Giovanna Mura

30 papers Journal 29Unranked 1
YearRankTypeTitle / Venue / Authors
2023 J jnl
A Curved Microstrip Patch Antenna Designed From Transparent Conductive Films.
IEEE Access
Giorgio Montisci, Giovanna Mura, Giacomo Muntoni, Giovanni Andrea Casula, Francesco Paolo Chietera, Mahmoud Aburish-Hmidat
2018 J jnl
Further improvements of an extended Hakki-Paoli method.
Microelectron. Reliab.
Massimo Vanzi, Giovanna Mura, G. Martines
2018 J jnl
Reliability concerns from the gray market.
Microelectron. Reliab.
Giovanna Mura
2017 J jnl
Practical optical gain by an extended Hakki-Paoli method.
Microelectron. Reliab.
Massimo Vanzi, Giulia Marcello, Giovanna Mura, G. Le Galès, S. Joly, Yannick Deshayes, Laurent Béchou
2017 J jnl
Qualification extension of automotive smart power and digital ICs to harsh aerospace mission profiles: Gaps and opportunities.
Microelectron. Reliab.
Riccardo Enrici Vaion, Matteo Medda, Alberto Mancaleoni, Giovanna Mura, A. Pintus, M. De Tomasi
2016 J jnl
ESD tests on 850 nm GaAs-based VCSELs.
Microelectron. Reliab.
Massimo Vanzi, Giovanna Mura, Giulia Marcello, Kunhui Xiao
2016 J jnl
Single Event Transient acquisition and mapping for space device Characterization.
Microelectron. Reliab.
Roberta Pilia, Guillaume Bascoul, Kevin Sanchez, Giovanna Mura, Fulvio Infante
2015 J jnl
Clamp voltage and ideality factor in laser diodes.
Microelectron. Reliab.
Massimo Vanzi, Giovanna Mura, Giulia Marcello, G. Martines
2015 — conf
Stress-induced instabilities of shunt paths in high efficiency MWT solar cells.
IRPS
Marco Barbato, Matteo Meneghini, Andrea Cester, Alessandro Barbato, Enrico Zanoni, Gaudenzio Meneghesso, Giovanna Mura, Diego Tonini, A. Voltan, Giorgio Cellere
2014 J jnl
FIB-induced electro-optical alterations in a DFB InP laser diode.
Microelectron. Reliab.
Giovanna Mura, Massimo Vanzi, Giulia Marcello
2013 J jnl
"Hot-plugging" of LED modules: Electrical characterization and device degradation.
Microelectron. Reliab.
Matteo Dal Lago, Matteo Meneghini, Nicola Trivellin, Giovanna Mura, Massimo Vanzi, Gaudenzio Meneghesso, Enrico Zanoni
2013 J jnl
Optical losses in single-mode laser diodes.
Microelectron. Reliab.
Massimo Vanzi, Giovanna Mura, M. Marongiu, T. Tomasi
2013 J jnl
The role of the optical trans-characteristics in laser diode analysis.
Microelectron. Reliab.
Giovanna Mura, Massimo Vanzi, Giulia Marcello, Robert Cao
2013 J jnl
Thermal and electrical investigation of the reverse bias degradation of silicon solar cells.
Microelectron. Reliab.
Alessandro Compagnin, Matteo Meneghini, Marco Barbato, Valentina Giliberto, Andrea Cester, Massimo Vanzi, Giovanna Mura, Enrico Zanoni, Gaudenzio Meneghesso
2012 J jnl
Chip and package-related degradation of high power white LEDs.
Microelectron. Reliab.
Matteo Meneghini, Matteo Dal Lago, Nicola Trivellin, Giovanna Mura, Massimo Vanzi, Gaudenzio Meneghesso, Enrico Zanoni
2012 J jnl
MIM capacitor-related early-stage field failures.
Microelectron. Reliab.
Jia Lu, Bocheng Cao, WenShe Wu, Yufeng Dai, ChuangJun Huang, Giovanna Mura
2012 J jnl
Phosphors for LED-based light sources: Thermal properties and reliability issues.
Microelectron. Reliab.
Matteo Dal Lago, Matteo Meneghini, Nicola Trivellin, Giovanna Mura, Massimo Vanzi, Gaudenzio Meneghesso, Enrico Zanoni
2011 J jnl
DC parameters for laser diodes from experimental curves.
Microelectron. Reliab.
Massimo Vanzi, Giovanna Mura, G. Martines
2010 J jnl
The interpretation of the DC characteristics of LED and laser diodes to address their failure analysis.
Microelectron. Reliab.
Giovanna Mura, Massimo Vanzi
2009 J jnl
Lot reliability issues in commercial off the shelf (COTS) microelectronic devices.
Microelectron. Reliab.
Giovanna Mura, Massimo Vanzi
2008 J jnl
Sulfur-contamination of high power white LED.
Microelectron. Reliab.
Giovanna Mura, G. Cassanelli, Fausto Fantini, Massimo Vanzi
2007 J jnl
High temperature electro-optical degradation of InGaN/GaN HBLEDs.
Microelectron. Reliab.
Matteo Meneghini, Lorenzo Trevisanello, C. Sanna, Giovanna Mura, Massimo Vanzi, Gaudenzio Meneghesso, Enrico Zanoni
2006 J jnl
Failure Analysis-assisted FMEA.
Microelectron. Reliab.
G. Cassanelli, Giovanna Mura, Fausto Fantini, Massimo Vanzi, Bernard Plano
2005 J jnl
Reliability predictions in electronic industrial applications.
Microelectron. Reliab.
G. Cassanelli, Giovanna Mura, F. Cesaretti, Massimo Vanzi, Fausto Fantini
2004 J jnl
Failure analysis of RFIC amplifiers.
Microelectron. Reliab.
Giovanna Mura, Massimo Vanzi, G. Micheletti
2003 J jnl
On the behaviour of the selective iodine-based gold etch for the failure analysis of aged optoelectronic devices.
Microelectron. Reliab.
Giovanna Mura, Massimo Vanzi, Maria Stangoni, Mauro Ciappa, Wolfgang Fichtner
2003 J jnl
Reliability of visible GaN LEDs in plastic package.
Microelectron. Reliab.
Gaudenzio Meneghesso, S. Levada, Enrico Zanoni, Gaetano Scamarcio, Giovanna Mura, Simona Podda, Massimo Vanzi, S. Du, I. Eliashevich
2002 J jnl
An automated lifetest equipment for optical emitters.
Microelectron. Reliab.
M. Giglio, G. Martines, Giovanna Mura, Simona Podda, Massimo Vanzi
2002 J jnl
Backside Failure Analysis of GaAs ICs after ESD tests.
Microelectron. Reliab.
Gaudenzio Meneghesso, A. Cocco, Giovanna Mura, Simona Podda, Massimo Vanzi
2002 J jnl
ESD protection structures for 20 V and 40 V power supply suitable for BCD6 smart power technology.
Microelectron. Reliab.
Luca Sponton, Lorenzo Cerati, Giuseppe Croce, Giovanna Mura, Simona Podda, Massimo Vanzi, Gaudenzio Meneghesso, Enrico Zanoni