| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2025 | — | conf |
ICM
|
| 2025 | — | conf |
ICM
|
| 2025 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2024 | — | conf |
AIM
|
| 2024 | — | conf |
ICCMA
|
| 2024 | — | conf |
AIM
|
| 2024 | — | conf |
AIM
|
| 2024 | — | conf |
Direct Phase Correction in Phase Locked Loop for Robust Lissajous Scanning of Resonant MEMS Mirrors.
AIM
|
| 2024 | — | conf |
AIM
|
| 2024 | — | conf |
AIM
|
| 2024 | — | conf |
AIM
|
| 2024 | J | jnl |
J. Opt. Commun. Netw.
|
| 2024 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2024 | C | conf |
IECON
|
| 2024 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2024 | J | jnl |
J. Opt. Commun. Netw.
|
| 2024 | J | jnl |
IEEE Trans. Aerosp. Electron. Syst.
|
| 2024 | — | conf |
AIM
|
| 2024 | — | conf |
AIM
|
| 2024 | — | conf |
Reducing the uncertainty of laser straightness measurements via local saturation of imaging sensors.
AIM
|
| 2024 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2023 | — | conf |
I2MTC
|
| 2023 | C | conf |
IECON
|
| 2023 | C | conf |
IECON
|
| 2023 | J | jnl |
IEEE Trans. Aerosp. Electron. Syst.
|
| 2023 | C | conf |
ACC
|
| 2023 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2023 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2023 | — | conf |
I2MTC
|
| 2023 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2023 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2023 | — | conf |
I2MTC
|
| 2023 | C | conf |
IECON
|
| 2022 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2022 | — | conf |
AIM
|
| 2022 | C | conf |
ETFA
|
| 2022 | — | conf |
I2MTC
|
| 2022 | — | conf |
AIM
|
| 2022 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2022 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2022 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2022 | — | conf |
AIM
|
| 2022 | — | conf |
AIM
|
| 2022 | — | conf |
AIM
|
| 2022 | — | conf |
I2MTC
|
| 2022 | — | conf |
I2MTC
|
| 2022 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2022 | — | conf |
AIM
|
| 2022 | — | conf |
I2MTC
|
| 2022 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2021 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2021 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2021 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2021 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2021 | J | jnl |
Elektrotech. Informationstechnik
|
| 2021 | — | conf |
ICM
|
| 2021 | C | conf |
ETFA
|
| 2021 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2021 | J | jnl |
Elektrotech. Informationstechnik
|
| 2020 | C | conf |
IECON
|
| 2020 | — | conf |
AIM
|
| 2020 | — | conf |
AIM
|
| 2020 | — | conf |
AIM
|
| 2020 | — | conf |
I2MTC
|
| 2020 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2020 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2020 | — | conf |
I2MTC
|
| 2020 | — | conf |
Self-Aligning Scanning Shack-Hartmann Sensor for Automatic Wavefront Measurements of High-NA Optics.
I2MTC
|
| 2020 | J | jnl |
CoRR
|
| 2019 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2018 | — | conf |
CCTA
|
| 2018 | C | conf |
ETFA
|
| 2018 | — | conf |
AIM
|
| 2018 | J | jnl |
Elektrotech. Informationstechnik
|
| 2018 | J | jnl |
Elektrotech. Informationstechnik
|
| 2018 | — | conf |
AMC
|
| 2018 | J | jnl |
Elektrotech. Informationstechnik
|
| 2018 | — | conf |
AIM
|
| 2017 | C | conf |
ETFA
|
| 2017 | — | conf |
AIM
|
| 2017 | — | conf |
AIM
|
| 2017 | — | conf |
AIM
|
| 2017 | C | conf |
ACC
|
| 2017 | C | conf |
ETFA
|
| 2017 | — | conf |
CCTA
|
| 2017 | J | jnl |
J. Intell. Manuf.
|
| 2016 | — | conf |
ICIT
|
| 2016 | C | conf |
ETFA
|
| 2016 | C | conf |
ACC
|
| 2016 | C | conf |
ETFA
|
| 2016 | C | conf |
ACC
|
| 2016 | C | conf |
ETFA
|
| 2016 | C | conf |
ACC
|
| 2016 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2015 | — | conf |
AIM
|
| 2015 | J | jnl |
Autom.
|
| 2015 | J | jnl |
Elektrotech. Informationstechnik
|
| 2015 | — | conf |
I2MTC
|
| 2013 | C | conf |
IECON
|
| 2013 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2013 | — | conf |
ECC
|
| 2012 | J | jnl |
Elektrotech. Informationstechnik
|
| 2012 | J | jnl |
Elektrotech. Informationstechnik
|
| 2012 | J | jnl |
Schnelle Rasterkraftmikroskopie durch moderne Regelungstechnik und mechatronische Systemintegration.
Elektrotech. Informationstechnik
|
| 2011 | J | jnl |
Eur. J. Control
|
| 2010 | C | conf |
ACC
|
| 2009 | — | conf |
ECC
|
| 2009 | — | conf |
ECC
|
| 2008 | — | conf |
CDC
|
| 2008 | C | conf |
ACC
|
| 2007 | C | conf |
ACC
|
| 2007 | C | conf |
ACC
|
| 2007 | J | jnl |
IEEE Trans. Control. Syst. Technol.
|
| 2006 | C | conf |
ACC
|
| 2005 | J | jnl |
Eur. J. Control
|
| 2004 | J | jnl |
IEEE Trans. Control. Syst. Technol.
|
| 2003 | C | conf |
ACC
|