Gerard A. Allan

12 papers Journal 3Unranked 9

Year	Rank	Type	Title / Venue / Authors
2000	—	`conf`	IC Critical Volume Calculation through Ray-Casting of CSG Trees. DFT Mike Moran, Gerard A. Allan
2000	J	`jnl`	Yield prediction by sampling IC layout. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Gerard A. Allan
1999	J	`jnl`	Efficient extra material critical area algorithms. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Gerard A. Allan, Anthony J. Walton
1998	—	`conf`	A Comparison of Efficient Dot Throwing and Shape Shifting Extra Material Critical Area Estimation. DFT Gerard A. Allan
1997	—	`conf`	Efficient critical area estimation for arbitrary defect shapes. DFT Gerard A. Allan, Anthony J. Walton
1996	—	`conf`	Application of a Survey Sampling Critical Area Computation Tool in a Manufacturing Environment. DFT Frederic Duvivier, Gerard A. Allan
1996	—	`conf`	Integration of DFM Techniques and Design Automation. DFT Thomas G. Waring, Gerard A. Allan, Anthony J. Walton
1996	—	`conf`	Yield Prediction by Sampling with the EYES Tool. DFT Gerard A. Allan, Anthony J. Walton
1995	—	`conf`	Critical area extraction of extra material soft faults. DFT Gerard A. Allan, Anthony J. Walton
1995	—	`conf`	Hierarchical critical area extraction with the EYE tool. DFT Gerard A. Allan, Anthony J. Walton
1994	—	`conf`	Efficient Critical Area Algorithms and Their Application to Yield Improvement and Test Strategies. DFT Gerard A. Allan, Anthony J. Walton
1992	J	`jnl`	A yield improvement technique for IC layout using local design rules. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Gerard A. Allan, Anthony J. Walton, Robert J. Holwill