Geetani Edirisooriya

14 papers B 1C 3Misc 4Journal 5Unranked 1
YearRankTypeTitle / Venue / Authors
1996 J jnl
Closed Form Aliasing Probability For Q-ary Symmetric Errors.
VLSI Design
Geetani Edirisooriya
1995 J jnl
Authors' reply to comments on "Aliasing Properties of Circular MISRs".
J. Electron. Test.
Geetani Edirisooriya, John P. Robinson
1995 Misc conf
Diagnosis of scan path failures.
VTS
Samantha Edirisooriya, Geetani Edirisooriya
1995 C conf
Scan Chain Fault Diagnosis with Fault Dictionaries.
ISCAS
Geetani Edirisooriya, Samantha Edirisooriya
1993 Misc conf
A new built-in self-test method based on prestored testing.
VTS
Geetani Edirisooriya, Samantha Edirisooriya, John P. Robinson
1993 J jnl
Aliasing properties of circular MISRs.
J. Electron. Test.
Geetani Edirisooriya, John P. Robinson
1993 C conf
On the Performance of Augmented Signature Testing.
ISCAS
Geetani Edirisooriya, Samantha Edirisooriya, John P. Robinson
1993 J jnl
Test generation to minimize error masking.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Geetani Edirisooriya, John P. Robinson
1993 Misc conf
Time and space correlated errors in signature analysis.
VTS
Geetani Edirisooriya, Samantha Edirisooriya, John P. Robinson
1992 B conf
A signature efficient solution for remote file comparison.
COMPSAC
Samantha Edirisooriya, Geetani Edirisooriya
1992 — conf
Aliasing in Multiple-Valued Test Data Compaction.
ISMVL
Geetani Edirisooriya, John P. Robinson
1992 Misc conf
Design of low cost ROM based test generators.
VTS
Geetani Edirisooriya, John P. Robinson
1991 C conf
Aliasing Probability in Multiple Input Linear Signature Automata for Q-ary Symmetric Errors.
ICCD
Geetani Edirisooriya, John P. Robinson
1991 J jnl
Cyclic code weight spectra and BIST aliasing.
J. Electron. Test.
Geetani Edirisooriya, John P. Robinson