Gilson I. Wirth

57 papers A* 1A 1B 1C 5Journal 24Unranked 25
YearRankTypeTitle / Venue / Authors
2026 — conf
An Analysis of Time-Domain Period Jitter due to Random Telegraph Noise in Phase-Locked Loops.
LATS
Caroline P. Garcia, Gilson I. Wirth
2025 J jnl
Impact of Observation Time Window on RTN-Induced Jitter in CMOS Ring Oscillators.
IEEE Access
Gilson I. Wirth, Caroline P. Garcia, Guillermo L. Nogueira
2025 — conf
Jitter Due to Random Telegraph Noise in Voltage-Controlled Oscillators Based on Ring Oscillators.
LASCAS
Caroline P. Garcia, Bernardo Lourosa, Gilson I. Wirth
2025 J jnl
Modeling and Predicting Noise-Induced Failure Rates in Ultra-Low-Voltage SRAM Bitcells Affected by Process Variations.
IEEE Trans. Circuits Syst. I Regul. Pap.
Léopold Van Brandt, Michele Bonnin, Maurício Banaszeski da Silva, Pascal Bolcato, Gilson I. Wirth, Denis Flandre, Jean-Charles Delvenne
2023 J jnl
Random Telegraph Noise in Analog CMOS Circuits.
IEEE Trans. Circuits Syst. I Regul. Pap.
Maurício Banaszeski da Silva, Gilson I. Wirth, Hans P. Tuinhout, Adrie Zegers-van Duijnhoven, Andries J. Scholten
2021 — conf
Modeling and Simulation of Charge Trapping in 1/f Noise, RTN and BTI: from Devices to Circuits.
MIXDES
Gilson I. Wirth
2020 J jnl
TID effects on I-V characteristics of bulk CMOS STD and ELT-based devices in 600 nm.
Microelectron. J.
Pablo Ilha Vaz, Gilson I. Wirth, Fábio Fedrizzi Vidor, Thiago Hanna Both
2018 J jnl
A TCAD evaluation of a single Bulk-BICS with integrative memory cell.
Microelectron. J.
Alexandre Simionovski, Gilson I. Wirth, Ronald D. Schrimpf, Bharat L. Bhuva
2018 J jnl
Design Flow Methodology for Radiation Hardened by Design CMOS Enclosed-Layout-Transistor-Based Standard-Cell Library.
J. Electron. Test.
Pablo Ilha Vaz, Thiago Hanna Both, Fábio Fedrizzi Vidor, Raphael Martins Brum, Gilson I. Wirth
2018 — conf
Time domain electrical characterization in zinc oxide nanoparticle thin-film transistors.
LATS
Thales E. Becker, Fábio Fedrizzi Vidor, Gilson I. Wirth, Thorsten Meyers, Julia Reker, Ulrich Hilleringmann
2017 — conf
Self-aligned ZnO nanoparticle-based TFTs for flexible electronics.
AFRICON
Fábio Fedrizzi Vidor, Gilson I. Wirth, Thorsten Meyers, Julia Reker, Ulrich Hilleringmann
2016 — conf
MagPDK: An open-source process design kit for circuit design with magnetic tunnel junctions.
SBCCI
Raphael Martins Brum, Gilson I. Wirth
2016 J jnl
Rail to rail radiation hardened operational amplifier in standard CMOS technology with standard layout techniques.
Microelectron. Reliab.
Peterson R. Agostinho, Odair Lelis Goncalez, Gilson I. Wirth
2015 J jnl
Adding a self-reset feature to the Bulk-BICS with dynamic storage cell.
Microelectron. Reliab.
Alexandre Simionovski, Gilson I. Wirth
2015 J jnl
Impact of Total Ionizing Dose on Bulk Built-In Current Sensors with Dynamic Storage Cell.
J. Electron. Test.
Alexandre Simionovski, Rafael Galhardo Vaz, Odair Lelis Goncalez, Gilson I. Wirth
2015 — conf
Impact of dynamic voltage scaling and thermal factors on FinFET-based SRAM reliability.
ICECS
Felipe Rosa, Raphael Martins Brum, Gilson I. Wirth, Luciano Ost, Ricardo Reis
2015 J jnl
Impact of dynamic voltage scaling and thermal factors on SRAM reliability.
Microelectron. Reliab.
Felipe Rosa, Raphael Martins Brum, Gilson I. Wirth, Fernanda Gusmão de Lima Kastensmidt, Luciano Ost, Ricardo Reis
2014 B conf
Aging and voltage scaling impacts under neutron-induced soft error rate in SRAM-based FPGAs.
