| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2025 | C | conf |
IOLTS
|
| 2023 | B | conf |
ETS
|
| 2023 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2022 | — | conf |
ICECS 2022
|
| 2022 | J | jnl |
IEEE Des. Test
|
| 2022 | B | conf |
ETS
|
| 2021 | J | jnl |
IEEE Trans. Circuits Syst. I Regul. Pap.
|
| 2020 | J | jnl |
Integr.
|
| 2020 | — | conf |
NEWCAS
|
| 2020 | — | conf |
NEWCAS
|
| 2019 | — | conf |
SMACD
|
| 2019 | — | conf |
SMACD
|
| 2019 | — | conf |
SMACD
|
| 2019 | A | conf |
DATE
|
| 2019 | — | conf |
DCIS
|
| 2019 | C | conf |
ISCAS
|
| 2018 | C | conf |
IOLTS
|
| 2018 | C | conf |
ISCAS
|
| 2018 | — | conf |
DCIS
|
| 2017 | A | conf |
DATE
|
| 2016 | J | jnl |
Integr.
|
| 2016 | J | jnl |
J. Electron. Test.
|
| 2016 | B | conf |
ETS
|
| 2016 | B | conf |
ETS
|
| 2015 | J | jnl |
IEEE Des. Test
|
| 2015 | B | conf |
ETS
|
| 2015 | A | conf |
DATE
|
| 2015 | A | conf |
DATE
|
| 2015 | Misc | conf |
VTS
|
| 2014 | — | conf |
ICECS
|
| 2014 | — | conf |
DTIS
|
| 2014 | A | conf |
DATE
|
| 2013 | B | conf |
ETS
|
| 2013 | — | conf |
LASCAS
|
| 2012 | — | conf |
LATW
|
| 2012 | B | conf |
ETS
|
| 2011 | J | jnl |
J. Electron. Test.
|
| 2011 | — | conf |
Asian Test Symposium
|
| 2010 | J | jnl |
IEEE Trans. Circuits Syst. I Regul. Pap.
|
| 2009 | J | jnl |
IEEE Trans. Circuits Syst. I Regul. Pap.
|
| 2006 | B | conf |
ETS
|
| 2005 | J | jnl |
IEEE Trans. Circuits Syst. I Regul. Pap.
|
| 2005 | J | jnl |
J. Electron. Test.
|
| 2004 | A | conf |
DATE
|
| 2004 | A | conf |
DATE
|
| 2004 | J | jnl |
IEEE Trans. Circuits Syst. I Regul. Pap.
|
| 2002 | — | conf |
LATW
|
| 2002 | Misc | conf |
VTS
|
| 2002 | — | conf |
Practical solutions for the application of the oscillation-based-test in analog integrated circuits.
ISCAS (1)
|