Gerard Coquery

14 papers Journal 11Unranked 3
YearRankTypeTitle / Venue / Authors
2017 J jnl
Power module thermal cycling tester for in-situ ageing detection.
Microelectron. Reliab.
Philippe Pougnet, Gerard Coquery, Richard Lallemand, A. Makhloufi
2014 J jnl
Description of supercapacitor performance degradation rate during thermal cycling under constant voltage ageing test.
Microelectron. Reliab.
Mohamed Ayadi, Olivier Briat, Richard Lallemand, Akram Eddahech, Ronan German, Gerard Coquery, Jean-Michel Vinassa
2014 — conf
Influence of thermal cycling on supercapacitor performance fading during ageing test at constant voltage.
ISIE
Mohamed Ayadi, Olivier Briat, Richard Lallemand, Gerard Coquery, Jean-Michel Vinassa
2014 — conf
Reliability assesment in the design of interleaved converters under multi-physical constraints.
ISIE
Mahraz Bendali, Chérif Larouci, Toufik Azib, Claude Marchand, Gerard Coquery
2013 — conf
Design methodology with optimization of an interleaved buck converter for automotive application.
EUROCON
Mahraz Bendali, Chérif Larouci, Toufik Azib, Claude Marchand, Gerard Coquery
2013 J jnl
Space-Vector PWM Control Synthesis for an H-Bridge Drive in Electric Vehicles.
IEEE Trans. Veh. Technol.
Abdelfatah Kolli, Olivier Bethoux, Alexandre De Bernardinis, Eric Labouré, Gerard Coquery
2013 J jnl
Thermal cycling impacts on supercapacitor performances during calendar ageing.
Microelectron. Reliab.
Mohamed Ayadi, Olivier Briat, Akram Eddahech, Ronan German, Gerard Coquery, Jean-Michel Vinassa
2011 J jnl
Investigation of the heel crack mechanism in Al connections for power electronics modules.
Microelectron. Reliab.
Y. Celnikier, Lahouari Benabou, Laurent Dupont, Gerard Coquery
2011 J jnl
Optimization of wire connections design for power electronics.
Microelectron. Reliab.
Y. Celnikier, Laurent Dupont, E. Hervé, Gerard Coquery, Lahouari Benabou
2010 J jnl
Experimental and numerical results correlation during extreme use of power MOSFET designed for avalanche functional mode.
Microelectron. Reliab.
Laurent Dupont, J. L. Blanchard, Richard Lallemand, Gerard Coquery, Jean-Michel Morelle, G. Blondel, B. Rouleau
2010 J jnl
Study of Accelerated Aging of Supercapacitors for Transport Applications.
IEEE Trans. Ind. Electron.
A. Hammar, Pascal Venet, Richard Lallemand, Gerard Coquery, Gérard Rojat
2009 J jnl
Accelerated active ageing test on SiC JFETs power module with silver joining technology for high temperature application.
Microelectron. Reliab.
Laurent Dupont, Gerard Coquery, K. Kriegel, A. Melkonyan
2003 J jnl
High temperature reliability on automotive power modules verified by power cycling tests up to 150degreeC.
Microelectron. Reliab.
Gerard Coquery, Guy Lefranc, T. Licht, Richard Lallemand, Norbert Seliger, H. Berg
2001 J jnl
Power module lifetime estimation from chip temperature direct measurement in an automotive traction inverter.
Microelectron. Reliab.
Gerard Coquery, S. Carubelli, Jean-Pierre Ousten, Richard Lallemand, Frederic Lecoq, Dominique Lhotellier, V. de Viry, Philippe Dupuy