ETS
Fernanda Lima Kastensmidt, Jorge L. Tonfat, Thiago Hanna Both, Paolo Rech, Gilson I. Wirth, Ricardo Reis, Florent Bruguier, Pascal Benoit, Lionel Torres, Christopher Frost
2014 J jnl
Circuit simulation of workload-dependent RTN and BTI based on trap kinetics.
Microelectron. Reliab.
Vinicius V. A. Camargo, Ben Kaczer, Tibor Grasser, Gilson I. Wirth
2014 J jnl
Low temperature fabrication of a ZnO nanoparticle thin-film transistor suitable for flexible electronics.
Microelectron. Reliab.
Fábio Fedrizzi Vidor, Gilson I. Wirth, Ulrich Hilleringmann
2014 J jnl
Use of SSTA Tools for Evaluating BTI Impact on Combinational Circuits.
IEEE Trans. Very Large Scale Integr. Syst.
Vinicius V. A. Camargo, Ben Kaczer, Gilson I. Wirth, Tibor Grasser, Guido Groeseneken
2014 J jnl
Voltage scaling and aging effects on soft error rate in SRAM-based FPGAs.
Microelectron. Reliab.
Fernanda Lima Kastensmidt, Jorge L. Tonfat, Thiago Hanna Both, Paolo Rech, Gilson I. Wirth, Ricardo Reis, Florent Bruguier, Pascal Benoit, Lionel Torres, Christopher Frost
2013 — conf
Voltage reference design using 1 V power supply in 0.13 µm CMOS technology.
LASCAS
Dalton M. Colombo, Gilson I. Wirth, Sergio Bampi, P. Srinivasan
2012 J jnl
Compact modeling and simulation of Random Telegraph Noise under non-stationary conditions in the presence of random dopants.
Microelectron. Reliab.
Gilson I. Wirth, Dragica Vasileska, N. Ashraf, Lucas Brusamarello, R. Della Giustina, P. Srinivasan
2011 J jnl
Fast and accurate statistical characterization of standard cell libraries.
Microelectron. Reliab.
Lucas Brusamarello, Gilson I. Wirth, Philippe Roussel, Miguel Miranda
2011 — conf
Semiconductor nanoparticles for electronic device integration on foils.
AFRICON
Ulrich Hilleringmann, K. Wolff, F. Assion, Fábio Fedrizzi Vidor, Gilson I. Wirth
2011 A* conf
Statistical characterization of standard cells using design of experiments with response surface modeling.
DAC
Miguel Miranda, Philippe Roussel, Lucas Brusamarello, Gilson I. Wirth
2010 — conf
Modeling the impact of RTS on the reliability of ring oscillators.
SBCCI
Maurício Banaszeski da Silva, Gilson I. Wirth
2009 — conf
An experimental 0.6-V 57.5-fJ/conversion-step 250-kS/s 8-bit rail-to-rail successive approximation ADC in 0.18µm CMOS.
ICECS
Christian Jesús B. Fayomi, Gilson I. Wirth, David M. Binkley, Akira Matsuzawa
2009 — conf
Measuring the effectiveness of symmetric and asymmetric transistor sizing for Single Event Transient mitigation in CMOS 90nm technologies.
LATW
Thiago Assis, Fernanda Lima Kastensmidt, Gilson I. Wirth, Ricardo Reis
2009 — conf
NBTI-aware technique for transistor sizing of high-performance CMOS gates.
LATW
Maurício Banaszeski da Silva, Vinicius V. A. Camargo, Lucas Brusamarello, Gilson I. Wirth, Roberto da Silva
2009 — conf
Protecting digital circuits against hold time violation due to process variability.
SBCCI
Gustavo Neuberger, Gilson I. Wirth, Ricardo Reis
2009 J jnl
Statistical RTS model for digital circuits.
Microelectron. Reliab.
Lucas Brusamarello, Gilson I. Wirth, Roberto da Silva
2009 — conf
Using Bulk Built-In Current Sensors and recomputing techniques to mitigate transient faults in microprocessors.
LATW
Franco Leite, Tiago R. Balen, Marcos Hervé, Marcelo Lubaszewski, Gilson I. Wirth
2008 C conf
"The flipped voltage follower"-based low voltage fully differential CMOS sample-and-hold circuit.
ISCAS
Christian Jesús B. Fayomi, Gilson I. Wirth, Jaime Ramírez-Angulo, Akira Matsuzawa
2008 J jnl
Bulk built in current sensors for single event transient detection in deep-submicron technologies.
Microelectron. Reliab.
Gilson I. Wirth
2008 C conf
Device degradation and resilient computing.
ISCAS
Peter Glösekötter, Ulrich Greveler, Gilson I. Wirth
2008 J jnl
Mitigating Soft Errors in SRAM Address Decoders Using Built-in Current Sensors.
