Geneviève Duchamp

15 papers Journal 12Unranked 3
YearRankTypeTitle / Venue / Authors
2025 — conf
Investigation Into the Moisture Degradation Mechanism of Integrated Stacks Using New Moisture Sensor Design.
IRPS
B. Ayoub, G. Imbert, F. Belfis, T. Parrassin, Sébastien Gallois-Garreignot, L. Mischler, Geneviève Duchamp, Hélène Frémont
2024 — conf
Susceptibility of an Analog Temperature Measurement Function: First Step to Optimize the IEMI Waveform.
EMC Compo
Antoine Duguet, Tristan Dubois, Geneviève Duchamp, David Hardy, Franck Salvador
2018 J jnl
Effects of HPEM stress on GaAs low-noise amplifier from circuit to component scale.
Microelectron. Reliab.
M. Girard, Tristan Dubois, Patrick Hoffmann, Geneviève Duchamp
2017 J jnl
Effects of ageing on the conducted immunity of a voltage reference: Experimental study and modelling approach.
Microelectron. Reliab.
S. Hairoud-Airieau, Geneviève Duchamp, Tristan Dubois, Jean-Yves Delétage, André Durier, Hélène Frémont
2015 J jnl
A New Method for the Characterization of Electronic Components Immunity.
IEEE Trans. Instrum. Meas.
Ala Ayed, Tristan Dubois, Jean-Luc Levant, Geneviève Duchamp
2015 J jnl
Characterization and model of temperature effect on the conducted immunity of Op-Amp.
Microelectron. Reliab.
Tristan Dubois, Siham Hairoud, Marcio Hermany Gomes de Oliveira, Hélène Frémont, Geneviève Duchamp
2015 J jnl
Failure mechanism study and immunity modeling of an embedded analog-to-digital converter based on immunity measurements.
Microelectron. Reliab.
Ala Ayed, Tristan Dubois, Jean-Luc Levant, Geneviève Duchamp
2014 J jnl
Qualification procedure for moisture in embedded capacitors.
Microelectron. Reliab.
Hélène Frémont, Jörg Kludt, Massar Wade, Kirsten Weide-Zaage, Isabelle Bord-Majek, Geneviève Duchamp
2013 — conf
Conducted immunity of three Op-Amps using the DPI measurement technique and VHDL-AMS modeling.
EMC Compo
Siham Hairoud, Tristan Dubois, Angelique Tetelin, Geneviève Duchamp
2012 J jnl
A methodological approach for predictive reliability: Practical case studies.
Microelectron. Reliab.
Hélène Frémont, Geneviève Duchamp, Alexandrine Guédon-Gracia, Frédéric Verdier
2011 J jnl
Control of the electromagnetic compatibility: An issue for IC reliability.
Microelectron. Reliab.
Jean-Baptiste Gros, Geneviève Duchamp, Jean-Luc Levant, Christian Marot
2009 J jnl
Electromagnetic immunity model of an ADC for microcontroller's reliability improvement.
Microelectron. Reliab.
Jean-Baptiste Gros, Geneviève Duchamp, Alain Meresse, Jean-Luc Levant
2007 J jnl
Near-field EMC study to improve electronic component reliability.
Microelectron. Reliab.
Geneviève Duchamp, D. Castagnet, Alain Meresse
2004 J jnl
Reliability of Low-Cost PCB Interconnections for Telecommunication Applications.
Microelectron. Reliab.
Geneviève Duchamp, Frédéric Verdier, Yannick Deshayes, François Marc, Yves Ousten, Yves Danto
2002 J jnl
Evaluation of a micropackaging analysis technique by highfrequency microwaves.
Microelectron. Reliab.
Geneviève Duchamp, Yves Ousten, Yves Danto