Gianluca Boselli

15 papers Journal 6Unranked 9
YearRankTypeTitle / Venue / Authors
2023 — conf
Impact of Thin-oxide Gate on the On-Resistance of HV-PNP Under ESD Stress.
IRPS
M. Monishmurali, Nagothu Karmel Kranthi, Gianluca Boselli, Mayank Shrivastava
2023 — conf
TCAD study of the Holding-Voltage Modulation in Irradiated SCR-LDMOS for HV ESD Protection.
IRPS
Laura Zunarelli, Luigi Balestra, Susanna Reggiani, Raj Sankaralingam, Mariano Dissegna, Gianluca Boselli
2022 — conf
Effect of Source & Drain Side Abutting on the Low Current Filamentation in LDMOS-SCR Devices.
IRPS
M. Monishmurali, Nagothu Karmel Kranthi, Gianluca Boselli, Mayank Shrivastava
2022 — conf
TCAD Investigation of Power-to-Failure Evaluation for Ultrafast Events in BJT-based ESD Protection Cells.
IRPS
Laura Zunarelli, Susanna Reggiani, Elena Gnani, Raj Sankaralingam, Mariano Dissegna, Gianluca Boselli
2020 — conf
Design Insights to Address Low Current ESD Failure and Power Scalability Issues in High Voltage LDMOS-SCR Devices.
IRPS
Nagothu Karmel Kranthi, Boeila Sampath Kumar, Akram A. Salman, Gianluca Boselli, Mayank Shrivastava
2020 — conf
How to Achieve Moving Current Filament in High Voltage LDMOS Devices: Physical Insights & Design Guidelines for Self-Protected Concepts.
IRPS
Nagothu Karmel Kranthi, Chirag Garg, Boeila Sampath Kumar, Akram A. Salman, Gianluca Boselli, Mayank Shrivastava
2019 — conf
Current Filament Dynamics Under ESD Stress in High Voltage (Bidirectional) SCRs and It's Implications on Power Law Behavior.
IRPS
Nagothu Karmel Kranthi, Akram A. Salman, Gianluca Boselli, Mayank Shrivastava
2019 — conf
Physical Insights into the Low Current ESD Failure of LDMOS-SCR and its Implication on Power Scalability.
IRPS
Nagothu Karmel Kranthi, Boeila Sampath Kumar, Akram A. Salman, Gianluca Boselli, Mayank Shrivastava
2016 J jnl
Improved inductive-system-level IEC ESD performance for automotive applications using mutual ballasted ESD protection technique.
Microelectron. Reliab.
Akram A. Salman, Farzan Farbiz, Ann Concannon, Hal Edwards, Gianluca Boselli
2012 J jnl
ESD design challenges in state-of-the-art analog technologies.
Microelectron. Reliab.
Gianluca Boselli
2012 — conf
Electronic design automation (EDA) solutions for ESD-robust design and verification.
CICC
Michael G. Khazhinsky, Shuqing Cao, Harald Gossner, Gianluca Boselli, Melanie Etherton
2006 J jnl
Gate oxide failures due to anomalous stress from HBM ESD testers.
Microelectron. Reliab.
Charvaka Duvvury, Robert Steinhoff, Gianluca Boselli, Vijay Reddy, Hans Kunz, Steve Marum, Roger Cline
2005 J jnl
A MOSFET power supply clamp with feedback enhanced triggering for ESD protection in advanced CMOS technologies.
Microelectron. Reliab.
Jeremy C. Smith, Gianluca Boselli
2005 J jnl
Trends and challenges to ESD and Latch-up designs for nanometer CMOS technologies.
Microelectron. Reliab.
Gianluca Boselli, Charvaka Duvvury
2001 J jnl
Investigations on double-diffused MOS transistors under ESD zap conditions.
Microelectron. Reliab.
Gianluca Boselli, Stan Meeuwsen, Ton J. Mouthaan, Fred G. Kuper