J. Electron. Test.
Egas Henes Neto, Gilson I. Wirth, Fernanda Lima Kastensmidt
2008 J jnl
Modeling the sensitivity of CMOS circuits to radiation induced single event transients.
Microelectron. Reliab.
Gilson I. Wirth, Michele G. Vieira, Egas Henes Neto, Fernanda Lima Kastensmidt
2008 J jnl
Probabilistic Approach for Yield Analysis of Dynamic Logic Circuits.
IEEE Trans. Circuits Syst. I Regul. Pap.
Lucas Brusamarello, Roberto da Silva, Gilson I. Wirth, Ricardo A. L. Reis
2007 — conf
A built-in current sensor for high speed soft errors detection robust to process and temperature variations.
SBCCI
Egas Henes Neto, Fernanda Lima Kastensmidt, Gilson I. Wirth
2007 J jnl
Accurate and computer efficient modelling of single event transients in CMOS circuits.
IET Circuits Devices Syst.
Gilson I. Wirth, Michele G. Vieira, Fernanda Gusmão de Lima Kastensmidt
2007 C conf
Obtaining delay distribution of dynamic logic circuits by error propagation at the electrical level.
VLSI-SoC
Lucas Brusamarello, Roberto da Silva, Gilson I. Wirth, Ricardo A. L. Reis
2007 — conf
Statistical Analysis of Normality of Systematic and Random Variability of Flip-Flop Race Immunity in 130nm and 90nm CMOS Technologies.
VLSI-SoC (Selected Papers)
Gustavo Neuberger, Gilson I. Wirth, Fernanda Gusmão de Lima Kastensmidt, Ricardo Reis
2007 C conf
Statistical analysis of systematic and random variability of flip-flop race immunity in 130nm and 90nm CMOS technologies.
VLSI-SoC
Gustavo Neuberger, Fernanda Gusmão de Lima Kastensmidt, Ricardo Reis, Gilson I. Wirth, Ralf Brederlow, Christian Pacha
2007 — conf
Statistical and Numerical Approach for a Computer efficient circuit yield analysis.
VLSI-SoC (Selected Papers)
Lucas Brusamarello, Roberto da Silva, Gilson I. Wirth, Ricardo Reis
2007 — conf
The Bulk Built In Current Sensor Approach for Single Event Transient Detection.
SoC
Gilson I. Wirth, Christian Fayomi
2007 — conf
Trim range limited by noise in bandgap voltage references.
SBCCI
Dalton M. Colombo, Gilson I. Wirth, Sergio Bampi
2007 J jnl
Técnicas probabilísticas para análise de yield em nível elétrico usando propagação de erros e derivadas numéricas.
RITA
Lucas Brusamarello, Roberto da Silva, Gilson I. Wirth, Ricardo Augusto da Luz Reis
2007 A conf
Using built-in sensors to cope with long duration transient faults in future technologies.
ITC
Carlos Arthur Lang Lisbôa, Fernanda Lima Kastensmidt, Egas Henes Neto, Gilson I. Wirth, Luigi Carro
2007 — conf
Yield Analysis by Error Propagation Using Numerical Derivatives Considering WD and D2D variations.
ISVLSI
Lucas Brusamarello, Roberto da Silva, Ricardo A. L. Reis, Gilson I. Wirth
2006 C conf
Generation and Propagation of Single Event Transients in CMOS Circuits.
DDECS
Gilson I. Wirth, Michele G. Vieira, Egas Henes Neto, Fernanda Gusmão de Lima Kastensmidt
2006 — conf
Single event transients in dynamic logic.
SBCCI
Gilson I. Wirth, Ivandro Ribeiro, Michele G. Vieira, Fernanda Gusmão de Lima Kastensmidt
2006 J jnl
Using Bulk Built-in Current Sensors to Detect Soft Errors.
IEEE Micro
Egas Henes Neto, Ivandro Ribeiro, Michele G. Vieira, Gilson I. Wirth, Fernanda Lima Kastensmidt
2005 — conf
Evaluating fault coverage of bulk built-in current sensor for soft errors in combinational and sequential logic.
SBCCI
Egas Henes Neto, Ivandro Ribeiro, Michele G. Vieira, Gilson I. Wirth, Fernanda Lima Kastensmidt
2005 — conf
Single event transients in combinatorial circuits.
SBCCI
Gilson I. Wirth, Michele G. Vieira, Egas Henes Neto, Fernanda Gusmão de Lima Kastensmidt
2000 — conf
Digital Circuit Design Based on the Resonant-Tunneling-Hetero-Junction-Bipolar-Transistor.
SBCCI
Peter Glösekötter, Christian Pacha, Karl F. Goser, Gilson I. Wirth, Werner Prost, Uwe Auer, M. Agethen, P. Velling, Franz-Josef Tegude