WIVACE
|
| 2022 | — | conf |
M&N
|
| 2022 | J | jnl |
IEEE Access
|
| 2021 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2021 | J | jnl |
IEEE Access
|
| 2021 | C | conf |
ISCAS
|
| 2020 | C | conf |
ISCAS
|
| 2020 | — | conf |
ICECS
|
| 2020 | J | jnl |
IEEE Trans. Circuits Syst.
|
| 2020 | — | conf |
ICECS
|
| 2020 | — | conf |
ICECS
|
| 2019 | J | jnl |
IEEE Trans. Circuits Syst. I Regul. Pap.
|
| 2019 | J | jnl |
Integr.
|
| 2019 | — | conf |
SMACD
|
| 2019 | — | conf |
RTSI
|
| 2019 | C | conf |
ISCAS
|
| 2019 | — | conf |
ICECS
|
| 2019 | C | conf |
ISCAS
|
| 2019 | — | conf |
SMACD
|
| 2018 | J | jnl |
IEEE Trans. Circuits Syst. I Regul. Pap.
|
| 2018 | — | conf |
SMACD
|
| 2018 | J | jnl |
Integr.
|
| 2018 | — | conf |
ICECS
|
| 2018 | — | conf |
SMACD
|
| 2018 | — | conf |
ICECS
|
| 2018 | — | conf |
SMACD
|
| 2017 | J | jnl |
Integr.
|
| 2017 | — | conf |
SMACD
|
| 2017 | — | conf |
SMACD
|
| 2017 | — | conf |
SMACD
|
| 2017 | — | conf |
SMACD
|
| 2017 | — | conf |
ICIT
|
| 2017 | — | conf |
ICIT
|
| 2016 | — | conf |
SMACD
|
| 2016 | C | conf |
IECON
|
| 2016 | J | jnl |
Integr.
|
| 2016 | — | conf |
SMACD
|
| 2016 | — | conf |
RTSI
|
| 2016 | — | conf |
RTSI
|
| 2015 | C | conf |
INDIN
|
| 2015 | C | conf |
INDIN
|
| 2015 | C | conf |
INDIN
|
| 2015 | — | conf |
ICIT
|
| 2014 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2014 | — | conf |
Analysis and characterization of power MOSFETs for power converters energy&reliability-aware-design.
ISIE
|
| 2013 | C | conf |
IECON
|
| 2013 | J | jnl |
IEEE Trans. Ind. Electron.
|