George Theodorou

11 papers A 2B 1C 4Journal 2Unranked 2

Year	Rank	Type	Title / Venue / Authors
2024	—	`conf`	On Explaining and Reasoning About Optical Fiber Link Problems. xAI (2) George Theodorou, Sophia Karagiorgou, Annamaria Fulignoli, Roberto Magri
2021	J	`jnl`	A 3.3 Gbps CCSDS 123.0-B-1 Multispectral & Hyperspectral Image Compression Hardware Accelerator on a Space-Grade SRAM FPGA. IEEE Trans. Emerg. Top. Comput. Antonis Tsigkanos, Nektarios Kranitis, George Theodorou, Antonis M. Paschalis
2018	—	`conf`	The Use of CT Scans and 3D Modeling as a Powerful Tool to Assist Fossil Vertebrate Taxonomy. EuroMed (1) George Theodorou, Yiannis Bassiakos, Evangelos Tsakalos, Evyenia Yiannouli, Petros Maniatis
2015	C	`conf`	A single chip dependable and adaptable payload Data Processing Unit. IOLTS Nektarios Kranitis, Antonis Tsigkanos, George Theodorou, Ioannis Sideris, Antonis M. Paschalis
2014	C	`conf`	Power-aware optimization of software-based self-test for L1 caches in microprocessors. IOLTS George Theodorou, Nektarios Kranitis, Antonis M. Paschalis, Dimitris Gizopoulos
2012	B	`conf`	A Software-Based Self-Test methodology for on-line testing of data TLBs. ETS George Theodorou, Serafeim Chatzopoulos, Nektarios Kranitis, Antonis M. Paschalis, Dimitris Gizopoulos
2011	A	`conf`	A Software-Based Self-Test methodology for on-line testing of processor caches. ITC George Theodorou, Nektarios Kranitis, Antonis M. Paschalis, Dimitris Gizopoulos
2010	C	`conf`	A software-based self-test methodology for in-system testing of processor cache tag arrays. IOLTS George Theodorou, Nektarios Kranitis, Antonis M. Paschalis, Dimitris Gizopoulos
2008	C	`conf`	Directed Random SBST Generation for On-Line Testing of Pipelined Processors. IOLTS Andreas Merentitis, George Theodorou, Mihalis Giorgaras, Nektarios Kranitis
2008	J	`jnl`	Hybrid-SBST Methodology for Efficient Testing of Processor Cores. IEEE Des. Test Comput. Nektarios Kranitis, Andreas Merentitis, George Theodorou, Antonis M. Paschalis, Dimitris Gizopoulos
2006	A	`conf`	Optimal periodic testing of intermittent faults in embedded pipelined processor applications. DATE Nektarios Kranitis, Andreas Merentitis, Nikolaos Laoutaris, George Theodorou, Antonis M. Paschalis, Dimitris Gizopoulos, Constantin Halatsis

Chang Liu, Noah Fleischmann, Nicolò Altamura, Edward Raff, James Holt, Kristopher Micinski